ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf

上传人:ideacase155 文档编号:435146 上传时间:2018-11-11 格式:PDF 页数:26 大小:214.39KB
下载 相关 举报
ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf_第1页
第1页 / 共26页
ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf_第2页
第2页 / 共26页
ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf_第3页
第3页 / 共26页
ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf_第4页
第4页 / 共26页
ANSI IEEE 522-2004 Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines《交流旋转电机用模绕定子线圈的匝间绝缘试验指南》.pdf_第5页
第5页 / 共26页
点击查看更多>>
资源描述

1、IEEE Std 522-2004(Revision ofIEEE Std 522-1992)IEEE Standards522TMIEEE Guide for Testing Turn Insulationof Form-Wound Stator Coils forAlternating-Current Electric Machines3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by theElectric Machinery CommitteeIEEE Standar

2、ds9 August 2004Print: SH95212PDF: SS95212Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restr

3、ictions apply. The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 9 August 2004. Printed in the United States of America.IEEE is a registered

4、 trademark in the U.S. Patent (2) coils in completely wound stators; (3) coilsand windings for rewinds of used machinery; and (4) windings of machines in service to determinetheir suitability for further service (preventive-maintenance testing). Coil service conditions, testdevices, and test sequenc

5、e are discussed. Keywords: ac machines, impulses, surges, testing turn insulation, transients Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. iiiCopyright 2009 IEEE. All rights reserved.This is an unapproved IEE

6、E Standards draft, subject to change.IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of theIEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensusdevelopment process, approved by the American

7、 National Standards Institute, which brings together volunteersrepresenting varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of theInstitute and serve without compensation. While the IEEE administers the process and establishes rules to promote fai

8、rnessin the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of theinformation or the soundness of any judgments contained in its standards.Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, p

9、roperty or otherdamage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resultingfrom the publication, use of, or reliance upon this, or any other IEEE Standard document.The IEEE does not warrant or represent the accuracy or content of the

10、material contained herein, and expressly disclaimsany express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or thatthe use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “AS IS.”The

11、existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market,or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to change

12、brought about through developments in the state of the art andcomments received from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation, or every ten years for stabilization. When a document is more than five years old and has not

13、 beenreaffirmed, or more than ten years old and has not been stabilized, it is reasonable to conclude that its contents, although stillof some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE Standard.In

14、 publishing and making this document available, the IEEE is not suggesting or rendering professional or other servicesfor, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person orentity to another. Any person utilizing this, and any other IEE

15、E Standards document, should rely upon the advice of acompetent professional in determining the exercise of reasonable care in any given circumstances.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specificapplications. When the nee

16、d for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepareappropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that anyinterpretation has also received the concurrence of a balance of interes

17、ts. For this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to provide an instant response to interpretation requests exceptin those cases where the matter has previously received formal consideration. A statement, written or oral, that is notprocesse

18、d in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered the official positionof IEEE or any of its committees and shall not be considered to be, nor be relied upon as, a formal interpretation of the IEEE.At lectures, symposia, seminars, or educational courses, an i

19、ndividual presenting information on IEEE standards shall makeit clear that his or her views should be considered the personal views of that individual rather than the formal position,explanation, or interpretation of the IEEE. Comments for revision of IEEE Standards are welcome from any interested p

20、arty, regardless of membership affiliation withIEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriatesupporting comments. Recommendations to change the status of a stabilized standard should include a rationale as to why arevision or

21、withdrawal is required. Comments and recommendations on standards, and requests for interpretations should beaddressed to:Secretary, IEEE-SA Standards Board445 Hoes LanePiscataway, NJ 08854USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by th

22、e Institute ofElectrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. Toarrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive,Danvers, MA 01923 USA; +1 978 750 8400. Permissio

23、n to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. Al

24、l rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 522-2004, IEEE Guide for Testing Turn Insulation of Form-Wound StatorCoils for Alternating-Current Electric Machines.)Many alternating-current, rotating electric machines are designed to have multiturn form-wound stator coi

25、ls.In these cases, the winding has two separate but interrelated insulating barriers: One between the various turns (turn insulation), and One between the turns and ground (ground insulation).Failure of either of these barriers will prematurely terminate the service life of the machine. A test level

26、 forthe ground insulation of twice-rated voltage plus 1 kV has been in existence for many years. This guide sug-gests methods and test levels for the turn insulation.Experience has shown that turn insulation failures can be precipitated by abnormal steep-front surges causedby factors such as lightni

