IEC 60384-22-2011 Fixed capacitors for use in electronic equipment - Part 22 Sectional specification Fixed surface mount multilayer capacitors of ceramic dielec.pdf

1、 IEC 60384-22 Edition 2.0 2011-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Fixed capacitors for use in electronic equipment Part 22: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 Condensateurs fixes utiliss dans les quipements lectroniques Partie

2、 22: Spcification intermdiaire Condensateurs multicouches fixes dilectriques en cramique pour montage en surface, de Classe 2 IEC60384-22:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication

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17、ALE Fixed capacitors for use in electronic equipment Part 22: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 Condensateurs fixes utiliss dans les quipements lectroniques Partie 22: Spcification intermdiaire Condensateurs multicouches fixes dilectriqu

18、es en cramique pour montage en surface, de Classe 2 INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 31.060.10 PRICE CODE CODE PRIX ISBN 978-2-88912-821-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Ele

19、ctrotechnique Internationale 2 60384-22 IEC:2011 CONTENTS FOREWORD . 6 1 General 8 1.1 Scope 8 1.2 Object . 8 1.3 Normative references 8 1.4 Information to be given in a detail specification . 8 1.4.1 Outline drawing and dimensions 9 1.4.2 Mounting . 9 1.4.3 Rating and characteristics . 9 1.4.4 Mark

20、ing . 10 1.5 Terms and definitions 10 1.6 Marking . 10 1.6.1 Information for marking 11 1.6.2 Marking on the body 11 1.6.3 Requirements for marking 11 1.6.4 Marking of the packaging . 11 1.6.5 Additional marking . 11 2 Preferred rating and characteristics 11 2.1 Preferred characteristics . 11 2.1.1

21、Preferred climatic categories . 11 2.2 Preferred values of ratings 12 2.2.1 Rated temperature (TR) . 12 2.2.2 Rated voltage (UR) 12 2.2.3 Category voltage (UC) . 12 2.2.4 Preferred values of nominal capacitance and associated tolerance values . 12 2.2.5 Temperature characteristic of capacitance . 13

22、 2.2.6 Dimensions . 14 3 Quality assessment procedures 14 3.1 Primary stage of manufacture 14 3.2 Structurally similar components . 14 3.3 Certified records of released lots . 14 3.4 Qualification approval 14 3.4.1 Qualification approval on the basis of the fixed sample size procedures 14 3.4.2 Test

23、s . 15 3.5 Quality conformance inspection . 20 3.5.1 Formation of inspection lots . 20 3.5.2 Test schedule 20 3.5.3 Delayed delivery 20 3.5.4 Assessment levels . 20 4 Test and measurement procedures . 22 4.1 Special preconditioning . 22 4.2 Measuring conditions 22 4.3 Mounting . 22 4.4 Visual examin

24、ation and check of dimensions . 22 4.4.1 Visual examination 22 60384-22 IEC:2011 3 4.4.2 Requirements 22 4.5 Electrical tests . 24 4.5.1 Capacitance 24 4.5.2 Tangent of loss angle (tan ) . 25 4.5.3 Insulation resistance 25 4.5.4 Voltage proof . 26 4.5.5 Impedance (if required by the detail specifica

25、tion) . 27 4.5.6 Equivalent series resistance ESR (if required by the detail specification) . 27 4.6 Temperature characteristic of capacitance 27 4.6.1 Special preconditioning . 27 4.6.2 Measuring conditions . 27 4.6.3 Requirements 28 4.7 Shear test . 28 4.8 Substrate bending test 28 4.8.1 Initial m

26、easurement . 28 4.8.2 Final inspection . 28 4.9 Resistance to soldering heat . 29 4.9.1 Special preconditioning . 29 4.9.2 Initial measurement . 29 4.9.3 Test conditions 29 4.9.4 Recovery . 30 4.9.5 Final inspection, measurements and requirements 30 4.10 Solderability 31 4.10.1 Test conditions 31 4.

