IEEE 1641-2012 en Signal and Test Definition《信号和试验术语》.pdf

1、 IEC 62529 Edition 2.0 2012-06 INTERNATIONAL STANDARD Standard for Signal and Test Definition IEC 62529:2012(E)IEEE Std1641-2010IEEE Std 1641colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent 35.060 PRICE COD

2、EISBN 978-2-83220-103-9Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1641colourinsideIEC 62529:2012 ii IEEE Std 1641-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3

3、Application 1 1.4 Annexes . 2 2. Definitions, abbreviations, and acronyms. 2 2.1 Definitions . 2 2.2 Abbreviations and acronyms . 4 3. Structure of this standard 5 3.1 Layers 5 3.2 Signal Modeling Language (SML) layer . 6 3.3 BSC layer . 6 3.4 TSF layer . 6 3.5 Test requirement layer . 6 3.6 Using t

4、he layers . 7 4. Signals and SignalFunctions . 7 4.1 Introduction . 7 4.2 Physical signal states . 8 4.3 Event states 9 4.4 Digital stream states . 9 5. SML layer . 10 6. BSC layer . 11 6.1 BSC layer base classes . 11 6.2 General description of BSCs 11 6.3 SignalFunction template 12 7. TSF layer 12

5、7.1 TSF classes 13 7.2 TSF signals defined by a model . 13 7.3 TSF signals defined by an external reference 16 8. Test procedure language (TPL) 16 8.1 Goals of the TPL 16 8.2 Elements of the TPL 16 8.3 Use of the TPL . 17 9. Maximizing test platform independence. 17 Annex A (normative) Signal modeli

6、ng language (SML) . 18 A.1 Use of the SML . 18 A.2 Introduction. 18 A.3 Physical types . 19 A.4 Signal definitions 22 A.5 Pure signals . 24 A.6 Pure signal-combining mechanisms 26 A.7 Pure function transformations . 32 IEC 62529:2012 IEEE Std 1641-2010 iii Published by IEC under license from IEEE. 2

7、010 IEEE. All rights reserved. A.8 Measuring, limiting, and sampling signals . 32 A.9 Digital signals . 34 A.10 Basic component SML 38 A.11 Fast Fourier analysis support 63 Annex B (normative) Basic signal components (BSC) layer . 65 B.1 BSC layer base classes 65 B.2 BSC subclasses . 65 B.3 Descript

8、ion of a BSC 69 B.4 Physical class 76 B.5 PulseDefns class 87 B.6 SignalFunction class . 89 Annex C (normative) Dynamic signal descriptions 143 C.1 Introduction . 143 C.2 Basic classes 144 C.3 Dynamic signal goals and use cases 152 Annex D (normative) Interface definition language (IDL) basic compon

9、ents . 153 D.1 Introduction. 153 D.2 IDL BSC library . 153 Annex E (informative) Test signal framework (TSF) for C/ATLAS . 154 E.1 Introduction . 154 E.2 TSF library definition in extensible markup language (XML) 154 E.3 Interface definition language (IDL) for the TSF for C/ATLAS 154 E.4 AC_SIGNAL .

10、 155 E.5 AM_SIGNAL 157 E.6 DC_SIGNAL . 159 E.7 DIGITAL_PARALLEL 161 E.8 DIGITAL_SERIAL . 163 E.9 DIGITAL_TEST . 165 E.10 DME_INTERROGATION . 168 E.11 DME_RESPONSE 171 E.12 FM_SIGNAL . 174 E.13 ILS_GLIDE_SLOPE 177 E.14 ILS_LOCALIZER 180 E.15 ILS_MARKER 183 E.16 PM_SIGNAL 186 E.17 PULSED_AC_SIGNAL 188

11、 E.18 PULSED_AC_TRAIN . 190 E.19 PULSED_DC_SIGNAL 192 E.20 PULSED_DC_TRAIN . 194 E.21 RADAR_RX_SIGNAL . 196 E.22 RADAR_TX_SIGNAL 199 E.23 RAMP_SIGNAL . 200 E.24 RANDOM_NOISE . 202 E.25 RESOLVER 204 E.26 RS_232 207 E.27 SQUARE_WAVE . 208 E.28 SSR_INTERROGATION 210 E.29 SSR_RESPONSE 213 E.30 STEP_SIGN

