1、 IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee
2、 20 IEEE Std 1232.3-2014 IEEE Std 1232.3-2014 IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 20 August 2014 IEEE-SA Standar
3、ds Board Abstract: Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example system under test to illustrate how the static model constructs of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTAT
4、E) are used to form a diagnostic reasoner knowledge base. Each of AI-ESTATEs knowledge base types is discussed in conceptual terms, and how those concepts are represented in exchange files is shown. Also, some of the nuanced aspects of diagnostic knowledge bases in AI-ESTATE are clarified. An exampl
5、e reasoner session is provided to illustrate the use of AI-ESTATE services. Keywords: AI-ESTATE, Bayesian Network, diagnosis, diagnostic inference, diagnostic model, diagnostic services, D-matrix, fault tree, IEEE 1232.3, knowledge exchange, reasoner, system test The Institute of Electrical and Elec
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35、ion may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the AI-ESTATE Users Guide Working Group had the following membership: Simon Jessop, Chair Darryl Busch, Co-Chair Michael Bodkin Nathan Fortier Mike Seavey John Sheppard Liessman Sturlaugs
36、on Timothy Wilmering The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Malcom Brown Darryl Busch Keith Chow William Frank Randall Groves Werner Hoelzl Noriyuki Ikeuchi Anand Jain Albert Livshitz Teresa
37、Lopes Mukund Modi Ion Neag Alexandros Nikitas Leslie Orlidge Ulrich Pohl Bartien Sayogo Mike Seavey John Sheppard Joseph Stanco Walter Struppler Ronald Taylor Timothy Wilmering Daidi Zhong When the IEEE-SA Standards Board approved this guide on 21 August 2014 it had the following membership: John Ku
38、lick, Chair Jon Walter Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David Law Hung Ling Oleg Logvinov T. W. Olse
39、n Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE-SA Conten
40、t Publishing Patricia Gerdon IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. vi Introduction This introduction is not part of IEEE Std 1232.3-2014, IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE). IEEE Std
41、 1232-2010, IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) defines formal information models and software services specific to several different types of diagnostic reasoners to enable unambiguous access to and understanding of the information
42、 supporting system test and diagnosis. This guide supplements IEEE Std 1232-2010 and is part of the document set. This guide has been prepared to help all users of IEEE Std 1232-2010. IEEE Std 1232-2010 may be used within any test discipline and with any carrier language, and the examples provided i
43、n this guide should be seen as typical. This guide explains AI-ESTATE features and application using a consistent simple doorbell system example. It describes the static diagnostic model information contained in the Common Element Model (CEM) and four additional specialized diagnostic model types. T
44、he guide also shows how the standard supports the dynamic operation of the reasoner using standard services. The need for a guide arose from the experience of users in the creation of diagnostic models and applications using IEEE Std 1232-2010. This experience showed that further information and exa
45、mples on the implementation and application of the standard was required. The purpose of this guide is to provide guidance in the technique of implementation, application, and usage of the basic diagnostic models defined in IEEE Std 1232-2010 to create diagnostic models and reasoning applications. T
46、his is seen as particularly important in promoting the use of a relatively new and unambiguous method of describing diagnostic information. This guide is not intended to be used as an instruction manual for IEEE Std 1232-2010 nor as a substitute for formal training, but by its nature it should find
47、some application in the training environment. Clause 5 is intended as a brief introduction to the history and development of AI-ESTATE. Clause 7 concentrates on the description of the static diagnostic models used to describe system test and diagnosis information. The Common Element Model (CEM), Fau
48、lt Tree Model (FTM), Bayesian Network Model (BNM), Dmatrix Inference Model (DIM), and Diagnostic Logic Model (DLM) are all covered. Clause 8 provides a description of the AI-ESTATE reasoner services and provides a diagnostic session sequence example. IEEE Std 1232-2010 does not specify any particula
49、r software language, interface bindings, or client-reasoner communication framework, and this guide does not provide any advice on this topic. Copyright 2014 IEEE. All rights reserved. vii Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Word usage 2 1.4 IEEE download site . 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 2 3.1 Definitions . 2 3.2 Acronyms and abbreviations . 2 4. Background 3 5. Use cases 5 5.1 Introduction . 5 5.2 Static model exchange . 5 5.3 Technology insertion . 5 5.4 Session data export 5 6. Introduction to the doorbell ex
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