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IEC 61000-4-31-2016 Electromagnetic compatibility (EMC) - Part 4-31 Testing and measurement techniques - AC mains ports broadband conducted disturbance immunity.pdf

1、 IEC 61000-4-31 Edition 1.0 2016-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test Compatibilit lectromagntique (CEM) Partie 4-31: Techniques dessai et de mesur

2、e Essai dimmunit aux perturbations conduites large bande sur les accs dalimentation secteur en courant alternatif IEC 61000-4-31:2016-07(en-fr) BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All righ

3、ts reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the reques

4、ter. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie d

5、e cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIE

6、C ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www

7、.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under con

8、stant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Sp

9、ecifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives informat

10、ion on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds

11、leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in 15 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotec

12、hnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us

13、your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llec

14、tricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue

15、 Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour PC, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La rech

16、erche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles

17、publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne de termes lectroniques et lectriques. Il contient 20 000 termes et dfinitions en anglais et en fr

18、anais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary 65 000 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions

19、des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IE

20、C 61000-4-31 Edition 1.0 2016-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test Compatibilit lectromagntique (CEM) Partie 4-31: Techniques dessai et de mesure E

21、ssai dimmunit aux perturbations conduites large bande sur les accs dalimentation secteur en courant alternatif INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 33.100.20 ISBN 978-2-8322-3564-5 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered tr

22、ademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr

23、. colour inside 2 IEC 61000-4-31:2016 IEC 2016 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope and object . 8 2 Normative references. 8 3 Terms and definitions 8 4 General . 10 5 Test levels . 11 6 Test equipment and level setting procedures 13 6.1 Test generator 13 6.2 Coupling and decoupling device

24、s . 14 6.2.1 General . 14 6.2.2 CDND for the port under test 15 6.2.3 Coupling/decoupling networks (CDNs) for cables that are not under test . 15 6.3 Verification of the test systems 17 6.3.1 General . 17 6.3.2 Verification procedure of test generator flatness . 17 6.3.3 Verification procedure of th

25、e insertion loss of the CDND using transformer jigs 18 6.3.4 Insertion loss of the injection coupling system 20 6.4 Test level setting procedure 21 6.4.1 General . 21 6.4.2 Setting of the output level at the EUT port of the CDND 21 7 Test set-up and injection methods 22 7.1 Test set-up 22 7.2 EUT co

26、mprised of a single unit 22 7.3 EUT comprised of several units . 23 7.4 CDN and CDND termination application . 25 8 Test procedure 26 9 Evaluation of the test results 27 10 Test report. 27 Annex A (informative) Measurement uncertainty of the power spectral density test level . 29 A.1 General . 29 A.

27、2 Uncertainty budgets for test methods . 29 A.2.1 General symbols 29 A.2.2 Definition of the measurand 29 A.2.3 MU contributors of the measurand 29 A.2.4 Input quantities and calculation examples for expanded uncertainty 30 A.3 Expression of the calculated measurement uncertainty and its application

28、 31 Annex B (informative) Rationale for the selection of the preferred broadband source Information on test signal generation . 33 B.1 General . 33 B.2 Principles of band-limited broadband signal generation 33 B.2.1 General . 33 B.2.2 (True) random noise generation 33 IEC 61000-4-31:2016 IEC 2016 3

29、B.2.3 Pseudo-random noise sequence . 34 B.2.4 Impulse 38 B.2.5 OFDM scheme . 40 B.3 Selection of the preferred broadband source 42 Bibliography . 43 Figure 1 Immunity test to broadband conducted disturbances . 11 Figure 2 Example of voltage spectrum of a broadband test signal measured with a 120 kHz

30、 resolution bandwidth . 13 Figure 3 Principle of the test generator . 14 Figure 4 Example of simplified diagram for the circuit of CDND . 15 Figure 5 Example of coupling and decoupling network for power ports other than AC mains . 16 Figure 6 Test set-up regarding test generator flatness and typical

31、 test signal 18 Figure 7 Typical circuit diagram of the transformer jig showing 50 side and 100 side of the transformer and 2 pcs 0,1 F coupling capacitors . 18 Figure 8 Transformer jig specifications . 20 Figure 9 Example of the set-up geometry to verify the insertion loss of the injection coupling

32、 system 20 Figure 10 Set-up for the evaluation of the total insertion loss of the injection coupling system 21 Figure 11 Set-up for level setting 22 Figure 12 Example of test set-up for an EUT comprised of a single unit (top view) . 23 Figure 13 Example of a test set-up for an EUT comprised of sever

33、al units (top view) 24 Figure 14 Immunity test to a 2-port EUT (when only CDNDs can be used) . 26 Figure A.1 Example of influences upon the power spectral density test level using a CDND . 30 Figure B.1 White noise source 34 Figure B.2 Principle of band-limited broadband signal generation with an ar

34、bitrary waveform generator 35 Figure B.3 Signal spectrum of a band-limited pseudo-random noise signal (measured with a 120 kHz resolution bandwidth) 36 Figure B.4 Extract of the band-limited pseudo noise signal in time domain (measured with an oscilloscope) . 37 Figure B.5 Signal spectrum of the ban

35、d-limited pseudo noise signal without an anti- alias filter . 37 Figure B.6 Extract of the signal spectrum of a band-limited pseudo noise signal (measured with a 200 Hz resolution bandwidth) . 38 Figure B.7 Signal spectrum of a band-limited impulse signal (measured with a 120 kHz resolution bandwidt

36、h) 39 Figure B.8 Extract of the band-limited impulse signal in time domain (measured with an oscilloscope) 39 Figure B.9 Extract of the signal spectrum of a band-limited impulse signal (measured with a 200 Hz resolution bandwidth) . 40 Figure B.10 Signal spectrum of an OFDM signal (measured with a 1

37、20 kHz resolution bandwidth) 41 Figure B.11 Extract of the signal spectrum of an OFDM signal (measured with a 200 Hz resolution bandwidth) 41 4 IEC 61000-4-31:2016 IEC 2016 Figure B.12 Signal spectrum of an OFDM signal with an amplitude step at 30 MHz (measured with a 120 kHz resolution bandwidth) .

38、 42 Table 1 Test levels . 12 Table 2 Characteristics of the test generator . 14 Table 3 Specification of the main parameters of the CDND for current 16 A 15 Table 4 Usage of CDNs 16 Table A.1 CDND level setting process 31 Table B.1 Comparison of white noise signal generation methods . 42 IEC 61000-4

39、-31:2016 IEC 2016 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization f

40、or standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publi

41、shes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may p

42、articipate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreemen

43、t between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publ

44、ications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or

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46、onding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for an

47、y services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and I

48、EC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Atte

49、ntion is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all

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