1、 IEC 62490-1 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 1: Capacitors with lead terminal for use in electronic equipment Mthode de mesure de lESL Partie 1: Condensateurs bornes de sortie utiliss dans les quipements lectroniques IEC 62490-1:2010 THIS PUB
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16、ontactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62490-1 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 1: Capacitors with lead terminal for use in electronic equipment Mthode de mesure de lESL Partie 1: Condensateurs bornes d
17、e sortie utiliss dans les quipements lectroniques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE L ICS 31.060.01 PRICE CODE CODE PRIX ISBN 978-2-88912-068-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Elect
18、rotechnique Internationale 2 62490-1 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .5 4 Measurement jig, short compensation jig, and spacer.5 4.1 Measurement jig (test fixture)5 4.2 Short compensation jig5 4.3 Spacer 6 5 Measuring method7 5.1 Measuring inst
19、rument7 5.2 Measurement conditions7 5.3 Preparation of sample .8 5.4 Measurement points 8 5.5 Frequency and signal level8 5.6 Measurement procedure8 5.6.1 General .8 5.6.2 Open compensation.9 5.6.3 Short compensation.9 5.6.4 ESL measurement .9 6 Items to be indicated in test result report10 Annex A
20、(informative) The basic concept on ESL measuring method .11 Figure 1 Short compensation jig.6 Figure 2 Constructional example of the short compensation spacer and the measurement spacer 7 Figure 3 Measure points: seating plane or flange of capacitor on the printed circuit board8 Figure 4 Method of s
21、hort compensation .9 Figure 5 Example in state where electrode of measurement jig shifted.10 Figure A.1 Fundamental view of ESL measurement .11 62490-1 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 1: Capacitors with lead terminal for use in electronic equipment FO
22、REWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the e
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31、tion, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibili
32、ty that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62490-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equip
33、ment. The text of this standard is based on the following documents: FDIS Report on voting 40/2044/FDIS 40/2056/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with
34、 the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 62490 series, under the general title ESL measuring method, can be found on the IEC website. 4 62490-1 IEC:2010 The committee has decided that the contents of this publication will remain unchanged until the stability date indicated
35、 on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 62490-1 IEC:2010 5 ESL MEASURING METHOD Part 1: Cap with lead terminal for use in electronic eq
36、uipment 1 Scope This part of IEC 62490 provides the equivalent series inductance L (ESL) measuring method for capacitors with lead terminal type for use in electronic equipment. The inductance values of capacitors provided for this document are within the range of 1 nH to 10 nH. 2 Normative referenc
37、es The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in
38、electronic equipment Part 1: Generic specification 3 Terms and definitions For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE 1 The unit of ESL is Henry (H
39、). 4 Measurement jig, short compensation jig, and spacer 4.1 Measurement jig (test fixture) The measurement jig shall have the following features: a) the lead terminal holding method shall be screw up; b) the measurement jig has two pairs of screw-fixation electrodes for fixing the lead terminals of
40、 the capacitor to be measured. In pairs, one of the electrodes is fixed to the measurement jig and the other is adjustable for fixing the lead wire. The adjustable electrode shall move only in a direction to hold the lead terminal and shall not rotate around the electrode fixing screw. 4.2 Short com
41、pensation jig The short compensation jig shall be the lead wire rod which has the following features of the materials and dimensions, which includes the diameter or the cross-section area: a) materials shall be the same materials as the lead wire of the capacitor to be measured; b) shape shall be as
42、 shown in Figure 1; 6 62490-1 IEC:2010 c) spacing section (pitch) shall be the same lead spacing as the capacitor to be measured. The tolerance on the lead spacing of a short compensation jig shall be 0,25 mm; d) the straight section (shank) of the jig length shall be 5 mm to 10 mm, depending on wha
43、t the measurement jig is able to hold. The straight section of the jig shall be kept from bending. Key P spacing section (pitch) (shaded section) l straight section (shank) Figure 1 Short compensation jig 4.3 Spacer These spacers shall be firmly fixed onto the measurement jig. The spacer material sh
44、all be nonmagnetic. An example is shown in Figure 2. P l IEC 1725/10 62490-1 IEC:2010 7 Dimensions in millimetres NOTE The basic method for measuring ESL when using these types of spacer is shown in Annex A.Figure 2 Constructional example of the short compensation spacer and the measurement spacer 5
45、 Measuring method 5.1 Measuring instrument The impedance analyser (balance bridge method) with the following specification or equivalent shall be used: a) inductance value (ESL) can be measured at a frequency of 40 MHz or higher; b) basic impedance accuracy shall be 0,08 % or better; c) impedance va
46、lue of 3 m or less can be measured. 5.2 Measurement conditions The measurements shall be made under the standard atmospheric conditions for testing, as specified in IEC 60384-1:2008, 4.2.1. In addition, if there is any doubt as to the validity of measurement, the recovery conditions, as specified in
47、 IEC 60384-1:2008, 4.2.2, shall be implemented. Key for Figure 2a P lead spacing *Lead spacing shall be the same as the capacitor to be measured. Key for Figure 2b t thickness of the spacer Figure 2a Front view of the spacer Figure 2b Side view of the spacer P tRemarks 1,5 0,1 Short compensation spa
48、cer 3,5 0,3 3,25 0,1 Measurement spacer 1,5 0,1 Short compensation spacer 5,0 0,3 4,0 0,1 Measurement spacer 30 5,5 0,5 1,2 P * /2 t 0,5 P * /2 2 3 0 0,1 17 +0,1 0 IEC 1726/10 8 62490-1 IEC:2010 5.3 Preparation of sample The lead terminals of a capacitor to be measured shall be cut at a length of 5
49、mm to 10 mm. When cutting the lead terminals, the lead terminal shall be kept from bending. NOTE By cutting the leads shorter, they make stable contact with the measurement electrodes and provide highly repeatability and reproducibility. 5.4 Measurement points The measurement points of ESL shall be the places of the seating plane or flange of the capacitor to be measured.
