ImageVerifierCode 换一换
格式:PDF , 页数:47 ,大小:577.46KB ,
资源ID:435015      下载积分:5000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。 如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-435015.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(ANSI IEEE 1283-2013 Guide for Determining the Effects of High-Temperature Operation on Conductors Connectors and Accessories.pdf)为本站会员(Iclinic170)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

ANSI IEEE 1283-2013 Guide for Determining the Effects of High-Temperature Operation on Conductors Connectors and Accessories.pdf

1、 IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1283-2013(Revision of IEEE Std 1283-2004) IE

2、EE Std 1283-2013 (Revision of IEEE Std 1283-2004) IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories Sponsor Transmission and Distribution Committee of the IEEE Power and Energy Society Approved 23 August 2013 IEEE-SA Standards Board Abstr

3、act: Possible adverse impacts to an operating overhead transmission line which might occur when operating the line at high temperatures are discussed. Specifically, the transmission lines conductor, connectors, and attached accessories in terms of degradation in mechanical properties due to annealin

4、g elastic and in-elastic elongation, and accelerated aging are explored along with limited mitigation recommendations. Additionally, predictor equations for accelerated creep and conductor loss of strength are detailed in annexes with limited example calculations. Keywords: accelerated aging, accele

5、rated creep, annealing, conductor core, conductors, connectors, IEEE 1283 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 4 October 201

6、3. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2013 IEEE. All rights reserv

7、ed. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are respon

8、sible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the I

9、EEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adop

10、tion by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time

11、to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition

12、and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards developmen

13、t process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attentio

14、n is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder

15、 or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licens

16、es under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rights reserved. v Essential Patent Claims may exist for which

17、a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in conn

18、ection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own respo

19、nsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Conductors Working Group had the following membership: Jerry Reding, Chair Craig Pon, Vice Chair Neal Chapman L

20、en Custer Bruce Freimark Waymon Goch Tip Goodwin Joe Graziano Douglas Harms Mark Lancaster Joe Renowden Carl Tamm Bob Whapham The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Saleman A

21、libhay Gordon Baker Chris Brooks William Bush William Byrd James Chapman Robert Christman Larry Conrad Glenn Davidson Gary Donner Gary Engmann Dan Evans George Gela Waymon Goch Tip Goodwin Randall Groves Ajit Gwal Douglas Harms Jeffrey Helzer Lee Herron Werner Hoelzl Magdi Ishac Gael Kennedy Yuri Kh

22、ersonsky Robert Kluge Jim Kulchisky Saumen Kundu Chung-Yiu Lam Michael Lauxman Greg Luri Otto Lynch William McBride Jerry Murphy Neal Murray Arthur Neubauer Michael S. Newman Joe Nims Carl Orde Lorraine Padden Bansi Patel Robert Peters Douglas Proctor Iulian Profir Jerry Reding Keith Reese Michael R

23、oberts Stephen Rodick Charles Rogers Thomas Rozek Bartien Sayogo Dennis Schlender Gil Shultz Douglas Smith James Smith Jerry Smith Nagu Srinivas Ryan Stargel Gary Stoedter John Vergis Mark Walton Yingli Wen Kenneth White Larry Young Jian Yu Luis ZambranoWhen the IEEE-SA Standards Board approved this

24、 guide on 23 August 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpi

25、n Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Copyright 2013 IEEE. All rights reserved. vii Also included are the following non

26、voting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All rights reserved. vi

27、ii Introduction This introduction is not part of IEEE Std 1283-2013, IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories. The annexes are provided as either information or representative examples of some computational techniques in use toda

28、y within the industry; however, they are not the only accepted techniques available nor are they to be considered the recommended techniques by the Task Force under the Conductors Working Group preparing this guide. Other techniques can be found in the references, bibliography, and other sources whi

29、ch provide equally acceptable results. The reader is encouraged to investigate any and all techniques to determine which best suit anticipated applications. Copyright 2013 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 3 3. Definitions and ac

30、ronyms . 4 3.1 Definitions . 4 3.2 Acronyms 5 4. Conductors 5 4.1 Elevated temperature creep 5 4.2 Loss of strength and annealing 6 4.3 High-temperature effects on conductor core 7 4.4 High-temperature effects on sags and tensions 8 5. Connectors .11 5.1 Design of connectors 11 5.2 Connector high-te

