IEC TR 62153-4-0-2007 Metallic communication cable test methods - Part 4-0 Electromagnetic compatibility (EMC) - Relationship between surface transfer impedance.pdf

1、 IEC/TR 62153-4-0 Edition 1.0 2007-11 TECHNICAL REPORT RAPPORT TECHNIQUE Metallic communication cable test methods Part 4-0: Electromagnetic compatibility (EMC) Relationship between surface transfer impedance and screening attenuation, recommended limits Mthodes dessai des cbles mtalliques de commun

2、ication Partie 4-0: Compatibilit lectromagntique (CEM) Relation entre limpdance de transfert en surface et laffaiblissement dcran, limites recommandes IEC/TR 62153-4-0:2007 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified

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17、CAL REPORT RAPPORT TECHNIQUE Metallic communication cable test methods Part 4-0: Electromagnetic compatibility (EMC) Relationship between surface transfer impedance and screening attenuation, recommended limits Mthodes dessai des cbles mtalliques de communication Partie 4-0: Compatibilit lectromagnt

18、ique (CEM) Relation entre limpdance de transfert en surface et laffaiblissement dcran, limites recommandes INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 33.100; 33.120.10 PRICE CODE CODE PRIX ISBN 2-8318-9363-1 2 TR 62153-4-0 IEC:2007 INTERNATIONAL ELECTR

19、OTECHNICAL COMMISSION _ METALLIC COMMUNICATION CABLE TEST METHODS Part 4-0: Electromagnetic compatibility (EMC) Relationship between surface transfer impedance and screening attenuation, recommended limits FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization fo

20、r standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publis

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30、 committees is to prepare International Standards. However, a technical committee may propose the publication of a technical report when it has collected data of a different kind from that which is normally published as an International Standard, for example “state of the art“. IEC 62153-4-0, which

31、is a technical report, has been prepared by IEC technical committee 46: Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories. This publication cancels and replaces IEC/TR 62064, published in 1999. TR 62153-4-0 IEC:2007 3 The text of this technical report

32、is based on the following documents: Enquiry draft Report on voting 46/197/DTR 46/252/RVC Full information on the voting for the approval of this technical report can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Direc

33、tives, Part 2. A list of all parts of the IEC 62153 series, under the general title: Metallic communication cable test methods, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IE

34、C web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 TR 62153-4-0 IEC:2007 METALLIC COMMUNICATION CABLE TEST METHODS Part 4-0: Electromagnetic compatibility

35、 (EMC) Relationship between surface transfer impedance and screening attenuation, recommended limits 1 Scope This technical report describes important background material used during the revision of IEC 61196-1:1995, Clause 14, Guidance for surface transfer impedance and screening attenuation limits

36、 for flexible r.f. cables. In this technical report, the relationship between surface transfer impedance (Z T ) and screening attenuation (a s ) is given, also measurements of Z T and a s are provided to show the correlation of mean screening attenuation between 200 MHz and 500 MHz and Z Tat both 30

37、 MHz and 300 MHz. The sensitivity of a s to the relative velocity difference between the inner and outer system is shown. The cable data sheet should show the a svalues in a standardized form v/v = 10 % and the characteristic impedance of the outer system is 150 . It is also shown that a relative ve

38、locity difference change from 10 % to 40 % gives an improvement of 12 dB in screening attenuation. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the lates

39、t edition of the referenced document (including any amendments) applies. IEC/TR 61917, Cables, cable assemblies and connectors Introduction to electromagnetic (EMC) screening measurements 3 General At high frequencies, when the surface transfer impedance Z Tand effective transfer impedance T F TE f

40、n, Z Z Z = increase 6 dB per octave, the relationship to the screening attenuation a sis frequency independent and can be written as (see also Figure 1): n f 10 n f s log 20 T a = (1) r1 r2 2 1 o T 10 1 2 2 1 T 10 c log 20 log 20 = = Z Z Z v l v l Z Z Z(2) and TR 62153-4-0 IEC:2007 5 1 1 2 2n f n f

41、/ / Z U Z U T = (3) where l is the length of the cable under test; D 1 is the cylinder diameter; E 1is the source voltage; T n,f are the coupling transfer functions; n is for the near end and f for the far end; U 1nis the inner circuit near end voltage; U 2nis the outer circuit near end voltage; U 1

42、fis the inner circuit far end voltage; U 2fis the outer circuit far end voltage; Z 1 is the characteristic impedance of the cable; Z 2 is the impedance of the outer circuit; r1 is the cable dielectric permittivity; r2 is the permittivity of the outer circuit; c o is the velocity of light in vacuum;

43、is the radian frequency; v 1 is the propagation velocity of the inner circuit; v 2 is the propagation velocity of the outer circuit; Z F is the capacitive coupling impedance; Z T is the surface transfer impedance; f n, TE Z is the effective transfer impedance. l E 1Z 1Z 2Z 2 Z 1D 1 Z 1v 1Z 2v 2 U 1n

44、 U 2nU 2fU 1f+ 1 2 IEC 2143/07 Key 1 inner circuit, cable under test 2 outer circuit, formed by test line or cylinder or the outer environment as in the absorbing clamp method Figure 1 Concept of screening measurement set-ups 6 TR 62153-4-0 IEC:2007 When the capacitive coupling impedance Z Fis prese

45、nt (spaces in the outer conductor), Z Tshall be substituted by Z TE . “+“ sign is for the near end and “ sign for the far end. Z 1and Z 2are the impedances of the inner and outer system and v 1and v 2the corresponding velocities. Screening attenuation a sis a reliable measure of screening efficiency

46、 when the frequency is constant. This is true when Z Tor Z TE increases 6 dB/octave and the following criterion is fulfilled: r2 r1 o n f l (4) where o is the wave length in free space. At lower frequencies when l is smaller than that found from (4), the coupling attenuation is: 2 1 T F 10 n f 10 n

47、f s 2 ) ( log 20 log 20 Z Z l Z Z T A = = (5) More detailed information on the above equations is given in the IEC/TR 61917. 4 Correlation between measured screening attenuation a sand measured surface transfer impedances at 30 MHz and 300 MHz Z Tand a swere measured using the same cable constructio

48、n. Figures 2, 3 and 4 show the correlation between a s(mean value between 200 MHz and 500 MHz) and the Z Tvalues correspondingly at 30 MHz and 300 MHz. In Figure 5, typical Z Tcurves are shown. For single and double braided outer conductors, the 6 dB/octave increase is reached at 30 MHz but for foil

49、braid constructions at 30 MHz, Z Tcan still be decreasing. The effect of this can be clearly seen when comparing the test results in Figures 2, 3 and 4 for the foil-braid cables. The correlation between a sand Z T (30 MHz) is poor, but much better between a sand Z T (300 MHz). For single and double braided cables, the correlation is e