27、10.2 Recovery . 32 4.10.3 Final inspection, measurements and requirements 32 4.11 Rapid change of temperature 32 4.11.1 Special preconditioning . 32 4.11.2 Initial measurement . 32 4.11.3 Number of cycles . 32 4.11.4 Recovery . 32 4.11.5 Final inspection, measurements and requirements 32 4.12 Climat

28、ic sequence . 33 4.12.1 Special preconditioning . 33 4.12.2 Initial measurement . 33 4.12.3 Dry heat 33 4.12.4 Damp heat, cyclic, Test Db, first cycle . 33 4.12.5 Cold 33 4.12.6 Damp heat, cyclic, Test Db, remaining cycles 33 4.12.7 Final inspection, measurements and requirements 34 4.13 Damp heat,

29、steady state 34 4.13.1 Special preconditioning . 34 4.13.2 Initial measurement . 34 4.13.3 Conditions of test 34 4.13.4 Recovery . 35 4.13.5 Final inspection, measurements and requirements 35 4.14 Endurance . 35 4.14.1 Special preconditioning . 35 4 60384-22 IEC:2011 4.14.2 Initial measurement . 36

30、4.14.3 Conditions of test 36 4.14.4 Recovery . 36 4.14.5 Final inspection, measurements and requirements 36 4.15 Robustness of terminations (only for capacitors with strip termination) 37 4.15.1 Test conditions 37 4.15.2 Final inspection and requirements . 37 4.16 Component solvent resistance (if re

31、quired) 37 4.17 Solvent resistance of the marking (if required) . 37 4.18 Accelerated damp heat, steady state (if required) 37 4.18.1 Initial measurement . 37 4.18.2 Conditioning 38 4.18.3 Recovery . 38 4.18.4 Final measurements 38 Annex A (normative) Guidance for the specification and coding of dim

32、ensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 39 Annex B (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 . 40 Annex C (informative) Temperature characteristics of capacitance for the reference temperature of 25 C 42 Bibliograp

33、hy 43 Figure 1 Fault: crack or fissure 23 Figure 2 Fault: crack or fissure 23 Figure 3 Separation or delamination 23 Figure 4 Exposed electrodes 23 Figure 5 Principal faces . 24 Figure 6 Reflow temperature profile . 30 Figure A.1 Dimensions . 39 Table 1 Preferred values of category voltages . 12 Tab

34、le 2 Preferred tolerances 13 Table 3 Temperature characteristic of capacitance 13 Table 4 Fixed sample size test plan for qualification approval, assessment level EZ 16 Table 5 Tests schedule for qualification approval . 17 Table 6a Lot-by-lot inspection 21 Table 6b Periodic test 21 Table 7 Measurin

35、g conditions 24 Table 8 Tangent of loss angle limits . 25 Table 9 Test voltages. 26 Table 10 Details of measuring conditions . 27 Table 11 Reflow temperature profiles for Sn-Ag-Cu alloy . 30 Table 12 Maximum capacitance change . 31 Table 13 Maximum capacitance change . 33 Table 14 Number of damp hea

36、t cycles . 33 Table 15 Final inspection, measurements and requirements 34 60384-22 IEC:2011 5 Table 16 Test conditions for damp heat, steady state . 35 Table 17 Final inspection, measurements and requirements 35 Table 18 Endurance test conditions (UC= UR) . 36 Table 19 Endurance test conditions (UC

37、UR) . 36 Table 20 Final inspection, measurements and requirements of endurance test 37 Table 21 Initial requirements 38 Table 22 Conditioning 38 Table A.1 Dimensions 39 Table C.1 Temperature characteristics of capacitance for the reference temperature of 25 C 42 Table C.2 Measuring conditions of tem

38、perature characteristic of capacitance for the reference temperature of 25 C . 42 6 60384-22 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 22: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2

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49、lity that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60384-22 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This second edition cancels and replaces the firs