1、 IEEE Guide for Voltage Sag Indices Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1564-2014 IEEE Std 1564-2014 IEEE Guide for Voltage Sag Indices Sponsor Transmission and Distribution Committee of the IE
2、EE Power and Energy Society Approved 27 March 2014 IEEE-SA Standards Board Abstract: Appropriate voltage sag indices and characteristics of electrical power and supply systems as well as the methods for calculating them are identified. Methods are provided for quantifying the severity of individual
3、voltage sag events, for quantifying the performance at a specific location (single-site indices), and for quantifying the performance of the whole system (system indices). Multiple methods are presented for each. The methods are appropriate for use in transmission, distribution, and utilization elec
4、tric power systems. Keywords: IEEE 1564, power quality, power distribution faults, voltage sags The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. P
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33、alidity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Voltage S
34、ag Indices Working Group had the following membership: Daniel D. Sabin, Chair Math Bollen, Vice Chair Richard Bingham Randy Collins Russ Ehrlich Dennis Hansen Theo Laughner Kevin Little Ian McMichael William Moncrief David Mueller Marty Page Robert Saint Kenneth Sedziol Mike Sheehan Timothy Unruh Wi
35、lsun Xu Francisc Zavoda The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Steven Alexanderson Saleman Alibhay Chris Ambrose Thomas Barnes Julio Barros G. Bartok David Basse
36、tt Wallace Binder Richard Bingham Harvey Bowles Chris Brooks Gustavo Brunello Zeeky Bukhala William Bush William Byrd Thomas Callsen Wen-Kung Chang Robert Christman Larry Conrad Ray Davis Andrew Dettloff Neal Dowling Fredric Friend David Gilmer Mietek Glinkowski Thomas Grebe Randall Groves Ajit Gwal
37、 Donald Hall Robert Hanna Dennis Hansen Jeffrey Hauber David Haynes Jeffrey Helzer Lee Herron Werner Hoelzl Mayank Jain Laszlo Kadar Gael Kennedy Yuri Khersonsky James Kinney Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam Theo Laughner Michael Lauxman Albert Livshitz Ahmad Mahinfallah William Monc
38、rief Jerry Murphy Michael Newman Joe Nims Matthew Norwalk Gearold OhEidhin Lorraine Padden Richard Paes Mirko Palazzo Bansi Patel Shawn Patterson Iulian Profir Moises Ramos Michael Roberts Charles Rogers James Rossman Thomas Rozek Daniel D. Sabin Robert Saint Bartien Sayogo Dennis Schlender Robert S
39、chuerger Kenneth Sedziol Nikunj Shah Suresh Shrimavle David Singleton Jerry Smith John Spare Gary Stoedter K. Stump Michael Swearingen John Toth Joe Uchiyama Eric Udren Timothy Unruh Luis Vargas John Vergis Daniel Ward Lee Welch Val Werner Kenneth White James Wikston Jonathan Woodworth Wilsun Xu Jia
40、n Yu Luis Zambrano Francisc Zavoda Ahmed Zobaa Copyright 2014 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this guide on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalio
41、s, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don W
42、right Yu Yuan*Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Erin Spiewak IEEE-SA Standards Technical Community Copyright 2014 IEEE. All r
43、ights reserved. viii Introduction This introduction is not part of IEEE Std 1564-2014, IEEE Guide for Voltage Sag Indices. This guide provides methods for computing voltage sag indices and characteristics. Voltage sag indices are one way of quantifying the performance of electric power and supply sy
44、stems. Voltage sag is a short-duration root-mean-square (rms) voltage variation associated with a reduction in voltage that may cause disruption of the operation of certain types of equipment. Voltage sags are due to short-duration increases in current, typically due to faults, motor starting, or tr
45、ansformer energizing. Voltage-sag events can occur at any location in the power system, with a frequency of occurrence between several times and hundreds of times per year. This guide provides equivalent methods for computing indices and characteristics concerning voltage swells. A voltage swell is
46、a short-duration increase in voltage. On multiphase systems, a voltage swell in one phase can be associated with a voltage sag in another phase. Some of the methods discussed will classify such an event as both a voltage sag and a voltage swell. This guide presents methods for quantifying the severi
47、ty of individual rms variation events, for quantifying the performance at a specific location (i.e., single-site indices), and for quantifying the performance of the whole system (i.e., system indices). Multiple methods are presented for each of these. This guide does not recommend the use of a spec
48、ific set of indices because the large variation in customers sensitive to voltage sags and in network companies supplying them makes it impossible to prescribe a specific set of indices for all cases. Instead, this guide recommends the method for calculating specific indices when such an index is us
49、ed. It aims to assist in the choice of index and to help ensure reproducibility of the results after a certain index has been chosen. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Procedure summary 5 5. Single-Event characteristics . 6 5.1 General 6 5.2 RMS voltage as a function of time 7 5.3 Retained voltage and duration . 9 5.4 Voltage sag energy index 11 5.5 Voltage sag severity 14 5.6 Multichannel and three-phase measurements .16 5.7 Characteristic voltage .17 6. Site indic