27、ng strokes, faulty breaker closures, or the malfunction of various types of switchingdevices. However, turn insulation failures can also be caused by surges during normal breaker operationswhen the circuit conditions are such that the rise time of the surge at the machine terminals is less than a fe

28、wmicroseconds. A measure of protection from such surges may be provided by installation of devices such assurge capacitors at the machine terminals and surge arrestors, or by designing the coils with suitable turninsulation capability. When used for this purpose, capacitor ratings are usually chosen

29、 to extend the rise timeof voltage surges to 5 s or longer.The bibliography (Annex C) contains references that discuss the general surge environment and surgestrength of electric machines.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http

30、:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibilit

31、y that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or p

32、atent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from

33、IEEE Xplore. Restrictions apply. iv Copyright 2004 IEEE. All rights reserved.ParticipantsAt the time this standard was completed, the working group had the following membership: Chuck Wilson,ChairDarrell Howell,Secretary*We all wish to express our sorrow that Tom Kluk passed away before this standar

34、d was published. Hisinput to this document was very valuable and much appreciated by everyone on the working group.The following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. Dana ArndtSaber AziziRay BartnikasK

35、evin BeckerStefano BombenSudhakar CherukupalliDouglas ConleyJim DymondMark FengerShawn FillibenPaul GabersonGeorge GaoNirmal GhaiBal Gupta Guy HalldorsonGary HeustonJeff HudsonPatricia IrwinAleksandra JeremicTom Kluk*Lou LittleBill McDermid Hal MillerGlenn MottersheadBeant NindraJim OliverLori RuxHo

36、ward SeddingGreg StoneMeredith StrangesJames TimperleyErnesto WiedenbrugJoe WilliamsJohn WilsonKarim Younsi Karl BergerThomas BishopWeijen ChenTommy CooperGuru Dutt DhingraRoger DaughertyByron DavenportGary DonnerJames DymondAmir El-SheikhGary EngmannJorge Fernandez-DaherTrilok GargNirmal GhaiBrian

37、GottRandall GrovesBal GuptaPaul HamerEdward Horgan Jr.David JacksonKevin LovingJesus MartinezWalter MartinyThomas McCaffreyWilliam McDermidDonald McLarenNigel McQuinJames MichalecKrste NajdenkoskiNils NilssonAlvaro PortilloJohannes RickmannManoj ShahGregory StoneMeredith StrangesErnesto WiedenbrugCh

38、uck WilsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. vWhen the IEEE-SA Standards Board approved this standard on 9 February 2004, it had the followingmembership:Don

39、 Wright,Chair*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookson, NIST RepresentativeDon MessinaIEEE Standards Project EditorChuck AdamsH. Stephen BergerMark D. BowmanJoseph

40、A. BruderBob DavisRoberto de BoissonJulian Forster*Judith GormanArnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMa

41、lcolm V. ThadenDoug ToppingJoe D. WatsonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. vi Copyright 2004 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 12. References 13. Service conditi

42、ons 23.1 Operating stress 23.2 Transient stress. 23.3 Withstand requirements . 24. Suggested test devices 34.1 Test requirements. 34.2 Suitable devices . 34.2.1 Conduction-type devices 34.2.2 Induction-type devices.35. Test procedure 35.1 Test sequences . 35.2 Test conditions. 45.3 Voltage levels. 4

43、6. Surge test levels for new coils . 46.1 General. 46.2 Standard (3.5 p.u.) withstand envelope 56.3 Alternate withstand envelope. 66.4 Definition of surge envelopes 66.5 Abnormal surges 66.6 Precautions. 66.7 Reduction in test levels for uncured coils 77. Maintenance tests or tests after installatio

44、n of machines.77.1 Test voltage level . 77.2 Conduction-type devices 77.3 Induction-type devices. 77.4 Insufficient coupling 77.5 Other methods/further details 7Annex A (informative) Test procedures and methods. 8Annex B (informative) Sample test form. 13Annex C (informative) Bibliography. 15Authori

45、zed licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 4, 2010 at 13:28 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved. 1IEEE Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines1. Overview1.1 Scope

46、This guide makes suggestions for testing the dielectric strength of the insulation separating the various turnsfrom each other within multiturn form-wound coils to determine the acceptability of the coils. Typical rat-ings of machines employing such coils normally lie within the range of 200 kW to 1

