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1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description .pdf

1、 IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20 IEEE Std 1671.3-20

2、17 (Revision of IEEE Std 1671.3-2007) IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis of Electronic Systems of the IEEE Standards B

3、oard Approved 6 December 2017 IEEE-SA Standards Board 2 Abstract: An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard. Keywords: automatic test equi

4、pment (ATE), Automatic Test Markup Language (ATML), ATML Instance Document, automatic test system (ATS), IEEE 1671.3, unit under test (UUT), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrica

5、l and Electronics Engineers, Inc. All rights reserved. Published 13 April 2018. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material.

6、In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce,

7、 test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received fr

8、om users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing an

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11、Y, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. 4 Translations The IEEE consensus development process involves the

12、 review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board O

13、perations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE

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17、ept in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be subm

18、itted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance

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24、ocuments should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document to

25、gether with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do

26、 not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or

27、 errata, visit the IEEE Xplore at http:/ieeexplore.ieee.org/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be ac

28、cessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by pa

29、tent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is

30、listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that ar

31、e demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for condu

32、cting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expres

33、sly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. 6 Copyright 2018 IEEE. All rights reserved. Participants At the time this I

34、EEE standard was completed, the 1671.3 Working Group had the following membership: Ion A. Neag, Chair Malcom Brown Chris Gorringe Anand Jain Teresa Lopes Mukund Modi Leslie Orlidge Mike Seavey John Stabler Joseph Stanco Ronald Taylor The following members of the individual balloting committee voted

35、on this standard. Balloters may have voted for approval, disapproval, or abstention. W. Larry Adams Jr. Malcom Brown Juan Carreon Chris Gorringe Randall Groves Werner Hoelzl Bernard Homes Noriyuki Ikeuchi Anand Jain Teresa Lopes Mukund Modi Ion A. Neag Leslie Orlidge Mike Seavey Robert Spinner Josep

36、h Stanco Michael Stora Walter Struppler Marcy Stutzman Ronald Taylor Louis Ungar John Vergis Oren Yuen Daidi Zhong When the IEEE-SA Standards Board approved this standard on 6 December 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Cha

37、ir Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet

38、 Ulema Phil Wennblom Howard Wolfman Yu Yuan *Member Emeritus 7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1671.3-2017, IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description. This child, or “dot,” standard, also

39、 known as an ATML component standard, provides for the definition of the unit under test XML schemas, and contains references to XML instance document examples, both of which accompany this standard. The XML schemas defined by this standard provide for the identification and definition of a unit und

40、er test (UUT). Where appropriate, the XML schemas utilize and reference components of the ATML for Exchanging Automatic Test Equipment and Test Information via XML Standard (IEEE Std 1671) schema set. ATMLs XML schemas define the basic information required within any test application and provide a v

41、ehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment.

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