IEEE 1450 6 2-2014 en Memory Modeling in Core Test Language (CTL) (IEEE Computer Society)《核测试语言(CTL)中的内存建模 (IEEE计算机协会)》.pdf

1、 IEEE Standard for Memory Modeling in Core Test Language (CTL) Sponsored by the Test Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Computer Society IEEE Std 1450.6.2-2014IEEE Std 1450.6.2-2014 IEEE Standard for Memory Modeling in Core Test Language (CTL) Sponsor

2、Test Technology Standards Committee of the IEEE Computer Society Approved 27 March 2014 IEEE-SA Standards Board Abstract: Reuse of test data and test structures developed for individual cores (designs) when integrated into larger integrated circuits is required for system-on-chip (SoC) tests. This s

3、tandard defines language constructs sufficient to represent the context of a memory core and of the integration of that memory core into an SoC. This facilitates the development and reuse of test and repair mechanisms for memories. This standard also defines constructs that represent the test struct

4、ures internal to the memory core for reuse in the creation of the tests for the logic outside the memory core. Semantic rules are defined for the language to facilitate interoperability between different entities (the memory core provider, the system integrator, and the automation tool developer) in

5、volved in the creation of an SoC. The capabilities are an extension of IEEE Std 1450.6-2005. As a result of this extension, CTLs limitations of handling memories are addressed. Keywords: core test language (CTL), IEEE 1450.6.2, memory built-in self-test (memory BIST), memory modeling, memory repair,

6、 standard test interface language (STIL), system-on-chip (SoC) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 June 2014. Printed in

7、 the United States of America. Liberty is a trademark of Synopsys, Inc. Verilog is a registered trademark of Cadence Design Systems, Inc. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completen

8、ess of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other

9、 ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and com

10、ments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any pe

11、rson utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHAL

12、L IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT

13、, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development proce

14、ss involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA St

15、andards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting infor

16、mation on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membersh

17、ip affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a c

18、onsensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments o

19、r questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards

20、 should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not i

21、mply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and

22、these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference

23、, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Phot

24、ocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyr

25、ight Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IE

26、EE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of t

27、he document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of

28、some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments,

29、corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if an

30、y, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require

31、use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter o

32、f Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reas

33、onable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a

34、 license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory

35、. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved

36、. vi Participants At the time this IEEE standard was completed, the Core Test Language Working Group had the following membership: Saman Adham, Chair Slimane Boutobza, Vice Chair Albert Au Tim Ayres Karen Darbinyan Prashant Dubey Geir Eide Rajat Mehrotra Vidya Neerkundar Gary Waggoner Past members i

37、nclude the following: Nicco Bhabu Jaynata Bhadar Dwayne Burek Rohit Kapur Srinivas Mandyam-Kumar Chandramouli Ramamurti The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Saman Adham Juan Carreon Keit

38、h Chow Adam Cron Heiko Ehrenberg Randall Groves Peter Harrod Kazumi Hatayama Werner Hoelzl Rohit Kapur Anzou Ken-Ichi Adam Ley Benoit Nadeau-Dostie Jim OReilly Ulrich Pohl Paul Reuter Mike Ricchetti Thomas Starai Walter Struppler Srinivasa Vemuru Oren Yuen Daidi Zhong When the IEEE-SA Standards Boar

39、d approved this standard on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janez

40、ic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio

41、, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE-SA Content Publishing Kathryn Bennett IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 1450.6.2-2014, IEEE Standard for Memory Modeling

42、 in Core Test Language (CTL). The core test language (CTL) defined in IEEE Std 1450.6-2005 is a modeling language created to enable design reuse for system-on-chip flows (or SoC flows). The base CTL standard does not address all memory-specific characteristics and structural information required to

43、create memory test and repair patterns. This extension of CTL adds support for modeling memories. Copyright 2014 IEEE. All rights reserved. viii Contents 1. Overview 1 1.1 General 1 1.2 Memory integration flow . 2 1.3 Scope . 2 1.4 Purpose 2 1.5 Limitations of this standard . 3 1.6 Structure of this

44、 standard . 3 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 6 4. Extensions to IEEE Std 1450.6-2005 . 7 4.1 CTLMode - Internal blockextension of Data Type attributes 7 4.2 Addition to CTLMode Relation block 10 4.3 Port an

45、d Target for Purpose statementextensions to IEEE Std 1450.6-2005, Clause 16 11 4.4 Compatibility blockextension to IEEE Std 1450.6-2005, Clause 16 12 4.5 MemoryStructures blockextension to IEEE Std 1450.6-2005, Clause 6 16 4.6 FileReference blockextension to IEEE Std 1450.6-2005, Clause 8 17 5. Memo

46、ryRepair block .18 5.1 Syntax .18 5.2 MemoryRepair block syntax description 20 5.3 MemoryRepair Examples .22 6. MemoryPhysicalOrganization block .26 6.1 Syntax .26 6.2 MemoryPhysicalOrganization block syntax descriptions .27 6.3 MemoryPhysicalOrganization examples 29 7. Memory CTL Orientation and Ca

47、pabilities Tutorial .34 7.1 Example of 3-port (2R/1W) memory with repair .34 7.2 Example of Memory with Pipelining and Bit-Line Twisting .45 7.3 Example of Memory with Bank Addressing 49 7.4 Example of Memory with Error Correction Code 54 7.5 Example of memory with embedded comparators .58 Copyright

48、 2014 IEEE. All rights reserved. 1 IEEE Standard for Memory Modeling in Core Test Language (CTL) IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health, or environmental protection, or ensure against interference with or from other devices or networks. Impleme

49、nters of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from