IEC 61587-2-2011 Mechanical structures for electronic equipment - Tests for IEC 60917 and 60297 - Part 2 Seismic tests for cabinets and racks《IEC 61587-2 2.0版本 .pdf

1、 IEC 61587-2 Edition 2.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 Part 2: Seismic tests for cabinets and racks Structures mcaniques pour quipements lectroniques Essais pour la CEI 60917 et la CEI 60297 Partie

2、 2: Essais sismiques pour baies et btis IEC 61587-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, i

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16、i vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61587-2 Edition 2.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 Pa

17、rt 2: Seismic tests for cabinets and racks Structures mcaniques pour quipements lectroniques Essais pour la CEI 60917 et la CEI 60297 Partie 2: Essais sismiques pour baies et btis INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 31.240 PRICE CODE CODE PRIX I

18、SBN 978-2-88912-624-8 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61587-2 IEC:2011 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Set up of test spec

19、imen and measurement items 7 4.1 Introductory remarks . 7 4.2 General . 7 4.3 Set up of the cabinets or racks to the vibration table . 8 4.4 Measurement items . 8 5 Test waveform and acceleration condition 9 5.1 Introductory remarks . 9 5.2 General . 9 5.3 Single-axis acceleration 9 5.4 Triaxial acc

20、eleration 10 6 Assessment following the test. 13 Annex A (informative) Vibration generators and information . 14 Figure 1 Cabinets or racks configuration for test set up 7 Figure 2 Block diagram of test set up configuration 8 Figure 3 The RRS for test wave (damping ratio 2 %) 10 Figure 4 Time-histor

21、y of the test wave . 10 Figure 5 The RRS for test wave (damping ratio 3 %) 11 Figure 6 Time-history of test wave for each axis 12 Table 1 Load distribution within the cabinet . 8 61587-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT TESTS FOR I

22、EC 60917 AND IEC 60297 Part 2: Seismic tests for cabinets and racks FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internati

23、onal co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter re

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31、r costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct a

32、pplication of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61587-2 has been prepared by sub

33、committee 48D: Mechanical structures for electronic equipment, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. The second edition of this standard replaces the first edition issued in 2000 and constitutes a technical revision. The main

34、technical changes with regard to the previous edition are as follows: Edition 1.0 specified the test condition with one size of the cabinet, and one load distribution. The specified acceleration condition for the test specimen was single-axis and one of the RRS (required response spectra) specified

35、in the standard was selected. The test was aimed to obtain the reference for the structural strength of the enclosure against the specified seismic intensity. Earthquakes are actually random phenomena that are much more carefully simulated by tri-axial simultaneous operation. The demand of tri-axial

36、 excitation has emerged as a more accurate representation of an earthquake. 4 61587-2 IEC:2011 The text of this standard is based on the following documents: FDIS Report on voting 48D/471/FDIS 48D/486/RVD Full information on the voting for the approval of this standard can be found in the report on

37、voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 61587 series, under the general title: Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297, can be found on the IEC websit

38、e. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a r

39、evised edition, or amended. 61587-2 IEC:2011 5 INTRODUCTION Edition 1.0 of this standard specified the seismic test for the cabinets or racks according to IEC 60297 and IEC 60917. The specified test applied to the structure of the enclosure and did not apply to the whole system. Edition 1.0 specifie

40、d the test condition with one size of the cabinet, and one load distribution. The specified acceleration condition for the test specimen was single-axis and one of the RRS (required response spectra) specified in the standard was selected. The test was aimed to obtain the reference for the structura

41、l strength of the enclosure against the specified seismic intensity. The electronic system consists of two or more subracks. Two or more plug-in units that perform signal processing are installed in each subrack. The size, i.e.: height, width and depth, and the weight of each subrack may vary for ea

42、ch electronic system. So, various types of cabinets or racks to equip the electronic system are currently demanded. Therefore, many types of cabinets or racks are required to install the equipment. Earthquakes are actually random phenomena that are much more carefully simulated by tri- axial simulta

43、neous operation. The demand of tri-axial excitation has emerged as a more accurate representation of an earthquake. Edition 2.0 of this standard has been reviewed in consideration of these demanded conditions. However, it is impossible to perform the seismic test under all of the cabinet or rack con

44、ditions. The aim of this standard is then to evaluate the reference of the cabinet or rack structure with a common examination method. The seismic test is therefore assumed to be performed on one set of cabinet dimensional conditions (i.e. height, width and depth) and one set of load distribution co

45、nditions in the cabinet. The input acceleration for the test specimen is assumed to be selected and applied either single-axial or tri-axial. Single-axis acceleration was already specified in Edition 1.0 of this standard. Therefore, the RRS (required response spectra) for tri-axial acceleration have

46、 been added. According to this standard, the examination should be performed in the same manner, so as to obtain a reference for the evaluation of the structural strength of the tested cabinet or rack. The user who requests an individual structural cabinet or rack condition, such as a different cabi

47、net size or a different load distribution in the cabinet, and requests different seismic acceleration intensity, can perform the test by changing the corresponding condition specified in this standard. In this case, the test result is treated as an individual evaluation, not to be taken as a referen

48、ce. 6 61587-2 IEC:2011 MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT TESTS FOR IEC 60917 AND IEC 60297 Part 2: Seismic tests for cabinets and racks 1 Scope This part of IEC 61587 specifies seismic tests for cabinets and racks accommodated with IEC 60917 and 60297 series. It applies, in whole or in

49、part, only to the mechanical structures of cabinets and racks for electronic equipment according to the above cited series of standards, while it does not apply to the electronic equipment or systems deemed to be installed within these mechanical structures. This standard does not apply either to a cabinet or a rack having an anti-seismic isolation structure, either external or internal. This standard aims t