IEEE 1309-2013 en Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz《频率为9KHz~40GHz的电磁场传感器和探头(天线除外)的校准》.pdf

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1、 IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz Sponsored by the Standards Development Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Electromagnetic Compatibility SocietyIEEE Std 1309-2013(Revision ofIEEE Std 1309-2

2、005) IEEE Std 1309-2013 (Revision of IEEE Std 1309-2005) IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 31 October 2013 IEEE-SA Stan

3、dards Board Abstract: Consensus calibration methods for electromagnetic (EM) field sensors and probes are provided. Data recording and reporting requirements are given, and methods for estimating measurement uncertainty are specified. Keywords: calibration, electric field measurement, electromagneti

4、c, field probe, field sensor, IEEE 1309, instrumentation measurement uncertainty The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 20 Nov

5、ember 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: resu

6、lts; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and service

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19、tory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as

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27、ts, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, i

28、f any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may requ

29、ire use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Lett

30、er of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with

31、reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for whi

32、ch a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discrimina

33、tory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2013 IEEE. All rights r

34、eserved. Participants At the time this draft standard was completed, the WG1309 Working Group had the following membership. The working group members may have voted for approval, disapproval, or abstention on the working group version of the draft standard. Zhong Chen, Chair Tim Harrington, Technica

35、l Editor Dennis G. Camell Domenico Festa Daniel Hoolihan Mike Howard Shinobu Ishigami Werner Schaefer The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Bush William Byrd Suresh Channarasappa

36、Keith Chow Randall Groves Edward Hare Werner Hoelzl Daniel Hoolihan Noriyuki Ikeuchi Sergiu Iordanescu Efthymios Karabetsos Chad Kiger Arthur H. Light Greg Luri Michael Newman Ghery Pettit Iulian Profir Michael Roberts Bartien Sayogo Walter Struppler Yingli Wen Jian Yu When the IEEE-SA Standards Boa

37、rd approved this standard on 31 October 2013 it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexande

38、r Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Bo

39、ard liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Senior Program Manager, Document Development Joan Woolery IEEE Standards Program Manager, Technical Program Development vii Copyright 2013 IEEE. All rights reserved. Introduction T

40、his introduction is not part of IEEE Std 1309-2013, IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes (Excluding Antennas) from 9 kHz to 40 GHz. This standard provides calibration methods for electromagnetic (EM) field sensors and probes, excluding antennas per se, for the fr

41、equency range of 9 kHz to 40 GHz. The original version of this standard was developed and released in 1996 in response to need within the electromagnetic compatibility (EMC) test and measurement community for standard (consensus) methods of calibration for commonly used EM field sensors and probes.

42、The 2005 version of the standard provided updates to the original 1996 version to clarify items that some users may have found difficult to understand, to expand details and examples with respect to estimating and expressing calibration uncertainty, and to present additional technical background inf

43、ormation. Also, the 2005 version inserted calibration methods for field probes used for specific types of commercial electronic products radiated immunity testing i.e., IEC 61000-4-3:2006 B48a, and H-field probe calibrations applicable for ANSI C63.19-2007 B3 hearing aid and wireless communication d

44、evice compatibility testing. The 2013 version of the standard consolidates field generation setups and calculation methods with test methods specified in probe calibrations for typical commercial electronics products radiated immunity setups, and improves consistency in primary field calculations, e

45、specially for TEM cells. The 2013 version also adds specific guidance about calculating measurement uncertainties for TEM cell and Helmholtz coil methods. A new section is now included on minimizing measurement uncertainties during end uses of calibrated probes. An informative annex is introduced wi

46、th basic information about probe types and uses for measuring various types of signals. Other changes include new definitions of probe alignment with respect to the incident electromagnetic field, and extraction of subclauses about grades of calibrations and time domain calibration procedures, due t

47、o the limited and specific applications of these subjects. aNumbers in brackets correspond to the numbers of the bibliography in Annex F. This standard provides calibration methods that are appropriate to various frequency ranges and user requirements. Methods for creating standard electric and magn

48、etic fields used for calibration are presented. Because the specific calibration needs for a particular field probe or sensor depend on its intended use, guidelines to specify and communicate calibration requirements are provided. This standard also provides details for estimating and expressing cal

49、ibration measurement uncertainties. viii Copyright 2013 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Other considerations and background 2 1.4 Generic probe types . 3 2. Normative references 4 3. Definitions 5 4. Measurement methods 8 4.1 Calibration methods . 8 4.2 Field sensor or probe orientation during calibration 8 5. Standard field generation methods . 11 6. Calibration uncertainty . 13 6.1 General considerations . 13 6.2 Standard uncertainty 13 6.3 Combined standard uncertainty . 13 6.4 Expanded uncertainty 13 6.5 Reporting

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