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本文(ANSI EIA 364-09C-1999 Durability Test Procedure for Electrical Connectors《电连接器的耐久性试验程序》.pdf)为本站会员(fatcommittee260)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ANSI EIA 364-09C-1999 Durability Test Procedure for Electrical Connectors《电连接器的耐久性试验程序》.pdf

1、EIA STANDARD ANSIIEIA-364-09C-1999 (R2006) Approved: April 23,1999 Reaffirmed: March 27,2006 TP-09C Durability Test Procedure for Electrical Connectors and Contacts EIA-3 64-09C (Revision of EIA-364-09B) JUNE 1999 ELECTRONIC INDUSTRIES ALLIANCE Electronic Components, Assemblies, Equipment securing o

2、f test fixture shaii not affect seif-agnment. Mer mounting, fbliy mate and unmate for the number of cycles specied in the referencing document. 4.2 Cycle rate Unless otherwise specied in the referencing document, the cycle rate per hour sha be: - Automatic equipment: 500 f 50 -Manual rnating/unmatin

3、g: 300 maximum - Automatic, Circular Connectors: 250 to 300 Copyright Electronic Components, Assemblies 8ect subsequent results. 4.5 Measurements 4.5.1 Mating and unmathg forces, contact resistance, shell resistance, insulation resistance, dielectric withstanding voltage, contact retention, and seal

4、ing tests are examples of measurements that may be made prior to, during or after testing and that would show the effects of durability. 4.5.2 The connectors or contacts shall be examined to determine the effects of durabiiity cycling that would include the following: 4.5.2.1 Wear on coupling device

5、 4.5.2.2 Loose or worn rivets; where applicable. 4.5.2.3 Uneven wear, galling, removal of plating on contacts and shells. 4.5.2.4 Free metal chips on face of inserts. 4.5.2.5 Displaced, bent or broken contacts. 4.5.2.6 Inability to properly mate and unmate. 4.5.2.7 Pierced resilient inserts and bro

6、ken or chipped hard dielectrics. 4.5.2.8 Mechanical operational characteristics, including effectiveness of keys and polarizing systems. Copyright Electronic Components, Assemblies visual examination 6.6 Operator name and date of test Copyright Electronic Components, Assemblies & Materials Associati

7、on Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA-364-09C Page 5 si& 2 -3 4 - 3.56t 03 (0.140+ 0.010) 31.75 (1.250) minimum - 3 c f 0.003 (O.Ooo1) 1.778 (0.0700 2.616 (0.1030) 3.429 (0.1350) 1s- Entire surface O. 1 micm S

8、tyle 06 10 (4 microindi) both sidcc u 9.55 (0.375) from cnd (m note 3) 953 (0375) 1.70 (O.OU) mdilBtyppcal 02.5 t 0.13 .OiOt 0.005) 034 (0.0135) typMI - C(seetc4) -c) A i 0.25 (0.010) 27.18 (1.070) 41.88 (1.649) 12 15 18 22 28 30 36 43 51.08 (2.011) 62.87 (2.475) 74.73 (2.942) 90.55 (3.565) 114.35 (

9、4.502) 122.22 (4.812) 120.57 (4.747) 171.98 (6.771) NOTES i Dimensions in parentheses are in inches. 2 Unless otherwise specied, tolerance is f O. 13 mm for two place metric 3 Only the working surfaces designated 4 shall be finished. 4 0.05 mm (0.002 in) TIR warpage permitted for full length of dime

10、nsion A 5 inch equivalents are based upon 25,4 mm = 1 .o0 in. dimensions and (0.005 in) for three place inch dimensions. Figure 1 - Test blade Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permit

11、ted without license from IHS-,-,-3%-3 64-09C Page A-1 Annex A A Normative A. 1 Acceptable criteria Acceptable criteria shall be established in terms of one, or any combination, of the following: A. 1.1 Totai mating and mating force. A. 1.2 Individual contact separation and engaging force. A. i .3 Ma

12、ximum allowable change in contact resistcuice. NOTE - Not applicable to gage cycled specimens. A. 1.4 Degrees and criticality of wear or component damage resulting fiom this and succeeding environmental exposure tests. Copyright Electronic Components, Assemblies & Materials Association Provided by I

13、HS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EU Document Improvement Proposal Signature: If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriat

14、e information below and mail or FAX to: Date: Electronic Industries Alliance Engineering Department - Publications Office 2500 Wilson Blvd. Arlington, VA 22201 FAX: (703) 907-7501 Document No. Submitters Name: Address: Document Title: Telephone No.: FAXNo.: e-mail: Urgency of Change: Immediate: 0 At

15、 next revision: 0 Problem Area: a. Clause Number and/or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Chairman: Date comments forwarded to Committee Chairman: Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under lice

16、nse with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright Elec

17、tronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Electronic Industries Alliance Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-

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