IEEE 1564-2014 en Guide for Voltage Sag Indices《电压暂降指标指南》.pdf

1、 IEEE Guide for Voltage Sag Indices Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1564-2014 IEEE Std 1564-2014 IEEE Guide for Voltage Sag Indices Sponsor Transmission and Distribution Committee of the IE

2、EE Power and Energy Society Approved 27 March 2014 IEEE-SA Standards Board Abstract: Appropriate voltage sag indices and characteristics of electrical power and supply systems as well as the methods for calculating them are identified. Methods are provided for quantifying the severity of individual

3、voltage sag events, for quantifying the performance at a specific location (single-site indices), and for quantifying the performance of the whole system (system indices). Multiple methods are presented for each. The methods are appropriate for use in transmission, distribution, and utilization elec

4、tric power systems. Keywords: IEEE 1564, power quality, power distribution faults, voltage sags The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. P

5、ublished 20 June 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relati

6、ng to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods

7、and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its st

8、andards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her ow

9、n independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY,

10、 OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN

11、 ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an

12、IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be

13、the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should

14、be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting inform

15、ation or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to com

16、ments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been add

17、ressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standard

18、s Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of

19、 the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft an

20、d approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardiza

21、tion, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a

22、 limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 0

23、1923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superse

24、ded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in ef

25、fect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are

26、cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.

27、org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the fo

28、llowing URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this sta

29、ndard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/

30、standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discr

31、imination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity

32、 or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the v

33、alidity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Voltage S

34、ag Indices Working Group had the following membership: Daniel D. Sabin, Chair Math Bollen, Vice Chair Richard Bingham Randy Collins Russ Ehrlich Dennis Hansen Theo Laughner Kevin Little Ian McMichael William Moncrief David Mueller Marty Page Robert Saint Kenneth Sedziol Mike Sheehan Timothy Unruh Wi

35、lsun Xu Francisc Zavoda The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Steven Alexanderson Saleman Alibhay Chris Ambrose Thomas Barnes Julio Barros G. Bartok David Basse

36、tt Wallace Binder Richard Bingham Harvey Bowles Chris Brooks Gustavo Brunello Zeeky Bukhala William Bush William Byrd Thomas Callsen Wen-Kung Chang Robert Christman Larry Conrad Ray Davis Andrew Dettloff Neal Dowling Fredric Friend David Gilmer Mietek Glinkowski Thomas Grebe Randall Groves Ajit Gwal

37、 Donald Hall Robert Hanna Dennis Hansen Jeffrey Hauber David Haynes Jeffrey Helzer Lee Herron Werner Hoelzl Mayank Jain Laszlo Kadar Gael Kennedy Yuri Khersonsky James Kinney Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam Theo Laughner Michael Lauxman Albert Livshitz Ahmad Mahinfallah William Monc

38、rief Jerry Murphy Michael Newman Joe Nims Matthew Norwalk Gearold OhEidhin Lorraine Padden Richard Paes Mirko Palazzo Bansi Patel Shawn Patterson Iulian Profir Moises Ramos Michael Roberts Charles Rogers James Rossman Thomas Rozek Daniel D. Sabin Robert Saint Bartien Sayogo Dennis Schlender Robert S

39、chuerger Kenneth Sedziol Nikunj Shah Suresh Shrimavle David Singleton Jerry Smith John Spare Gary Stoedter K. Stump Michael Swearingen John Toth Joe Uchiyama Eric Udren Timothy Unruh Luis Vargas John Vergis Daniel Ward Lee Welch Val Werner Kenneth White James Wikston Jonathan Woodworth Wilsun Xu Jia

40、n Yu Luis Zambrano Francisc Zavoda Ahmed Zobaa Copyright 2014 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this guide on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalio

41、s, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don W

42、right Yu Yuan*Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Erin Spiewak IEEE-SA Standards Technical Community Copyright 2014 IEEE. All r

43、ights reserved. viii Introduction This introduction is not part of IEEE Std 1564-2014, IEEE Guide for Voltage Sag Indices. This guide provides methods for computing voltage sag indices and characteristics. Voltage sag indices are one way of quantifying the performance of electric power and supply sy

44、stems. Voltage sag is a short-duration root-mean-square (rms) voltage variation associated with a reduction in voltage that may cause disruption of the operation of certain types of equipment. Voltage sags are due to short-duration increases in current, typically due to faults, motor starting, or tr

45、ansformer energizing. Voltage-sag events can occur at any location in the power system, with a frequency of occurrence between several times and hundreds of times per year. This guide provides equivalent methods for computing indices and characteristics concerning voltage swells. A voltage swell is

46、a short-duration increase in voltage. On multiphase systems, a voltage swell in one phase can be associated with a voltage sag in another phase. Some of the methods discussed will classify such an event as both a voltage sag and a voltage swell. This guide presents methods for quantifying the severi

47、ty of individual rms variation events, for quantifying the performance at a specific location (i.e., single-site indices), and for quantifying the performance of the whole system (i.e., system indices). Multiple methods are presented for each of these. This guide does not recommend the use of a spec

48、ific set of indices because the large variation in customers sensitive to voltage sags and in network companies supplying them makes it impossible to prescribe a specific set of indices for all cases. Instead, this guide recommends the method for calculating specific indices when such an index is us

49、ed. It aims to assist in the choice of index and to help ensure reproducibility of the results after a certain index has been chosen. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Procedure summary 5 5. Single-Event characteristics . 6 5.1 General 6 5.2 RMS voltage as a function of time 7 5.3 Retained voltage and duration . 9 5.4 Voltage sag energy index 11 5.5 Voltage sag severity 14 5.6 Multichannel and three-phase measurements .16 5.7 Characteristic voltage .17 6. Site indic