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本文(IEC 62490-1-2010 ESL measuring method - Part 1 Capacitors with lead terminal for use in electronic equipment《ESL测量方法.第1部分 电子设备用带有铅终端的电容器》.pdf)为本站会员(lawfemale396)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 62490-1-2010 ESL measuring method - Part 1 Capacitors with lead terminal for use in electronic equipment《ESL测量方法.第1部分 电子设备用带有铅终端的电容器》.pdf

1、 IEC 62490-1 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 1: Capacitors with lead terminal for use in electronic equipment Mthode de mesure de lESL Partie 1: Condensateurs bornes de sortie utiliss dans les quipements lectroniques IEC 62490-1:2010 THIS PUB

2、LICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writin

3、g from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further inform

4、ation. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit nationa

5、l de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb C

6、H-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications Th

7、e technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variet

8、y of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released

9、. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International El

10、ectrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A pro

11、pos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications

12、 de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant

13、 diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois

14、les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans

15、 les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou c

16、ontactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62490-1 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 1: Capacitors with lead terminal for use in electronic equipment Mthode de mesure de lESL Partie 1: Condensateurs bornes d

17、e sortie utiliss dans les quipements lectroniques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE L ICS 31.060.01 PRICE CODE CODE PRIX ISBN 978-2-88912-068-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Elect

18、rotechnique Internationale 2 62490-1 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .5 4 Measurement jig, short compensation jig, and spacer.5 4.1 Measurement jig (test fixture)5 4.2 Short compensation jig5 4.3 Spacer 6 5 Measuring method7 5.1 Measuring inst

19、rument7 5.2 Measurement conditions7 5.3 Preparation of sample .8 5.4 Measurement points 8 5.5 Frequency and signal level8 5.6 Measurement procedure8 5.6.1 General .8 5.6.2 Open compensation.9 5.6.3 Short compensation.9 5.6.4 ESL measurement .9 6 Items to be indicated in test result report10 Annex A

20、(informative) The basic concept on ESL measuring method .11 Figure 1 Short compensation jig.6 Figure 2 Constructional example of the short compensation spacer and the measurement spacer 7 Figure 3 Measure points: seating plane or flange of capacitor on the printed circuit board8 Figure 4 Method of s

21、hort compensation .9 Figure 5 Example in state where electrode of measurement jig shifted.10 Figure A.1 Fundamental view of ESL measurement .11 62490-1 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 1: Capacitors with lead terminal for use in electronic equipment FO

22、REWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the e

23、lectrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to

24、technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International

25、Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each tech

26、nical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publ

27、ications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their nat

28、ional and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment se

29、rvices and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, se

30、rvants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publica

31、tion, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibili

32、ty that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62490-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equip

33、ment. The text of this standard is based on the following documents: FDIS Report on voting 40/2044/FDIS 40/2056/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with

34、 the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 62490 series, under the general title ESL measuring method, can be found on the IEC website. 4 62490-1 IEC:2010 The committee has decided that the contents of this publication will remain unchanged until the stability date indicated

35、 on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 62490-1 IEC:2010 5 ESL MEASURING METHOD Part 1: Cap with lead terminal for use in electronic eq

36、uipment 1 Scope This part of IEC 62490 provides the equivalent series inductance L (ESL) measuring method for capacitors with lead terminal type for use in electronic equipment. The inductance values of capacitors provided for this document are within the range of 1 nH to 10 nH. 2 Normative referenc

37、es The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in

38、electronic equipment Part 1: Generic specification 3 Terms and definitions For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE 1 The unit of ESL is Henry (H

39、). 4 Measurement jig, short compensation jig, and spacer 4.1 Measurement jig (test fixture) The measurement jig shall have the following features: a) the lead terminal holding method shall be screw up; b) the measurement jig has two pairs of screw-fixation electrodes for fixing the lead terminals of

40、 the capacitor to be measured. In pairs, one of the electrodes is fixed to the measurement jig and the other is adjustable for fixing the lead wire. The adjustable electrode shall move only in a direction to hold the lead terminal and shall not rotate around the electrode fixing screw. 4.2 Short com

41、pensation jig The short compensation jig shall be the lead wire rod which has the following features of the materials and dimensions, which includes the diameter or the cross-section area: a) materials shall be the same materials as the lead wire of the capacitor to be measured; b) shape shall be as

42、 shown in Figure 1; 6 62490-1 IEC:2010 c) spacing section (pitch) shall be the same lead spacing as the capacitor to be measured. The tolerance on the lead spacing of a short compensation jig shall be 0,25 mm; d) the straight section (shank) of the jig length shall be 5 mm to 10 mm, depending on wha

43、t the measurement jig is able to hold. The straight section of the jig shall be kept from bending. Key P spacing section (pitch) (shaded section) l straight section (shank) Figure 1 Short compensation jig 4.3 Spacer These spacers shall be firmly fixed onto the measurement jig. The spacer material sh

44、all be nonmagnetic. An example is shown in Figure 2. P l IEC 1725/10 62490-1 IEC:2010 7 Dimensions in millimetres NOTE The basic method for measuring ESL when using these types of spacer is shown in Annex A.Figure 2 Constructional example of the short compensation spacer and the measurement spacer 5

45、 Measuring method 5.1 Measuring instrument The impedance analyser (balance bridge method) with the following specification or equivalent shall be used: a) inductance value (ESL) can be measured at a frequency of 40 MHz or higher; b) basic impedance accuracy shall be 0,08 % or better; c) impedance va

46、lue of 3 m or less can be measured. 5.2 Measurement conditions The measurements shall be made under the standard atmospheric conditions for testing, as specified in IEC 60384-1:2008, 4.2.1. In addition, if there is any doubt as to the validity of measurement, the recovery conditions, as specified in

47、 IEC 60384-1:2008, 4.2.2, shall be implemented. Key for Figure 2a P lead spacing *Lead spacing shall be the same as the capacitor to be measured. Key for Figure 2b t thickness of the spacer Figure 2a Front view of the spacer Figure 2b Side view of the spacer P tRemarks 1,5 0,1 Short compensation spa

48、cer 3,5 0,3 3,25 0,1 Measurement spacer 1,5 0,1 Short compensation spacer 5,0 0,3 4,0 0,1 Measurement spacer 30 5,5 0,5 1,2 P * /2 t 0,5 P * /2 2 3 0 0,1 17 +0,1 0 IEC 1726/10 8 62490-1 IEC:2010 5.3 Preparation of sample The lead terminals of a capacitor to be measured shall be cut at a length of 5

49、mm to 10 mm. When cutting the lead terminals, the lead terminal shall be kept from bending. NOTE By cutting the leads shorter, they make stable contact with the measurement electrodes and provide highly repeatability and reproducibility. 5.4 Measurement points The measurement points of ESL shall be the places of the seating plane or flange of the capacitor to be measured.

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