ImageVerifierCode 换一换
格式:PDF , 页数:111 ,大小:2.40MB ,
资源ID:1248144      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-1248144.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(IEEE 1309-2013 en Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz《频率为9KHz~40GHz的电磁场传感器和探头(天线除外)的校准》.pdf)为本站会员(priceawful190)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 1309-2013 en Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz《频率为9KHz~40GHz的电磁场传感器和探头(天线除外)的校准》.pdf

1、 IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz Sponsored by the Standards Development Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Electromagnetic Compatibility SocietyIEEE Std 1309-2013(Revision ofIEEE Std 1309-2

2、005) IEEE Std 1309-2013 (Revision of IEEE Std 1309-2005) IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 31 October 2013 IEEE-SA Stan

3、dards Board Abstract: Consensus calibration methods for electromagnetic (EM) field sensors and probes are provided. Data recording and reporting requirements are given, and methods for estimating measurement uncertainty are specified. Keywords: calibration, electric field measurement, electromagneti

4、c, field probe, field sensor, IEEE 1309, instrumentation measurement uncertainty The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 20 Nov

5、ember 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: resu

6、lts; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and service

7、s related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards ava

8、ilable, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independe

9、nt judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQU

10、ENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OU

11、T OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standa

12、rd is translated, only the English version published by IEEE should be considered the approved IEEE standard. iv Copyright 2013 IEEE. All rights reserved. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall no

13、t be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it c

14、lear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE

15、does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is i

16、mportant that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where

17、the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following ad

18、dress: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regula

19、tory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as

20、doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in pr

21、ivate self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the approp

22、riate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service,

23、 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. v Copyright 2013 IEEE. All rights reserved. Updating of IEEE Standards documents Users o

24、f IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition

25、of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still

26、 of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendmen

27、ts, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, i

28、f any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may requ

29、ire use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Lett

30、er of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with

31、reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for whi

32、ch a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discrimina

33、tory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2013 IEEE. All rights r

34、eserved. Participants At the time this draft standard was completed, the WG1309 Working Group had the following membership. The working group members may have voted for approval, disapproval, or abstention on the working group version of the draft standard. Zhong Chen, Chair Tim Harrington, Technica

35、l Editor Dennis G. Camell Domenico Festa Daniel Hoolihan Mike Howard Shinobu Ishigami Werner Schaefer The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Bush William Byrd Suresh Channarasappa

36、Keith Chow Randall Groves Edward Hare Werner Hoelzl Daniel Hoolihan Noriyuki Ikeuchi Sergiu Iordanescu Efthymios Karabetsos Chad Kiger Arthur H. Light Greg Luri Michael Newman Ghery Pettit Iulian Profir Michael Roberts Bartien Sayogo Walter Struppler Yingli Wen Jian Yu When the IEEE-SA Standards Boa

37、rd approved this standard on 31 October 2013 it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexande

38、r Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Bo

39、ard liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Senior Program Manager, Document Development Joan Woolery IEEE Standards Program Manager, Technical Program Development vii Copyright 2013 IEEE. All rights reserved. Introduction T

40、his introduction is not part of IEEE Std 1309-2013, IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz. This standard provides calibration methods for electromagnetic (EM) field sensors and probes, excluding antennas per se, for the fr

41、equency range of 9 kHz to 40 GHz. The original version of this standard was developed and released in 1996 in response to need within the electromagnetic compatibility (EMC) test and measurement community for standard (consensus) methods of calibration for commonly used EM field sensors and probes.

42、The 2005 version of the standard provided updates to the original 1996 version to clarify items that some users may have found difficult to understand, to expand details and examples with respect to estimating and expressing calibration uncertainty, and to present additional technical background inf

43、ormation. Also, the 2005 version inserted calibration methods for field probes used for specific types of commercial electronic products radiated immunity testing i.e., IEC 61000-4-3:2006 B48a, and H-field probe calibrations applicable for ANSI C63.19-2007 B3 hearing aid and wireless communication d

44、evice compatibility testing. The 2013 version of the standard consolidates field generation setups and calculation methods with test methods specified in probe calibrations for typical commercial electronics products radiated immunity setups, and improves consistency in primary field calculations, e

45、specially for TEM cells. The 2013 version also adds specific guidance about calculating measurement uncertainties for TEM cell and Helmholtz coil methods. A new section is now included on minimizing measurement uncertainties during end uses of calibrated probes. An informative annex is introduced wi

46、th basic information about probe types and uses for measuring various types of signals. Other changes include new definitions of probe alignment with respect to the incident electromagnetic field, and extraction of subclauses about grades of calibrations and time domain calibration procedures, due t

47、o the limited and specific applications of these subjects. aNumbers in brackets correspond to the numbers of the bibliography in Annex F. This standard provides calibration methods that are appropriate to various frequency ranges and user requirements. Methods for creating standard electric and magn

48、etic fields used for calibration are presented. Because the specific calibration needs for a particular field probe or sensor depend on its intended use, guidelines to specify and communicate calibration requirements are provided. This standard also provides details for estimating and expressing cal

49、ibration measurement uncertainties. viii Copyright 2013 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Other considerations and background 2 1.4 Generic probe types . 3 2. Normative references 4 3. Definitions 5 4. Measurement methods 8 4.1 Calibration methods . 8 4.2 Field sensor or probe orientation during calibration 8 5. Standard field generation methods . 11 6. Calibration uncertainty . 13 6.1 General considerations . 13 6.2 Standard uncertainty 13 6.3 Combined standard uncertainty . 13 6.4 Expanded uncertainty 13 6.5 Reporting

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1