1、 IEC 60512-8-1 Edition 1.0 2010-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse Connecteurs pour quipements lectroniques Essais et mesures Partie 8-1: Essais sous
2、 charge statique (embases) Essai 8a: Charge statique transversale IEC 60512-8-1:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,
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16、s sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-8-1 Edition 1.0 2010-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measure
17、ments Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse Connecteurs pour quipements lectroniques Essais et mesures Partie 8-1: Essais sous charge statique (embases) Essai 8a: Charge statique transversale INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNI
18、QUE INTERNATIONALE E ICS 31.220.01 PRICE CODE CODE PRIX ISBN 978-2-88910-951-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-8-1 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONI
19、C EQUIPMENT TESTS AND MEASUREMENTS Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committ
20、ees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Availabl
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29、publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Internationa
30、l Standard IEC 60512-8-1 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 8a of IEC 60512-5, issued in 1992. The structure of IEC 60512 series is
31、explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2154/FDIS 48B/2188/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-8-1 IEC:2010 3 This
32、publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this public
33、ation will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-8-1 IEC:2010 CONNECTORS F
34、OR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 8-1: Static load tests (fixed connectors) Test 8a: Static load, transverse 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also
35、be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the suitability of a fixed connector for use in applications where it may be subject to transverse stresses. 2 Normative references The following referenced
36、 documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements
37、 Part 1-1: General examination Test 1a: Visual examination 3 Preparation of the specimen The specimen shall not be wired but shall be fitted with such accessories as may be required by the detail specification. Unless otherwise specified, the specimen shall be mounted in the normal manner, using the
38、 normal panel or chassis cut-out as laid down in the detail specification. NOTE The plate should be strong enough to sustain the applied forces. The length and width of the plate should be such that the contour of the specimen is exceeded. 4 Test method A specified force shall be applied to the spec
39、imen at the point and in the direction(s) as specified in the detail specification. This force shall be steadily increased up to the specified value and, unless otherwise specified in the detail specification, maintained for 1 min. Unless otherwise specified in the detail specification, the force sh
40、all be parallel to the mounting plate. 5 Final measurements a) Visual examination (IEC 60512-1-1, test 1a). b) Applicable operational characteristics. NOTE if applicable, the detail specification may require a sealing test from the IEC60512-14 series or an ingress protection test according IEC 60529
41、. 60512-8-1 IEC:2010 5 6 Requirements There shall be no damage which would impair normal operation. 7 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) mounting of the specimen, including dimensions of the panel cut-out; b) t
42、ype of accessories, if required; c) value of the force, and the rate of increase; d) location, direction(s) and duration of the application of the force; e) shape of the fixture or tool used for applying the force; f) requirements for final measurements; g) any deviation from the standard test metho
43、d. _ 6 60512-8-1 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 8-1: Essais sous charge statique (embases) Essai 8a: Charge statique transversale AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organi
44、sation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI e
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