12、AL . 217 E.31 SUP_CAR_SIGNAL . 219 E.32 SYNCHRO 221 E.33 TACAN . 225 IEC 62529:2012 iv IEEE Std 1641-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. E.34 TRIANGULAR_WAVE_SIGNAL . 229 E.35 VOR 231 Annex F (informative) Test signal framework (TSF) library for digital pul

13、se classes . 235 F.1 Introduction . 235 F.2 TSF library definition in extensible markup language (XML) 235 F.3 Graphical models of TSFs . 235 F.4 Pulse class family of TSFs 235 F.5 DTIF 252 Annex G (normative) Carrier language requirements 254 G.1 Carrier language requirements 254 G.2 Interface defi

14、nition language (IDL) 254 G.3 Datatypes 254 G.4 Data-processing requirements . 259 G.5 Control structures 263 Annex H (normative) Test procedure language (TPL) . 265 H.1 TPL layer 265 H.2 Elements of the TPL . 265 H.3 Structure of test requirements . 265 H.4 Carrier language 265 H.5 Signal statement

15、s 265 H.6 Mapping of test statements to carrier language . 267 H.7 Test statement definitions . 267 H.8 Elements used in test statement definitions 285 H.9 Attributes with multiple properties . 288 H.10 Transferring data in digital signals 292 H.11 Creating test requirements 296 H.12 Delimiting TPL

16、statements . 298 Annex I (normative) Extensible markup language (XML) signal descriptions 300 I.1 Introduction 300 I.2 XSD for BSCs 301 I.3 XSD for TSFs . 302 Annex J (informative) Support for ATLAS nouns and modifiers 308 J.1 Signal and test definition (STD) support for ATLAS signals 308 J.2 STD su

17、pport for ATLAS nouns . 308 J.3 STD support for C/ATLAS noun modifiers . 311 J.4 Support for C/ATLAS extensions 319 Annex K (informative) Guide for maximizing test platform independence and test application interchangeability . 320 K.1 Introduction. 320 K.2 Guiding principles. 320 K.3 Best practice

18、rules . 320 Annex L (informative) Bibliography 323 Annex M (informative) IEEE List of Participants . 325 IEC 62529:2012 IEEE Std 1641-2010 v Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Standard for Signal and Test Definition FOREWORD 1) The International Electrotechnica

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41、0 IEEE. All rights reserved. IEEE Std 1641-2010 (Revision of IEEE Std 1641-2004) IEEE Standard for Signal and Test Definition Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 17 June 2010 IEEE-SA Standards Board IEC 62529:2012 viii IEEE Std 1641-

42、2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Abstract: This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to f

43、orm complex signals usable across all test platforms. Keywords: ATE, ATLAS, automatic test equipment, IEEE 1641, signal definitions, test definitions, test requirements, test signals, unit under test, UUT g120IEEE is a registered trademark in the U.S. Patent most signals encountered in this standard

44、 have the reference type Time. Therefore, a Sinusoidal Voltage signal describes how the signals voltage changes with respect to time, in a sinusoidal manner. The use of types is such that SignalFunctions can be combined to build signals only when they have compatible types such as when one or more o

45、f the types are typeless, abstract, or generic or where the different signal types can be provided independently. Types that appear different and that represent a transform are allowed, as they represent a different method of specifying the same signal, e.g., Sinusoid (Voltage, Frequency) with Sinus

46、oid (Voltage, Time). An example of an illegal signal definition is one in which both current and voltage are specified because both cannot be controlled independently. Extendibility is served by providing the capability to describe new signals formally by creating them from the existing signals in e

47、ither the TSF or BSC layer. SignalFunctions are described in detail in Annex B. NOTEThe standard does allow a voltage to be specified together with a current limit (or vice versa) because limit signals are generic types.4A physical signal, event, or digital stream element may be active or inactive a

48、nd also may be controlled by events, i.e., it may be gated on or off. Thus, there are four possible states that may be adopted: active either of these will effectively gate the signal off. Only the “Event Active” state will gate the signal on. The difference is apparent when gating an event such as

49、a NotEvent. A NotEvent changes an “Event Active” state at its input to an “Event Inactive” state at its output, and vice versa. Gating a NotEvent will change its output between “No Event” and the appropriate “Event Active” or “Event Inactive” state. The fourth state, “Event Off,” may be considered not to exist for an event source. 4.4 Digital stream states Figure 4 shows the states available to elements of a digital stream. When there is no digital signal, it may be considered to be in the “Digital Off” state. A digital stream, whether