31、mperature operation .11 5.3 Analysis of connector high-temperature operation .13 5.4 Mitigation of connector high-temperature operation 14 6. Conductor hardware 14 6.1 Metallic conductor hardware 15 6.2 Non-metallic conductor hardware 16 6.3 Insulators and connecting hardware .16 Annex A (informativ

32、e) Creep predictor equations for high-temperature operation 18 A.1 General .18 A.2 Definition of terms .18 A.3 Creep predictor equations 19 A.4 Temperature change value .21 A.5 Use of predictor equations .21 Annex B (informative) Example of calculating elevated temperature creep and its effect on co

33、nductor sag.23 B.1 General .23 B.2 Problem statement 23 B.3 Example calculation (metric) .23 B.4 Example calculation (English) .25 Annex C (informative) Residual conductor strength predictor equations for high-temperature operation27 C.1 General .27 C.2 Definition of terms .27 C.3 Residual conductor

34、 strength predictor equations .27 Annex D (informative) Bibliography 29 Copyright 2013 IEEE. All rights reserved. 1 IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure sa

35、fety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices

36、 and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and

37、 Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope The scope of this guide is to describe the effects and impacts of high temperature operation on conductors, connectors, and conduc

38、tor hardware. The guide will identify operating metrics which constitute elevated temperature operation based on present industry practices and its effects on overhead line components, and it will suggest potential mitigation options to manage or avoid identified adverse impacts. 1.2 Purpose The pur

39、pose of this guide is to provide general recommendations for consideration when evaluating existing overhead transmission lines or designing new overhead transmission lines which will be operated at high temperatures. Although this guide is intended for overhead transmission lines, most of the discu

40、ssion will also be applicable to distribution lines. Recently within the industry a number of new and novel conductors have been designed using non-traditional materials specifically designed for high-temperature operation. The collection of new and novel conductors is identified in the industry as

41、high IEEE Std 1283-2013 IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories Copyright 2013 IEEE. All rights reserved. 2 temperature low sag (HTLS) conductors. These new conductors are typically formulated with either standard aluminum stran

42、ds, fully annealed aluminum or aluminum alloys which resist annealing at 200 C or greater, exotic core materials which result in minimal sag changes with increasing conductor temperature, and extremely robust connectors. While the general concepts and cautions presented in this guide are appropriate

43、 for broad considerations when designing with the HTLS conductors, this guide does not specifically address the HTLS conductors as they are supported with other documents. Rather, this guide is limited to conventional conductors and connectors typically formulated with cold worked aluminum or copper

44、 with reinforcement achieved using steel galvanized or steel aluminum clad core strands. One notable exception is steel supported aluminum conductors (SSAC) developed in the late 1970s (Reynolds Metal) utilizing a galvanized steel core or aluminum-clad steel core and fully annealed aluminum strands.

45、 Modern versions of the SSAC conductor are referenced as aluminum conductors steel supported (ACSS) and typically carry a steel core of either misch metal or aluminum-clad steel core and fully annealed aluminum strands. The trend in most utilities today is to increase the capacity of their transmiss

46、ion lines wherever practical. It has become increasingly difficult to build new lines because of increased costs to obtain rights-of-way, public intervention, and state licensing requirements. These obstacles have significantly increased the cost and lead times required to place new lines into servi

47、ce. The lost revenue opportunities from power purchase/sale agreements with other systems because of limited transmission facilities can be substantial. Therefore, utilities are attempting to find as much capacity as is practical from the addition of new high-capacity lines or modifying existing lin

48、es for operation at higher temperatures than the existing facilities. In the past, utilities have typically been conservative in rating their lines due to the uncertainties in parameters which influence conductor temperature. Today, with a better understanding of actual ambient conditions and improv

49、ements in monitoring instruments and sophisticated analysis tools, utilities are rating lines at higher temperatures with the same or higher level of confidence than in the past. Many utilities have been increasing their transmission lines maximum conductor operating temperature as a way of increasing line capacity. Often higher operating temperatures are needed for only a few hours during the year. General concerns with increasing a conductors maximum operating temperature relate to accelerating the aging process of conductors, connectors, and conductor hardwar

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1