IEC 61000-4-31-2016 Electromagnetic compatibility (EMC) - Part 4-31 Testing and measurement techniques - AC mains ports broadband conducted disturbance immunity.pdf

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1、 IEC 61000-4-31 Edition 1.0 2016-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test Compatibilit lectromagntique (CEM) Partie 4-31: Techniques dessai et de mesur

2、e Essai dimmunit aux perturbations conduites large bande sur les accs dalimentation secteur en courant alternatif IEC 61000-4-31:2016-07(en-fr) BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All righ

3、ts reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the reques

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5、e cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIE

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12、hnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us

13、your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llec

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20、C 61000-4-31 Edition 1.0 2016-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test Compatibilit lectromagntique (CEM) Partie 4-31: Techniques dessai et de mesure E

21、ssai dimmunit aux perturbations conduites large bande sur les accs dalimentation secteur en courant alternatif INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 33.100.20 ISBN 978-2-8322-3564-5 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered tr

22、ademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr

23、. colour inside 2 IEC 61000-4-31:2016 IEC 2016 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope and object . 8 2 Normative references. 8 3 Terms and definitions 8 4 General . 10 5 Test levels . 11 6 Test equipment and level setting procedures 13 6.1 Test generator 13 6.2 Coupling and decoupling device

24、s . 14 6.2.1 General . 14 6.2.2 CDND for the port under test 15 6.2.3 Coupling/decoupling networks (CDNs) for cables that are not under test . 15 6.3 Verification of the test systems 17 6.3.1 General . 17 6.3.2 Verification procedure of test generator flatness . 17 6.3.3 Verification procedure of th

25、e insertion loss of the CDND using transformer jigs 18 6.3.4 Insertion loss of the injection coupling system 20 6.4 Test level setting procedure 21 6.4.1 General . 21 6.4.2 Setting of the output level at the EUT port of the CDND 21 7 Test set-up and injection methods 22 7.1 Test set-up 22 7.2 EUT co

26、mprised of a single unit 22 7.3 EUT comprised of several units . 23 7.4 CDN and CDND termination application . 25 8 Test procedure 26 9 Evaluation of the test results 27 10 Test report. 27 Annex A (informative) Measurement uncertainty of the power spectral density test level . 29 A.1 General . 29 A.

27、2 Uncertainty budgets for test methods . 29 A.2.1 General symbols 29 A.2.2 Definition of the measurand 29 A.2.3 MU contributors of the measurand 29 A.2.4 Input quantities and calculation examples for expanded uncertainty 30 A.3 Expression of the calculated measurement uncertainty and its application

28、 31 Annex B (informative) Rationale for the selection of the preferred broadband source Information on test signal generation . 33 B.1 General . 33 B.2 Principles of band-limited broadband signal generation 33 B.2.1 General . 33 B.2.2 (True) random noise generation 33 IEC 61000-4-31:2016 IEC 2016 3

29、B.2.3 Pseudo-random noise sequence . 34 B.2.4 Impulse 38 B.2.5 OFDM scheme . 40 B.3 Selection of the preferred broadband source 42 Bibliography . 43 Figure 1 Immunity test to broadband conducted disturbances . 11 Figure 2 Example of voltage spectrum of a broadband test signal measured with a 120 kHz

30、 resolution bandwidth . 13 Figure 3 Principle of the test generator . 14 Figure 4 Example of simplified diagram for the circuit of CDND . 15 Figure 5 Example of coupling and decoupling network for power ports other than AC mains . 16 Figure 6 Test set-up regarding test generator flatness and typical

31、 test signal 18 Figure 7 Typical circuit diagram of the transformer jig showing 50 side and 100 side of the transformer and 2 pcs 0,1 F coupling capacitors . 18 Figure 8 Transformer jig specifications . 20 Figure 9 Example of the set-up geometry to verify the insertion loss of the injection coupling

32、 system 20 Figure 10 Set-up for the evaluation of the total insertion loss of the injection coupling system 21 Figure 11 Set-up for level setting 22 Figure 12 Example of test set-up for an EUT comprised of a single unit (top view) . 23 Figure 13 Example of a test set-up for an EUT comprised of sever

33、al units (top view) 24 Figure 14 Immunity test to a 2-port EUT (when only CDNDs can be used) . 26 Figure A.1 Example of influences upon the power spectral density test level using a CDND . 30 Figure B.1 White noise source 34 Figure B.2 Principle of band-limited broadband signal generation with an ar

34、bitrary waveform generator 35 Figure B.3 Signal spectrum of a band-limited pseudo-random noise signal (measured with a 120 kHz resolution bandwidth) 36 Figure B.4 Extract of the band-limited pseudo noise signal in time domain (measured with an oscilloscope) . 37 Figure B.5 Signal spectrum of the ban

35、d-limited pseudo noise signal without an anti- alias filter . 37 Figure B.6 Extract of the signal spectrum of a band-limited pseudo noise signal (measured with a 200 Hz resolution bandwidth) . 38 Figure B.7 Signal spectrum of a band-limited impulse signal (measured with a 120 kHz resolution bandwidt

36、h) 39 Figure B.8 Extract of the band-limited impulse signal in time domain (measured with an oscilloscope) 39 Figure B.9 Extract of the signal spectrum of a band-limited impulse signal (measured with a 200 Hz resolution bandwidth) . 40 Figure B.10 Signal spectrum of an OFDM signal (measured with a 1

37、20 kHz resolution bandwidth) 41 Figure B.11 Extract of the signal spectrum of an OFDM signal (measured with a 200 Hz resolution bandwidth) 41 4 IEC 61000-4-31:2016 IEC 2016 Figure B.12 Signal spectrum of an OFDM signal with an amplitude step at 30 MHz (measured with a 120 kHz resolution bandwidth) .

38、 42 Table 1 Test levels . 12 Table 2 Characteristics of the test generator . 14 Table 3 Specification of the main parameters of the CDND for current 16 A 15 Table 4 Usage of CDNs 16 Table A.1 CDND level setting process 31 Table B.1 Comparison of white noise signal generation methods . 42 IEC 61000-4

39、-31:2016 IEC 2016 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-31: Testing and measurement techniques AC mains ports broadband conducted disturbance immunity test FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization f

40、or standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publi

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48、EC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Atte

49、ntion is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all

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