IEC 60512-8-1-2010 Connectors for electronic equipment - Tests and measurements - Part.8-1 Static load tests (fixed connectors) - Test 8a Static load transverse.pdf

1、 IEC 60512-8-1 Edition 1.0 2010-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse Connecteurs pour quipements lectroniques Essais et mesures Partie 8-1: Essais sous

2、 charge statique (embases) Essai 8a: Charge statique transversale IEC 60512-8-1:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,

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16、s sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-8-1 Edition 1.0 2010-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measure

17、ments Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse Connecteurs pour quipements lectroniques Essais et mesures Partie 8-1: Essais sous charge statique (embases) Essai 8a: Charge statique transversale INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNI

18、QUE INTERNATIONALE E ICS 31.220.01 PRICE CODE CODE PRIX ISBN 978-2-88910-951-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-8-1 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONI

19、C EQUIPMENT TESTS AND MEASUREMENTS Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committ

20、ees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Availabl

21、e Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organ

22、izations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical m

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28、e whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced

29、publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Internationa

30、l Standard IEC 60512-8-1 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 8a of IEC 60512-5, issued in 1992. The structure of IEC 60512 series is

31、explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2154/FDIS 48B/2188/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-8-1 IEC:2010 3 This

32、publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this public

33、ation will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-8-1 IEC:2010 CONNECTORS F

34、OR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also

35、be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the suitability of a fixed connector for use in applications where it may be subject to transverse stresses. 2 Normative references The following referenced

36、 documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements

37、 Part 1-1: General examination Test 1a: Visual examination 3 Preparation of the specimen The specimen shall not be wired but shall be fitted with such accessories as may be required by the detail specification. Unless otherwise specified, the specimen shall be mounted in the normal manner, using the

38、 normal panel or chassis cut-out as laid down in the detail specification. NOTE The plate should be strong enough to sustain the applied forces. The length and width of the plate should be such that the contour of the specimen is exceeded. 4 Test method A specified force shall be applied to the spec

39、imen at the point and in the direction(s) as specified in the detail specification. This force shall be steadily increased up to the specified value and, unless otherwise specified in the detail specification, maintained for 1 min. Unless otherwise specified in the detail specification, the force sh

40、all be parallel to the mounting plate. 5 Final measurements a) Visual examination (IEC 60512-1-1, test 1a). b) Applicable operational characteristics. NOTE if applicable, the detail specification may require a sealing test from the IEC60512-14 series or an ingress protection test according IEC 60529

41、. 60512-8-1 IEC:2010 5 6 Requirements There shall be no damage which would impair normal operation. 7 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) mounting of the specimen, including dimensions of the panel cut-out; b) t

42、ype of accessories, if required; c) value of the force, and the rate of increase; d) location, direction(s) and duration of the application of the force; e) shape of the fixture or tool used for applying the force; f) requirements for final measurements; g) any deviation from the standard test metho

43、d. _ 6 60512-8-1 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 8-1: Essais sous charge statique (embases) Essai 8a: Charge statique transversale AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organi

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