1、 IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20 IEEE Std 1671.3-20
2、17 (Revision of IEEE Std 1671.3-2007) IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis of Electronic Systems of the IEEE Standards B
3、oard Approved 6 December 2017 IEEE-SA Standards Board 2 Abstract: An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard. Keywords: automatic test equi
4、pment (ATE), Automatic Test Markup Language (ATML), ATML Instance Document, automatic test system (ATS), IEEE 1671.3, unit under test (UUT), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrica
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34、EEE standard was completed, the 1671.3 Working Group had the following membership: Ion A. Neag, Chair Malcom Brown Chris Gorringe Anand Jain Teresa Lopes Mukund Modi Leslie Orlidge Mike Seavey John Stabler Joseph Stanco Ronald Taylor The following members of the individual balloting committee voted
35、on this standard. Balloters may have voted for approval, disapproval, or abstention. W. Larry Adams Jr. Malcom Brown Juan Carreon Chris Gorringe Randall Groves Werner Hoelzl Bernard Homes Noriyuki Ikeuchi Anand Jain Teresa Lopes Mukund Modi Ion A. Neag Leslie Orlidge Mike Seavey Robert Spinner Josep
36、h Stanco Michael Stora Walter Struppler Marcy Stutzman Ronald Taylor Louis Ungar John Vergis Oren Yuen Daidi Zhong When the IEEE-SA Standards Board approved this standard on 6 December 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Cha
37、ir Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet
38、 Ulema Phil Wennblom Howard Wolfman Yu Yuan *Member Emeritus 7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1671.3-2017, IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description. This child, or “dot,” standard, also
39、 known as an ATML component standard, provides for the definition of the unit under test XML schemas, and contains references to XML instance document examples, both of which accompany this standard. The XML schemas defined by this standard provide for the identification and definition of a unit und
40、er test (UUT). Where appropriate, the XML schemas utilize and reference components of the ATML for Exchanging Automatic Test Equipment and Test Information via XML Standard (IEEE Std 1671) schema set. ATMLs XML schemas define the basic information required within any test application and provide a v
41、ehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment.
