ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf

1、IEEE Std 522-2004(Revision ofIEEE Std 522-1992)IEEE Standards522TMIEEE Guide for Testing Turn Insulationof Form-Wound Stator Coils forAlternating-Current Electric Machines3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by theElectric Machinery CommitteeIEEE Standar

2、ds9 August 2004Print: SH95212PDF: SS95212Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restr

3、ictions apply. The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 9 August 2004. Printed in the United States of America.IEEE is a registered

4、 trademark in the U.S. Patent (2) coils in completely wound stators; (3) coilsand windings for rewinds of used machinery; and (4) windings of machines in service to determinetheir suitability for further service (preventive-maintenance testing). Coil service conditions, testdevices, and test sequenc

5、e are discussed. Keywords: ac machines, impulses, surges, testing turn insulation, transients Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. iiiCopyright 2009 IEEE. All rights reserved.This is an unapproved IEE

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23、n to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. Al

24、l rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 522-2004, IEEE Guide for Testing Turn Insulation of Form-Wound StatorCoils for Alternating-Current Electric Machines.)Many alternating-current, rotating electric machines are designed to have multiturn form-wound stator coi

25、ls.In these cases, the winding has two separate but interrelated insulating barriers: One between the various turns (turn insulation), and One between the turns and ground (ground insulation).Failure of either of these barriers will prematurely terminate the service life of the machine. A test level

26、 forthe ground insulation of twice-rated voltage plus 1 kV has been in existence for many years. This guide sug-gests methods and test levels for the turn insulation.Experience has shown that turn insulation failures can be precipitated by abnormal steep-front surges causedby factors such as lightni

27、ng strokes, faulty breaker closures, or the malfunction of various types of switchingdevices. However, turn insulation failures can also be caused by surges during normal breaker operationswhen the circuit conditions are such that the rise time of the surge at the machine terminals is less than a fe

28、wmicroseconds. A measure of protection from such surges may be provided by installation of devices such assurge capacitors at the machine terminals and surge arrestors, or by designing the coils with suitable turninsulation capability. When used for this purpose, capacitor ratings are usually chosen

29、 to extend the rise timeof voltage surges to 5 s or longer.The bibliography (Annex C) contains references that discuss the general surge environment and surgestrength of electric machines.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http

30、:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibilit

31、y that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or p

32、atent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from

33、IEEE Xplore. Restrictions apply. iv Copyright 2004 IEEE. All rights reserved.ParticipantsAt the time this standard was completed, the working group had the following membership: Chuck Wilson,ChairDarrell Howell,Secretary*We all wish to express our sorrow that Tom Kluk passed away before this standar

34、d was published. Hisinput to this document was very valuable and much appreciated by everyone on the working group.The following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. Dana ArndtSaber AziziRay BartnikasK

35、evin BeckerStefano BombenSudhakar CherukupalliDouglas ConleyJim DymondMark FengerShawn FillibenPaul GabersonGeorge GaoNirmal GhaiBal Gupta Guy HalldorsonGary HeustonJeff HudsonPatricia IrwinAleksandra JeremicTom Kluk*Lou LittleBill McDermid Hal MillerGlenn MottersheadBeant NindraJim OliverLori RuxHo

36、ward SeddingGreg StoneMeredith StrangesJames TimperleyErnesto WiedenbrugJoe WilliamsJohn WilsonKarim Younsi Karl BergerThomas BishopWeijen ChenTommy CooperGuru Dutt DhingraRoger DaughertyByron DavenportGary DonnerJames DymondAmir El-SheikhGary EngmannJorge Fernandez-DaherTrilok GargNirmal GhaiBrian

37、GottRandall GrovesBal GuptaPaul HamerEdward Horgan Jr.David JacksonKevin LovingJesus MartinezWalter MartinyThomas McCaffreyWilliam McDermidDonald McLarenNigel McQuinJames MichalecKrste NajdenkoskiNils NilssonAlvaro PortilloJohannes RickmannManoj ShahGregory StoneMeredith StrangesErnesto WiedenbrugCh

38、uck WilsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. vWhen the IEEE-SA Standards Board approved this standard on 9 February 2004, it had the followingmembership:Don

39、 Wright,Chair*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookson, NIST RepresentativeDon MessinaIEEE Standards Project EditorChuck AdamsH. Stephen BergerMark D. BowmanJoseph

40、A. BruderBob DavisRoberto de BoissonJulian Forster*Judith GormanArnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMa

41、lcolm V. ThadenDoug ToppingJoe D. WatsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. vi Copyright 2004 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 12. References 13. Service conditi

42、ons 23.1 Operating stress 23.2 Transient stress. 23.3 Withstand requirements . 24. Suggested test devices 34.1 Test requirements. 34.2 Suitable devices . 34.2.1 Conduction-type devices 34.2.2 Induction-type devices.35. Test procedure 35.1 Test sequences . 35.2 Test conditions. 45.3 Voltage levels. 4

43、6. Surge test levels for new coils . 46.1 General. 46.2 Standard (3.5 p.u.) withstand envelope 56.3 Alternate withstand envelope. 66.4 Definition of surge envelopes 66.5 Abnormal surges 66.6 Precautions. 66.7 Reduction in test levels for uncured coils 77. Maintenance tests or tests after installatio

44、n of machines.77.1 Test voltage level . 77.2 Conduction-type devices 77.3 Induction-type devices. 77.4 Insufficient coupling 77.5 Other methods/further details 7Annex A (informative) Test procedures and methods. 8Annex B (informative) Sample test form. 13Annex C (informative) Bibliography. 15Authori

45、zed licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. 1IEEE Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines1. Overview1.1 Scope

46、This guide makes suggestions for testing the dielectric strength of the insulation separating the various turnsfrom each other within multiturn form-wound coils to determine the acceptability of the coils. Typical rat-ings of machines employing such coils normally lie within the range of 200 kW to 1

47、00 MW (270 to 135 000hp). Test voltage levels described herein do not evaluate the ability of the turn insulation to withstandabnormal voltage surges, as contrasted to surges associated with normal operation. The repetitive voltagesurges (spikes) associated with adjustable frequency drives (AFD) are

48、 also not addressed here. This guideapplies to a) Individual stator coils after manufacture.b) Coils in completely wound stators of original manufacture.c) Coils and windings for rewinds of used machinery.d) Windings of machines in service to determine their suitability for further service (preventi

49、ve-maintenance testing).1.2 PurposeThe purpose of this guide is toa) Define surge/impulse testing as applied to the windings of an electric machine.b) Review the service conditions that affect voltage levels in a coil.c) Recommend devices suitable for measuring surges, with precautions to avoid erroneous results.d) Describe various points where surge testing may be performed. e) Present suggested surge test levels for various types of electric machines.2. ReferencesASTM D1711-02, Standard Terminology Relating to Electrical Insulation.11ASTM publications are available from the