1、IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating MaterialsIEEE Std 98-2016(Revision of IEEE Std 98-2002)IEEE Standards Coordinating Committee 4Sponsored by the IEEE Standards Coordinating Committee 4 on Insulation SystemsIEEE3 Park Avenue
2、New York, NY 10016-5997USAIEEE Std 98-2016(Revision of IEEE Std 98-2002)IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating MaterialsSponsor IEEE Standards Coordinating Committee 4 on Insulation Systems Approved 29 January 2016IEEE-SA Standa
3、rds BoardAbstract: The test procedures covered by this standard apply to the thermal endurance of solid insulating materials, including processed compositions of raw materials, before they are fabricated into insulating structures identified with specific parts of electrical equipment.Keywords: dest
4、ructive test, end-point criteria, IEEE 98, nondestructive test, proof test, relative temperature index, solid insulating materials, temperature index, thermal aging, thermal enduranceThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2016
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34、cipantsAt the time this IEEE standard was completed, the IEEE 98 Revision Working Group had the following membership:Paulette Payne Powell, ChairGeorge FechtmannNathan MageeLewis Powell Roger WicksEdward Van VoorenThe following members of the individual balloting committee voted on this standard. Ba
35、lloters may have voted for approval, disapproval, or abstention.Wallace BinderAndrew BrownWilliam ByrdKeith ChowJerry CorkranRandall GrovesAjit GwalHamidreza HeidarisafaWerner HoelzlDavid HorvathLaszlo KadarRobert KonnikJim KulchiskyMichael LauxmanWilliam McDermidMichael NewmanPaulette Payne PowellD
36、onald PlattsIulian ProfirRobert ResualiJesse RorabaughBartien SayogoNikunj ShahEdward Van VoorenJohn VergisKenneth WhiteRoger WicksWhen the IEEE-SA Standards Board approved this standard on 10 February 2016, it had the following membership:Jean-Philippe Faure, ChairVacant Position, Vice ChairJohn D.
37、 Kulick, Past ChairKonstantinos Karachalios, SecretaryChuck AdamsMasayuki AriyoshiTed BurseStephen DukesJianbin FanJ. Travis GriffithGary HoffmanRon HotchkissMichael JanezicJoseph L. Koepfinger*Hung LingKevin LuAnnette D. ReillyGary RobinsonMehmet UlemaYingli WenHoward WolfmanDon WrightYu YuanDaidi
38、Zhong*Member Emeritus7Copyright 2016 IEEE. All rights reserved.IntroductionThis introduction is not part of IEEE Std 98-2016, IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials.IEEE Std 98-1986 reflected many of the concepts incor
39、porated in IEC 60216-1974 while maintaining many of the practical considerations from the initial IEEE Std 98-1972.IEEE Std 98-2002 incorporated additional changes in the IEC 60216 Standards and introduced the Fixed Time Frame Method (FTFM) of sampling for the thermal evaluation of materials.IEEE St
40、d 98-2016 provides details on the purpose of temperature indices and relative temperature indices rating, on thermal aging, causes of variations in ovens, and how to overcome influence of oven characteristics. More details for proof test and examples of nondestructive tests and proof tests are provi
41、ded. Table B.1 has been revised for consistency with IEC 60216-2 B1 and UL 746-B B6. Annexes summarizing accepted sampling techniques and an Annex on accelerated aging have been added.11The numbers in brackets correspond to those of the bibliography in Annex D.8Copyright 2016 IEEE. All rights reserv
42、ed.Contents1. Overview . 91.1 Scope 91.2 Purpose . 91.3 General . 102. Normative references 103. Definitions . 114. General considerations 124.1 Results of thermal endurance tests 124.2 End-point criteria 124.3 Test procedures and conditions . 134.4 Variability 145. Use of thermal evaluation data 15
43、6. Experimental procedure guidelines . 156.1 Selections of test methods 156.2 Selection of end points 166.3 Preparation of test specimens . 176.4 Number of test specimens . 176.5 Establishment of initial property value . 186.6 Temperature exposures and times . 186.7 Aging ovens 196.8 Procedure for a
44、ging 197. Evaluation . 207.1 Numerical analysis of thermal aging data . 207.2 Times/temperatures to end-point criterion 217.3 Extrapolation of the data . 217.4 Determination of temperature index (TI) 228. Test report 23Annex A (normative) Fixed time frame method sampling . 24Annex B (normative) Fixe
45、d temperature method of sampling . 26Annex C (informative) Accelerated aging of an electrical insulating material 28Annex D (informative) Bibliography 309Copyright 2016 IEEE. All rights reserved.IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health, or enviro
46、nmental protection, or ensure against interference with or from other devices or networks. Imple-menters of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable la
47、ws and regulations.This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning
48、 IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html.1. Overview1.1 ScopeThe test procedures covered by this standard apply to the thermal endurance of solid insulating materials, including processed compositions of raw materials
49、, before they are fabricated into insulating structures identi-fied with specific parts of electrical equipment.Tests for specific types of insulating materials, such as wire enamel, varnish, sheet, tape, etc. are not within the scope of this standard.1.2 PurposeThis standard provides principles for the development of test procedures to evaluate the thermal endurance of solid electrical insulating materials (EIMs) thermally aged in air. The test procedures use accelerated thermal endurance test(s), conducted in accordance with prescribed procedures herein. The thermal
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