IEC 61340-4-10-2012 Electrostatics - Part 4-10 Standard test methods for specific applications - Two-point resistance measurement《静电学.第4-10部分 专门用途的标准试验方法.两点的电阻测量》.pdf

1、 IEC 61340-4-10 Edition 1.0 2012-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrostatics Part 4-10: Standard test methods for specific applications Two-point resistance measurement lectrostatique Partie 4-10: Mthodes dessai normalises pour des applications spcifiques Mesure de la rsistance en

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16、0 2012-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrostatics Part 4-10: Standard test methods for specific applications Two-point resistance measurement lectrostatique Partie 4-10: Mthodes dessai normalises pour des applications spcifiques Mesure de la rsistance en deux points INTERNATIONAL

17、ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE L ICS 17.220.99; 29.020 PRICE CODE CODE PRIX ISBN 978-2-83220-488-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you o

18、btained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 61340-4-10 IEC:2012 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 General discussion . 5 4 Equipment 5 4.1 Probe 5 4.2 Sample s

19、upport surface . 7 4.3 Resistance measurement apparatus 7 4.4 Test leads . 8 4.5 Verification resistors 8 5 Sample preparation 9 6 Verification procedure 9 7 Test procedure . 10 8 Test results 10 Annex A (informative) Test method notes . 11 Figure 1 Two-point probe configuration 6 Figure 2 Probe to

20、instrumentation connection 8 Figure 3 Resistance verification fixture 9 Figure 4 Spring compression for measurement 10 Table 1 Material for two-point probe . 7 61340-4-10 IEC:2012 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROSTATICS Part 4-10: Standard test methods for specific applications

21、Two-point resistance measurement FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions

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29、EC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and e

30、xpenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) A

31、ttention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61340-4-10 has been prepared by IEC technical committee 101: Electro

32、statics. The text of this standard is based on ANSI/ESD STM11.13-2004. It was submitted to the National Committees for voting under the Fast Track Procedure. The text of this standard is based on the following documents: FDIS Report on voting 101/368/FDIS 101/377/RVD Full information on the voting f

33、or the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 61340-4-10 IEC:2012 The committee has decided that the contents of this publication will remain unchanged until t

34、he stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61340-4-10 IEC:2012 5 ELECTROSTATICS Part 4-10: Standard test method

35、s for specific applications Two-point resistance measurement 1 Scope This part of IEC 61340 provides a test method to measure the resistance between two points on an items surface. It is intended for measuring the resistance of items in the range of 104R1012. 2 Normative references The following doc

36、uments, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ASTM D257-07, Standard T

37、est Methods for DC Resistance or Conductance of Insulating Materials ASTM D2240, Standard Test Method for Rubber Property Durometer Hardness 3 General discussion This method is recommended for testing items with irregularly shaped surfaces. Conventional concentric ring and parallel bar electrode con

38、figurations are used for testing planar items only. However, most packaging items are not planar. Examples include shipping tubes, trays, tote boxes and carrier tapes. This probe employs springs to apply consistent contact pressure between the electrode and the item. Force created by springs is subj

39、ect to variance from wear, contamination and manufacturing tolerance. This variance is acceptable for this application. Elastomeric electrodes compensate for uneven item surfaces. These features yield consistent results between laboratories and test operators. 4 Equipment 4.1 Probe Refer to Figure 1

40、 and Table 1. This two-point probe consists of an insulated metal body with a polytetrafluoroethylene (PTFE) insulator inserted into each end. One insulator holds test leads; the other holds receptacles that accept spring-loaded pins. One receptacle is surrounded by a cylindrical insulator, which is

41、 surrounded by a metal shield. The pins are gold plated and have a spring force of 4,56 N 10 % at a travel of 4,32 mm (0,170 in). The pin tips are machined to accept friction fitted 3,18 mm (0,125 in) diameter electrically conductive rubber electrodes. The rubber has a Shore A (IRHD) durometer hardn

42、ess of 50-70 (ASTM D2240). The electrodes are 3,18 mm (0,125 in) long. Electrode volume resistivity is 500 cm. 6 61340-4-10 IEC:2012 PTFE Insulator PTFE insulator Electrode insulator Pins Electrode shield Receptacles Electrodes Body Body insulator Leads Receptacles Electrode insulator Electrode shie

43、ld PTFE insulator Electrodes Pin 3,18 mm (0,125 in) Electrode dimensions Electrodes and pins Shielded electrode NOTE The probe body size and shape are not critical to the measurement and may be of any convenient shape and size Photo Probe parts Probe 3,18 mm (0,125 in) 3,18 mm (0,125 in) IEC 2129/12

44、 Figure 1 Two-point probe configuration Table 1 provides a list of the key components in Figure 1. 61340-4-10 IEC:2012 7 Table 1 Material for two-point probe Item Detail Example PTFE insulators Approximately 25,4 mm (1,0 in) by 12,7 mm (0,5 in) diameter Electrode shield Metal tubing approximately 31

45、,8 mm (1,25 in) by 4,75 mm (0,187 in) diameter Electrode insulator Heat shrinkable PTFE or other insulator Receptacles Receptacle with solder cup Interconnect devices Inc. R-5-SC Pins Spring pin force is 4,56 N at 4,32 mm (0,170 in) travel. Tip machined to accept electrode Interconnect devices Inc.

46、S-5-F-16.4-G Electrodes 3,18 mm (0,125 in) by 3,18 mm (0,125 in) diameter conductive material with a Shore A (IRHD) durometer hardness between 50 and 70. Volume resistivity to be 500 -cm. Vanguard products, VC-7815 NOTE This is not intended to be a complete materials list for probe construction, but

47、 does provide key elements that enable performance replication. Refer to Figure 1 for part placement. Part manufacturers and numbers information are for reference. Equivalent parts may be used. 4.2 Sample support surface An insulative surface, when used for specimen support, shall have a resistance

48、of greater than 1,0 1013 when measured in accordance with ASTM D257-07. 4.3 Resistance measurement apparatus The measurement apparatus, called the meter, whether it is a single meter or a collection of instruments, has the following capabilities: a) Meter for laboratory evaluations The meter shall h

49、ave an output voltage of 100 V (5 %) while under load for measurements of 1,0 106 and above, and 10 V (5 %) while under load for measurements less than 1,0 106. The meter shall be capable of making measurements from 1,0 103 (10 % accuracy) to 1,0 1013 (10 % accuracy). b) Meter for acceptance testing The laboratory evaluation meter may be used for acceptance testing or the fo