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本文(IEEE 1584 1-2013 en Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 《依据IEEE Std 1.pdf)为本站会员(livefirmly316)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 1584 1-2013 en Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 《依据IEEE Std 1.pdf

1、 IEEE Guide for the Specification ofScope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 Sponsored by the Petroleum and Chemical Industry Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Industry Applications Society IEEE Std 1584

2、.1-2013IEEE Std 1584.1-2013 IEEE Guide for the Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 Sponsor Petroleum and Chemical Industry Committee of the IEEE Industry Applications Society Approved 11 December 2013 IEEE-SA

3、Standards Board Abstract: Guidance for the specification and performance of an arc-flash hazard calculation study, in accordance with the process defined in IEEE Std 1584, is provided in this document. It outlines the minimum recommended requirements to enable the owner or its representative to spec

4、ify an arc-flash hazard study, including scope of work and associated deliverables. Keywords: arc fault currents, arc-flash boundary, arc-flash hazard, arc-flash hazard analysis, arc-flash hazard marking, arc in enclosures, arc in open air, bolted fault currents, electrical hazard, IEEE 1584.1, inci

5、dent energy, protective device coordination study, short-circuit study, working distances The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publish

6、ed 10 February 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating

7、 to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods an

8、d services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its stan

9、dards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own

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11、R CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN A

12、NY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IE

13、EE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be th

14、e official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be

15、 considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting informat

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18、ssed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards

19、Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of t

20、he standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and

21、approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardizati

22、on, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a l

23、imited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 019

24、23 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be supersede

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26、ct. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are ca

27、utioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.or

28、g/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the foll

29、owing URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this stand

30、ard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/st

31、andards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrim

32、ination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity o

33、r scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the val

34、idity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Arc-Flash H

35、azard Calculations Working Group had the following membership: Daleep C. Mohla, Chair L. Bruce McClung, Vice Chair Jim Phillips, Secretary/1584.1 Team Vice Leader Kenneth S. Jones, 1584.1 Team Leader Daniel Adjetey Jean Ayoub James Babcock Ilanchezhian Balasubramanian Pirooz Barkhordar Louis Barrios

36、 Terry Becker James Beyreis Joshua Billman Waylon Bowers Rachel Bugaris Eric Campbell Ray Catlett Eva Clark Craig Clarke D. Ray Crow Steve Dittman Maurice DMello Daniel Doan Paul Dobrowsky Mike Doherty Gary Donner Ryan Downey Paul Eaton Rakan El-Mahayni Steve Emert Tim Faber Mark Fisher Frank Foote

37、Robert Fuhr Tammy Gammon Tim Gauthier John Hempstead Dennis Hill Robert Hughes Ben C. Johnson Dee Jones Mike Lang Robert G. Lau Wei-Jen Lee Kevin J. Lippert Albert Marroquin Larry McGuire John McQuilkin Peter Megna James Mitchem Roger Morgan Dean Naylor Dennis Neitzel John Nelson Mike Noonan Wheeler

38、 OHarrow Sergio A. Panetta Tom Papallo Anthony Parsons Brian Radibratovic Bob Ragsdale Ken Rempe Dave Rewitzer Tim Rohrer Rupeto Sanchez Vincent Saporita Todd Sauve Edwin Scherry Paul Schroder Gregory Shirek Tom Short Jeremy Smith Don Sweeney David Sweeting Richard Tanner Marcelo Valdes Peter Walsh

39、Craig M. Wellman Matt Westerdale Kenneth P. White Shawn Worthington Alan Worthy Alex Wu The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael Adams Ilanchezhian Balasubramanian Robert Barnett Thomas

40、 Bishop Frederick Brockhurst Chris Brooks Sheila Brown Rachel Bugaris John Byrne Keith Chow Donald Colaberardino Jerry Corkran Alireza Daneshpooy Glenn Davis Paul Dobrowsky Gary Donner Randall Dotson Donald Dunn Marcia Eblen Carl Fredericks J. Travis Griffith Randall Groves Paul Hamer Scott Hietpas

41、Werner Hoelzl R. Jackson Ben C. Johnson Laszlo Kadar John Kay Gael Kennedy Yuri Khersonsky Royce King Jim Kulchisky Saumen Kundu Ed Larsen Duane Leschert Steven Liggio Kevin J. Lippert William Lockley Greg Luri William Maxwell John McAlhaney, Jr. William McBride Benjamin McClung L. Bruce McClung Lar

42、ry McGuire John McQuilkin John Merando Copyright 2014 IEEE. All rights reserved. vii John Miller James Mitchem Daleep C. Mohla Daniel Mulkey Paul Myers Daniel Neeser Dennis Neitzel Arthur Neubauer Michael Newman Charles Ngethe Wheeler OHarrow T. Olsen Lorraine Padden Richard Paes Sergio A. Panetta D

43、onald Parker David Parman Antony Parsons Christopher Petrola Jim Phillips Iulian Profir Nicholas Rafferty Charles Rogers Vincent Saporita Bartien Sayogo Edwin Scherry Robert Seitz Gregory Shirek Suresh Shrimavle Gil Shultz James Smith Jeremy Smith Jerry Smith Gary Stoedter Peter Sutherland Wayne Tim

44、m James Tomaseski Luis Vargas John Vergis Craig M. Wellman Yingli Wen Kenneth P. White Tamatha Womack John Yale Jian Yu When the IEEE-SA Standards Board approved this guide on 11 December 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair

45、 Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens

46、Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE-SA Content Publishing Lisa Perry IEEE-SA Technical Community Pr

47、ograms Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std 1584.1-2013, IEEE Guide for the Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584. This guide has been developed b

48、y the Arc-Flash Hazard Calculations Working Group to support application of IEEE Std 1584. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Arc-flash study general guidelines . 2 3.1 Scope of the arc-flash study . 2 3.2 Work

49、ing distances . 3 3.3 Shock hazard analysis 3 3.4 Results and recommendations . 3 4. Complexity of system . 3 4.1 Simple system (single mode of operation) . 3 4.2 Complex system (multiple modes of operation) 4 5. Data collection 4 5.1 Responsibility of data verification . 4 5.2 Data assumptions . 5 5.3 Owner-supplied information 5 6. Short-circuit study 6 6.1 Verification of system 6 6.2 Number of calculations (scenarios) needed . 6 6.3 Equipment evaluation 6 7. Overcurrent device clearing times/protective device coordination study . 7 7.1 Verification of existi

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