IEEE C57.152-2013 - IEEE Guide for Diagnostic Field Testing of Fluid-Filled Power Transformers, Regulators, andReactors.pdf

1、 IEEE Guide for Diagnostic Field Testing of Fluid-Filled Power Transformers, Regulators, and Reactors Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C57.152-2013 (Revision of IEEE Std 62TM-1995) IEEE Std C57.152-2013 (Rev

2、ision of IEEE Std 62TM-1995) IEEE Guide for Diagnostic Field Testing of Fluid-Filled Power Transformers, Regulators, and Reactors Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 6 March 2013 IEEE-SA Standards Board Grateful acknowledgment is made to Doble Engineering Com

3、pany for permission to use source material. Abstract: Diagnostic tests and measurements that are performed in the field on fluid-filled power transformers and regulators are described. Whenever possible, shunt reactors are treated in a similar manner to transformers. Tests are presented systematical

4、ly in categories depending on the subsystem of the unit being examined. A diagnostic chart is included as an aid to identify the various subsystems. Additional information is provided regarding specialized test and measuring techniques. Interpretive discussions are also included in several areas to

5、provide additional insight on the particular test or to provide guidance on acceptance criteria. These discussions are based on the authors judgment of accepted practice. It should be noted that the results of several types of tests should be interpreted together to diagnose a problem. Manufacturers

6、 acceptance criteria should also be consulted as it may take precedence over the criteria in this guide. Keywords: bushing, core, diagnostic evaluation, field testing, fluid-filled transformer, IEEE C57.152, insulating liquid, off-line testing, reactor, regulator, safety, tank, tap changer, winding

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21、tion. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, the Diagnostic Field Testing Power Transformers and Reactors Working Group had the following membership: Jane Ann Verner, Chair Loren Wagenaar, Vice Chair Kipp Yule, Secretary Richard Amos Raj A

22、huja Jerry Allen William Bartley Wallace Binder Kent Brown Bill Chiu Larry Coffeen Jerry Cockran John Crouse Eric Davis Don Dorris Jefferson Foley Bruce Forsyth Mary Foster Ramon Garcia James Gardner Robert Ganser Sr. Prodipto Ghosh Jorge Gonzalez Jerry Harlan David Harris John Herron Gary Hoffman M

23、ike Horning Wayne Johnson Matthew Kennedy Joe Kelly C. J. Kalra Alexander Kraetge Michael Lau Mario Locarno Eberhard Lemke John Luksich Andre Lux John Matthews Susan McNelly Steve McGovern Vinay Mehrotra Michael Miller Paul Mushill Poorvi Patel Mark Perkins Donald Platts Lewis Powell Paulette Powell

24、 Tom Prevost John Progarr Mark Rivers Oleg Roizman Kirk Robbins Mark Roberts Hakan Sahin O. Paul Salvatto Daniel Sauer Craig Stiegemeier Jin Sim Charles Sweetser James Thompson Robert Thompson Dharma Vir Dieter Wagner Barry Ward Peter Werelius Jennifer Yu Peter Zhao Copyright 2013 IEEE. All rights r

25、eserved. viiThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael Adams Carlo Arpino Roberto Asano Peter Balma Martin Baur Barry Beaster W. J. Bill Bergman Steven Bezner Wallace Binder Thomas Bishop

26、 Thomas Blackburn W. Boettger Paul Boman Jeffrey Britton Bill Brown Kent Brown William Byrd Thomas Callsen Paul Cardinal Antonio Cardoso Juan Castellanos Stephen Conrad John Crouse William Darovny Alan Darwin Scott Digby Dieter Dohnal Gary Donner Randall Dotson Fred Elliott James Fairris Jorge Ferna

27、ndez Daher Rabiz Foda Joseph Foldi Bruce Forsyth Marcel Fortin Frank Gerleve David Gilmer Jalal Gohari James Graham William Griesacker Randall C. Groves Edward Gulski Bal Gupta John Harley J. Harlow David Harris Roger Hayes Martin Hinow Gary Hoffman Philip Hopkinson Charles Johnson Laszlo Kadar C. K

28、alra Gael Kennedy George Kennedy Mohamed Abdel Khalek Yuri Khersonsky Morteza Khodaie James Kinney Joseph L. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Jeffrey LaMarca Stephen Lambert Thomas La Rose Aleksandr Levin Mario Locarno Thomas Lundquist Greg Luri J. Dennis Marlow Lee Ma

29、tthews James McIver David McKinnon Susan McNelly Joseph Melanson Tom Melle Michael Miller T. David Mills Daniel Mulkey Jerry Murphy Ryan Musgrove Dennis Neitzel Michael S. Newman Joe Nims Lorraine Padden Bansi Patel Dhiru Patel J. Patton Brian Penny Christopher Petrola Donald Platts Alvaro Portillo

30、Lewis Powell Tom Prevost Moises Ramos Jean-Christophe Riboud Johannes Rickmann Michael Roberts Oleg Roizman John Rossetti James Rossman Marnie Roussell Thomas Rozek Dinesh Sankarakurup Daniel Sauer Bartien Sayogo Ewald Schweiger Devki Sharma Suresh Shrimavle Gil Shultz Hyeong Sim James Smith Jerry S

31、mith Steve Snyder Brian Sparling Gary Stoedter Michael Swearingen Charles Sweetser Ed teNyenhuis Malcolm Thaden Juan Thierry James Thompson Robert Thompson Eric Udren John Vergis Jane Ann Verner Loren Wagenaar David Wallach Barry Ward Peter Werelius Kenneth White John Wilson Jonathan Woodworth John

32、Yale Jian Yu Kipp Yule Luis Zambrano James Ziebarth Copyright 2013 IEEE. All rights reserved. viiiWhen the IEEE-SA Standards Board approved this guide on 6 March 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios,

33、 Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Su

34、therland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development