1、 IEEE Guide for the Specification ofScope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 Sponsored by the Petroleum and Chemical Industry Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Industry Applications Society IEEE Std 1584
2、.1-2013IEEE Std 1584.1-2013 IEEE Guide for the Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584 Sponsor Petroleum and Chemical Industry Committee of the IEEE Industry Applications Society Approved 11 December 2013 IEEE-SA
3、Standards Board Abstract: Guidance for the specification and performance of an arc-flash hazard calculation study, in accordance with the process defined in IEEE Std 1584, is provided in this document. It outlines the minimum recommended requirements to enable the owner or its representative to spec
4、ify an arc-flash hazard study, including scope of work and associated deliverables. Keywords: arc fault currents, arc-flash boundary, arc-flash hazard, arc-flash hazard analysis, arc-flash hazard marking, arc in enclosures, arc in open air, bolted fault currents, electrical hazard, IEEE 1584.1, inci
5、dent energy, protective device coordination study, short-circuit study, working distances The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publish
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34、idity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Arc-Flash H
35、azard Calculations Working Group had the following membership: Daleep C. Mohla, Chair L. Bruce McClung, Vice Chair Jim Phillips, Secretary/1584.1 Team Vice Leader Kenneth S. Jones, 1584.1 Team Leader Daniel Adjetey Jean Ayoub James Babcock Ilanchezhian Balasubramanian Pirooz Barkhordar Louis Barrios
36、 Terry Becker James Beyreis Joshua Billman Waylon Bowers Rachel Bugaris Eric Campbell Ray Catlett Eva Clark Craig Clarke D. Ray Crow Steve Dittman Maurice DMello Daniel Doan Paul Dobrowsky Mike Doherty Gary Donner Ryan Downey Paul Eaton Rakan El-Mahayni Steve Emert Tim Faber Mark Fisher Frank Foote
37、Robert Fuhr Tammy Gammon Tim Gauthier John Hempstead Dennis Hill Robert Hughes Ben C. Johnson Dee Jones Mike Lang Robert G. Lau Wei-Jen Lee Kevin J. Lippert Albert Marroquin Larry McGuire John McQuilkin Peter Megna James Mitchem Roger Morgan Dean Naylor Dennis Neitzel John Nelson Mike Noonan Wheeler
38、 OHarrow Sergio A. Panetta Tom Papallo Anthony Parsons Brian Radibratovic Bob Ragsdale Ken Rempe Dave Rewitzer Tim Rohrer Rupeto Sanchez Vincent Saporita Todd Sauve Edwin Scherry Paul Schroder Gregory Shirek Tom Short Jeremy Smith Don Sweeney David Sweeting Richard Tanner Marcelo Valdes Peter Walsh
39、Craig M. Wellman Matt Westerdale Kenneth P. White Shawn Worthington Alan Worthy Alex Wu The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael Adams Ilanchezhian Balasubramanian Robert Barnett Thomas
40、 Bishop Frederick Brockhurst Chris Brooks Sheila Brown Rachel Bugaris John Byrne Keith Chow Donald Colaberardino Jerry Corkran Alireza Daneshpooy Glenn Davis Paul Dobrowsky Gary Donner Randall Dotson Donald Dunn Marcia Eblen Carl Fredericks J. Travis Griffith Randall Groves Paul Hamer Scott Hietpas
41、Werner Hoelzl R. Jackson Ben C. Johnson Laszlo Kadar John Kay Gael Kennedy Yuri Khersonsky Royce King Jim Kulchisky Saumen Kundu Ed Larsen Duane Leschert Steven Liggio Kevin J. Lippert William Lockley Greg Luri William Maxwell John McAlhaney, Jr. William McBride Benjamin McClung L. Bruce McClung Lar
42、ry McGuire John McQuilkin John Merando Copyright 2014 IEEE. All rights reserved. vii John Miller James Mitchem Daleep C. Mohla Daniel Mulkey Paul Myers Daniel Neeser Dennis Neitzel Arthur Neubauer Michael Newman Charles Ngethe Wheeler OHarrow T. Olsen Lorraine Padden Richard Paes Sergio A. Panetta D
43、onald Parker David Parman Antony Parsons Christopher Petrola Jim Phillips Iulian Profir Nicholas Rafferty Charles Rogers Vincent Saporita Bartien Sayogo Edwin Scherry Robert Seitz Gregory Shirek Suresh Shrimavle Gil Shultz James Smith Jeremy Smith Jerry Smith Gary Stoedter Peter Sutherland Wayne Tim
44、m James Tomaseski Luis Vargas John Vergis Craig M. Wellman Yingli Wen Kenneth P. White Tamatha Womack John Yale Jian Yu When the IEEE-SA Standards Board approved this guide on 11 December 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair
45、 Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens
46、Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE-SA Content Publishing Lisa Perry IEEE-SA Technical Community Pr
47、ograms Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std 1584.1-2013, IEEE Guide for the Specification of Scope and Deliverable Requirements for an Arc-Flash Hazard Calculation Study in Accordance with IEEE Std 1584. This guide has been developed b
48、y the Arc-Flash Hazard Calculations Working Group to support application of IEEE Std 1584. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Arc-flash study general guidelines . 2 3.1 Scope of the arc-flash study . 2 3.2 Work
49、ing distances . 3 3.3 Shock hazard analysis 3 3.4 Results and recommendations . 3 4. Complexity of system . 3 4.1 Simple system (single mode of operation) . 3 4.2 Complex system (multiple modes of operation) 4 5. Data collection 4 5.1 Responsibility of data verification . 4 5.2 Data assumptions . 5 5.3 Owner-supplied information 5 6. Short-circuit study 6 6.1 Verification of system 6 6.2 Number of calculations (scenarios) needed . 6 6.3 Equipment evaluation 6 7. Overcurrent device clearing times/protective device coordination study . 7 7.1 Verification of existi
