1、 IEC 61587-2 Edition 2.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 Part 2: Seismic tests for cabinets and racks Structures mcaniques pour quipements lectroniques Essais pour la CEI 60917 et la CEI 60297 Partie
2、 2: Essais sismiques pour baies et btis IEC 61587-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, i
3、ncluding photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address bel
4、ow or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie e
5、t les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI
6、 de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrica
7、l, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/sear
8、chpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. J
9、ust Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent
10、terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Em
11、ail: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A
12、propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-l
13、igne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles p
14、ublications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitio
15、ns en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou s
16、i vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61587-2 Edition 2.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297 Pa
17、rt 2: Seismic tests for cabinets and racks Structures mcaniques pour quipements lectroniques Essais pour la CEI 60917 et la CEI 60297 Partie 2: Essais sismiques pour baies et btis INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 31.240 PRICE CODE CODE PRIX I
18、SBN 978-2-88912-624-8 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61587-2 IEC:2011 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Set up of test spec
19、imen and measurement items 7 4.1 Introductory remarks . 7 4.2 General . 7 4.3 Set up of the cabinets or racks to the vibration table . 8 4.4 Measurement items . 8 5 Test waveform and acceleration condition 9 5.1 Introductory remarks . 9 5.2 General . 9 5.3 Single-axis acceleration 9 5.4 Triaxial acc
20、eleration 10 6 Assessment following the test. 13 Annex A (informative) Vibration generators and information . 14 Figure 1 Cabinets or racks configuration for test set up 7 Figure 2 Block diagram of test set up configuration 8 Figure 3 The RRS for test wave (damping ratio 2 %) 10 Figure 4 Time-histor
21、y of the test wave . 10 Figure 5 The RRS for test wave (damping ratio 3 %) 11 Figure 6 Time-history of test wave for each axis 12 Table 1 Load distribution within the cabinet . 8 61587-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT TESTS FOR I
22、EC 60917 AND IEC 60297 Part 2: Seismic tests for cabinets and racks FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internati
23、onal co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter re
24、ferred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate
25、 in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an inter
26、national consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reason
27、able efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC
28、Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conform
29、ity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publicatio
30、n. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or fo
31、r costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct a
32、pplication of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61587-2 has been prepared by sub
33、committee 48D: Mechanical structures for electronic equipment, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. The second edition of this standard replaces the first edition issued in 2000 and constitutes a technical revision. The main
34、technical changes with regard to the previous edition are as follows: Edition 1.0 specified the test condition with one size of the cabinet, and one load distribution. The specified acceleration condition for the test specimen was single-axis and one of the RRS (required response spectra) specified
35、in the standard was selected. The test was aimed to obtain the reference for the structural strength of the enclosure against the specified seismic intensity. Earthquakes are actually random phenomena that are much more carefully simulated by tri-axial simultaneous operation. The demand of tri-axial
36、 excitation has emerged as a more accurate representation of an earthquake. 4 61587-2 IEC:2011 The text of this standard is based on the following documents: FDIS Report on voting 48D/471/FDIS 48D/486/RVD Full information on the voting for the approval of this standard can be found in the report on
37、voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 61587 series, under the general title: Mechanical structures for electronic equipment Tests for IEC 60917 and IEC 60297, can be found on the IEC websit
38、e. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a r
39、evised edition, or amended. 61587-2 IEC:2011 5 INTRODUCTION Edition 1.0 of this standard specified the seismic test for the cabinets or racks according to IEC 60297 and IEC 60917. The specified test applied to the structure of the enclosure and did not apply to the whole system. Edition 1.0 specifie
40、d the test condition with one size of the cabinet, and one load distribution. The specified acceleration condition for the test specimen was single-axis and one of the RRS (required response spectra) specified in the standard was selected. The test was aimed to obtain the reference for the structura
41、l strength of the enclosure against the specified seismic intensity. The electronic system consists of two or more subracks. Two or more plug-in units that perform signal processing are installed in each subrack. The size, i.e.: height, width and depth, and the weight of each subrack may vary for ea
42、ch electronic system. So, various types of cabinets or racks to equip the electronic system are currently demanded. Therefore, many types of cabinets or racks are required to install the equipment. Earthquakes are actually random phenomena that are much more carefully simulated by tri- axial simulta
43、neous operation. The demand of tri-axial excitation has emerged as a more accurate representation of an earthquake. Edition 2.0 of this standard has been reviewed in consideration of these demanded conditions. However, it is impossible to perform the seismic test under all of the cabinet or rack con
44、ditions. The aim of this standard is then to evaluate the reference of the cabinet or rack structure with a common examination method. The seismic test is therefore assumed to be performed on one set of cabinet dimensional conditions (i.e. height, width and depth) and one set of load distribution co
45、nditions in the cabinet. The input acceleration for the test specimen is assumed to be selected and applied either single-axial or tri-axial. Single-axis acceleration was already specified in Edition 1.0 of this standard. Therefore, the RRS (required response spectra) for tri-axial acceleration have
46、 been added. According to this standard, the examination should be performed in the same manner, so as to obtain a reference for the evaluation of the structural strength of the tested cabinet or rack. The user who requests an individual structural cabinet or rack condition, such as a different cabi
47、net size or a different load distribution in the cabinet, and requests different seismic acceleration intensity, can perform the test by changing the corresponding condition specified in this standard. In this case, the test result is treated as an individual evaluation, not to be taken as a referen
48、ce. 6 61587-2 IEC:2011 MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT TESTS FOR IEC 60917 AND IEC 60297 Part 2: Seismic tests for cabinets and racks 1 Scope This part of IEC 61587 specifies seismic tests for cabinets and racks accommodated with IEC 60917 and 60297 series. It applies, in whole or in
49、part, only to the mechanical structures of cabinets and racks for electronic equipment according to the above cited series of standards, while it does not apply to the electronic equipment or systems deemed to be installed within these mechanical structures. This standard does not apply either to a cabinet or a rack having an anti-seismic isolation structure, either external or internal. This standard aims t
