IEC 61340-4-7-2017 Electrostatics - Part 4-7 Standard test methods for specific applications - Ionization《静电学.第4-7部分 专用的标准试验方法.电离作用》.pdf

1、 IEC 61340-4-7 Edition 2.0 2017-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrostatics Part 4-7: Standard test methods for specific applications Ionization lectrostatique Partie 4-7: Mthodes dessai normalises pour des applications spcifiques Ionisation IEC 61340-4-7:2017-01(en-fr) THIS PUBLIC

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19、cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61340-4-7 Edition 2.0 2017-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrostatics Part 4-7: Standard test methods for specific applications Ionization lectrostatique Partie 4-7: Mthodes dessai normalises pour des a

20、pplications spcifiques Ionisation INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 17.200.99; 29.020 ISBN 978-2-8322-3775-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warn

21、ing! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 61340-4-7:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and defin

22、itions 7 4 Test fixture and instrumentation . 9 5 Specific requirements for equipment categories . 11 5.1 Specific requirements for all ionization equipment . 11 5.2 Room ionization 12 5.3 Laminar flow hood ionization . 14 5.4 Work surface ionization . 16 5.5 Compressed gas ionizers Guns and nozzles

23、 19 Annex A (informative) Theoretical background and additional information on the standard test method for the performance of ionizers 21 A.1 Introductory remarks . 21 A.2 Air ions . 21 A.3 Mobility and ion current . 21 A.4 Neutralization current 21 A.5 Neutralization rate 22 A.6 Ion depletion and

24、field suppression . 22 A.7 Charged plate monitor and charge neutralization 22 A.8 Relationship between charged plate monitor decay time and actual object 23 A.9 Offset voltage . 23 A.10 Preparation of test area 23 A.11 Ion transport in airflow 24 A.12 Obstruction of airflow around the charged plate

25、monitor 24 A.13 Effect of “air blanket” 24 A.14 Sources of measurement error 25 A.14.1 Typical decay time variability . 25 A.14.2 Plate isolation 25 A.14.3 Charging voltage . 25 A.14.4 Materials near the plate . 25 A.14.5 Other field-producing devices in test area 25 A.14.6 Effect of offset voltage

26、on decay time 25 A.15 Importance of ionization equipment maintenance 26 Annex B (normative) Method of measuring the capacitance of an isolated conductive plate . 27 B.1 Method . 27 B.2 Equipment 27 B.3 Procedure . 27 B.4 Example 27 B.5 Sources of error 28 B.5.1 Measuring equipment 28 B.5.2 Poor plat

27、e isolation 28 B.5.3 Objects in the environment 29 B.5.4 Stray capacitance 29 Annex C (informative) Safety considerations 30 IEC 61340-4-7:2017 IEC 2017 3 C.1 General . 30 C.2 Electrical . 30 C.3 Ozone . 30 C.4 Radioactive . 30 C.5 X-ray . 30 C.6 Installation 30 Bibliography 31 Figure 1 Charged plat

28、e monitor components for non-contacting plate measurement 10 Figure 2 Charged plate monitor components for contacting plate measurement . 10 Figure 3 Conductive plate detail for the non-contacting CPM . 11 Figure 4 Conductive plate detail for the voltage follower CPM 11 Figure 5 Test locations for r

29、oom ionization AC grids and DC bar systems . 13 Figure 6 Test locations for room ionization Single polarity emitter systems . 13 Figure 7 Test locations for room ionization Dual DC line systems 14 Figure 8 Test locations for room ionization Pulsed DC emitter systems . 14 Figure 9 Test locations for

30、vertical laminar flow hood Top view . 15 Figure 10 Test locations for vertical laminar flow hood Side view 15 Figure 11 Test locations for horizontal laminar flow hood Top view . 16 Figure 12 Test locations for horizontal laminar flow hood Side view 16 Figure 13 Test locations for benchtop ionizer T

31、op view . 17 Figure 14 Test locations for benchtop ionizer Side view 18 Figure 15 Test locations for overhead ionizer Top view . 18 Figure 16 Test locations for overhead ionizer Side view 19 Figure 17 Test locations for compressed gas ionizer (gun or nozzle) Side view . 20 Table 1 Test set-ups and t

32、est locations/points (TP) 12 Table B.1 Example measurement data . 28 4 IEC 61340-4-7:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROSTATICS Part 4-7: Standard test methods for specific applications Ionization FOREWORD 1) The International Electrotechnical Commission (IEC) is a worl

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43、 of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61340-4-7 has been prepared by IEC technical committee 101: Electrostatics. This second edition cancels and replaces the first edition, published in 2010, and constitutes a

44、technical revision. This edition includes the following significant technical changes with respect to the previous edition: the use of contacting plate voltage measurements in addition to the previous non- contacting plate voltage measurements has been added. Charged plate monitors (CPMs) using this

45、 technology have been in use in the industry for many years. IEC 61340-4-7:2017 IEC 2017 5 The text of this standard is also based on the following documents: FDIS Report on voting 101/521/FDIS 101/524/RVD Full information on the voting for the approval of this standard can be found in the report on

46、 voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61340 series, published under the general title Electrostatics, can be found on the IEC website. The committee has decided that the contents of th

47、is publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 IEC 61340-4-7:2017 IEC

48、2017 INTRODUCTION Grounding is the primary method used to limit static charge when protecting electrostatic discharge sensitive items in the work environment. However, grounding methods are not effective in removing static charges from the surfaces of non-conductive (insulative) or isolated conducti

49、ve materials. Air ionization techniques, by means of ionizer systems, can be utilized to reduce this charge. The preferred way of evaluating the ability of an ionizer to neutralize a static charge is to directly measure the rate of charge decay. Charges to be neutralized may be located on insulators as well as on isolated conductors. It is difficult to charge