IEC TR 61189-3-914-2017 Test methods for electrical materials printed boards and other interconnection structures and assemblies - Part 3-914 Test method for thermal conductivity o.pdf

1、 IEC TR 61189-3-914 Edition 1.0 2017-03 TECHNICAL REPORT Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 3-914: Test method for thermal conductivity of printed circuit boards for high-brightness LEDs Guidelines IEC TR 61189-3-914:2017-03

2、(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, w

3、ithout permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National C

4、ommittee for further information. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Inte

5、rnational Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catal

6、ogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch

7、/searchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publi

8、cations. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent t

9、erms in 16 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some

10、entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC TR 61189-3-914 Editi

11、on 1.0 2017-03 TECHNICAL REPORT Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 3-914: Test method for thermal conductivity of printed circuit boards for high-brightness LEDs Guidelines INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.18

12、0 ISBN 978-2-8322-4110-3 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC TR 61189-3-914:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative reference

13、s 7 3 Terms and definitions 7 4 Test condition 7 4.1 Standard condition 7 4.2 Specified condition 8 5 Pre-condition . 8 6 Heat dissipation characteristics . 8 6.1 General . 8 6.2 Measurement of thermal resistance on the plane 9 6.3 Thermal resistance across the thickness . 12 6.4 Thermal resistance

14、measurement procedures and precautions . 14 6.4.1 General . 14 6.4.2 Die attach 14 6.4.3 Wire bonding . 14 6.4.4 Temperature measuring sensor (calibration) 14 6.4.5 Measurement of thermal resistance on the plane . 14 6.4.6 Thermal resistance across the thickness using cold plate 16 Annex A (informat

15、ive) Classification and class of the PCB . 19 Annex B (informative) Measurement comparison between companies (plane) 22 Figure 1 Example of PCB with large thermal conductivity . 9 Figure 2 Examples of PCBs with large heat transfer coefficients 9 Figure 3 Illustration of thermal resistance test (for

16、information) 10 Figure 4 Layout of the specimen surface for the thermal resistance test 11 Figure 5 Test equipment for thermal resistance across the thickness 12 Figure 6 Example of attachment of the specimen . 15 Figure 7 Example of measurement of the thermal resistance on the plane . 16 Figure 8 U

17、se of the silicone grease 17 Figure 9 Test equipment for thermal resistance across the thickness (running water tank specification) . 17 Figure 10 Test equipment for thermal resistance across the thickness (cold plate) 17 Figure A.1 Example of classification and their application by base materials,

18、PCBs and final products . 20 Figure A.2 The relation between thermal conductive parameter (W/(mK) and heat transfer coefficient parameter (mapping by substrate) . 21 Table 1 Load heat (W) corresponding to range of thermal resistance on the plane (K/W) 12 Table 2 Load heat (W) corresponding to range

19、of thermal resistance to the direction of the thickness (K/W) . 13 IEC TR 61189-3-914:2017 IEC 2017 3 Table A.1 Application and classification . 19 Table A.2 The relation between thermal conductive parameter (W/(mK) and heat transfer coefficient parameter (mapping by zone) 21 4 IEC TR 61189-3-914:20

20、17 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES Part 3-914: Test method for thermal conductivity of printed circuit boards for high-brightness LEDs Guidelines FOREWORD 1) The Internation

21、al Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic

22、fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any

23、 IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standard

24、ization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has repre

25、sentation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC

26、 cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional public

27、ations. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas

28、, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents includin

29、g individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance

30、 upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the eleme

31、nts of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. However, a technical committee may propose the publication of a technical

32、 report when it has collected data of a different kind from that which is normally published as an International Standard, for example “state of the art“. IEC TR 61189-3-914, which is a technical report, has been prepared by IEC technical committee 91: Electronics assembly technology. IEC TR 61189-3

33、-914:2017 IEC 2017 5 The text of this technical report is based on the following documents: Enquiry draft Report on voting 91/1378/DTR 91/1403/RVC Full information on the voting for the approval of this technical report can be found in the report on voting indicated in the above table. This document

34、 has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61189 series, published under the general title Test methods for electrical materials, printed boards and other interconnection structures and assemblies, can be found on the IEC website. The committe

35、e has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfirmed, withdrawn, replaced by a revised edition, or amende

36、d. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this docum

37、ent using a colour printer. 6 IEC TR 61189-3-914:2017 IEC 2017 INTRODUCTION Development of this technical report has been discussed at TC 91 Plenary meeting in Dongguan, China, October 30, 2015 as per 91/1343A/RM dated on January 22, 2016. This document was developed as a supplementary document to t

38、he IEC 61189-3-913. Therefore, this document has been developed as technical report. This document is given for information only. IEC TR 61189-3-914:2017 IEC 2017 7 TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES Part 3-914: Test method for t

39、hermal conductivity of printed circuit boards for high-brightness LEDs Guidelines 1 Scope This document specifies the detailed procedures and precautions for IEC 61189-3-913. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content co

40、nstitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60194, Printed board design, manufacture and assembly Terms and definitions IEC 60068-1:2013, E

41、nvironmental testing Part 1: General and guidance IEC 61189-3-913, Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 3-913: Test method for thermal conductivity of electronic circuit boards for high-brightness LEDs EIA/JEDEC STD 51-2, Inte

42、grated circuits thermal test method Environmental conditions Natural convection (still air) 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60194 apply, unless otherwise specified. ISO and IEC maintain terminological databases for use in standardizat

43、ion at the following addresses: IEC Electropedia: available at http:/www.electropedia.org/ ISO Online browsing platform: available at http:/www.iso.org/obp 4 Test condition 4.1 Standard condition Unless otherwise specified, tests should all be operated under the following standardized conditions in

44、accordance with the IEC 60068-1:2013, Clause 4: temperature: 15 C to 35 C; relative humidity: 25 % to 75 %; atmospheric pressure: 86 kPa to 106 kPa. 8 IEC TR 61189-3-914:2017 IEC 2017 If there is any doubt concerning the testing results under standardized condition, or upon a request to check the at

45、mospheric condition, the re-examination should be operated under atmosphere in accordance with IEC 60068-1:2013. If the standardized atmosphere is difficult to provide, testing under non-standardized atmosphere is acceptable as long as the atmospheric condition does not affect the testing results. 4

46、.2 Specified condition The specified condition should be in accordance with the condition specified in IEC 60068- 1:2013, Clause 4: temperature: 20 C 2 C; relative humidity: 60 % to 70 %; atmospheric pressure: 86 kPa to 106 kPa. 5 Pre-condition Pre-conditioning should be in accordance with a) or b)

47、below: a) leave the specimen for 24 h in the standard condition; b) leave the specimen for 60 min in a thermostat chamber at 85 C 2 C and then leave the specimen for 24 h 4 h in the standard atmospheric condition. NOTE This test element group (hereafter, referred to as TEG) chip includes a heater wi

48、th a temperature measuring sensor. In this document, the TEG chip indicates a chip with a temperature measuring sensor. 6 Heat dissipation characteristics 6.1 General For the test method for thermal conductivity of a printed circuit board (hereafter referred to as PCB) for high-brightness LEDs, the

49、following factors are considered. The test method is applied to evaluate the relativity of both heat transfer and thermal conductivity of PCBs consist of heterogeneous materials as shown in Figure A.2 in Annex A which describes the heat transfer coefficient parameter as X-axis and thermal conductivity parameter as Y-axis. The IEC 61189-3-913 employs a TEG chip as the heat source to replicate the heat generated by LED chips.