47、00 MW (270 to 135 000hp). Test voltage levels described herein do not evaluate the ability of the turn insulation to withstandabnormal voltage surges, as contrasted to surges associated with normal operation. The repetitive voltagesurges (spikes) associated with adjustable frequency drives (AFD) are

48、 also not addressed here. This guideapplies to a) Individual stator coils after manufacture.b) Coils in completely wound stators of original manufacture.c) Coils and windings for rewinds of used machinery.d) Windings of machines in service to determine their suitability for further service (preventi

49、ve-maintenance testing).1.2 PurposeThe purpose of this guide is toa) Define surge/impulse testing as applied to the windings of an electric machine.b) Review the service conditions that affect voltage levels in a coil.c) Recommend devices suitable for measuring surges, with precautions to avoid erroneous results.d) Describe various points where surge testing may be performed. e) Present suggested surge test levels for various types of electric machines.2. ReferencesASTM D1711-02, Standard Terminology Relating to Electrical Insulation.11ASTM publications are available from the

展开阅读全文
相关资源
  • ANSI Z97 1-2009 American National Standard for Safety Glazing Materials used in Buildings - Safety Performance Specifications and Methods of Test《建筑物中窗用玻璃材料安全性用.pdfANSI Z97 1-2009 American National Standard for Safety Glazing Materials used in Buildings - Safety Performance Specifications and Methods of Test《建筑物中窗用玻璃材料安全性用.pdf
  • ANSI Z97 1 ERTA-2010 Re ANSI Z97 1 - 2009 Errata《修订版 美国国家标准学会Z97 1-2009标准的勘误表》.pdfANSI Z97 1 ERTA-2010 Re ANSI Z97 1 - 2009 Errata《修订版 美国国家标准学会Z97 1-2009标准的勘误表》.pdf
  • ANSI Z21 40 2a-1997 Gas-Fired Work Activated Air-Conditioning and Heat Pump Appliances (Same as CGA 2 92a)《燃气、工作激活空气调节和热泵器具(同 CGA 2 92a)》.pdfANSI Z21 40 2a-1997 Gas-Fired Work Activated Air-Conditioning and Heat Pump Appliances (Same as CGA 2 92a)《燃气、工作激活空气调节和热泵器具(同 CGA 2 92a)》.pdf
  • ANSI Z124 9-2004 American National Standard for Plastic Urinal Fixtures《塑料小便器用美国国家标准》.pdfANSI Z124 9-2004 American National Standard for Plastic Urinal Fixtures《塑料小便器用美国国家标准》.pdf
  • ANSI Z124 4-2006 American National Standard for Plastic Water Closet Bowls and Tanks《塑料抽水马桶和水箱用美国国家标准》.pdfANSI Z124 4-2006 American National Standard for Plastic Water Closet Bowls and Tanks《塑料抽水马桶和水箱用美国国家标准》.pdf
  • ANSI Z124 3-2005 American National Standard for Plastic Lavatories《塑料洗脸盆用美国国家标准》.pdfANSI Z124 3-2005 American National Standard for Plastic Lavatories《塑料洗脸盆用美国国家标准》.pdf
  • ANSI T1 659-1996 Telecommunications - Mobility Management Application Protocol (MMAP) RCF-RACF Operations《电信 可移动管理应用协议(MMAP) RCF-RACF操作》.pdfANSI T1 659-1996 Telecommunications - Mobility Management Application Protocol (MMAP) RCF-RACF Operations《电信 可移动管理应用协议(MMAP) RCF-RACF操作》.pdf
  • ANSI T1 651-1996 Telecommunications – Mobility Management Application Protocol (MMAP)《电信 可移动性管理应用协议》.pdfANSI T1 651-1996 Telecommunications – Mobility Management Application Protocol (MMAP)《电信 可移动性管理应用协议》.pdf
  • ANSI T1 609-1999 Interworking between the ISDN User-Network Interface Protocol and the Signalling System Number 7 ISDN User Part《电信 ISDN用户间网络接口协议和7号信令系统ISDN用户部分.pdfANSI T1 609-1999 Interworking between the ISDN User-Network Interface Protocol and the Signalling System Number 7 ISDN User Part《电信 ISDN用户间网络接口协议和7号信令系统ISDN用户部分.pdf
  • ANSI T1 605-1991 Integrated Services Digital Network (ISDN) - Basic Access Interface for S and T Reference Points (Layer 1 Specification)《综合服务数字网络(ISDN) S和T基准点的.pdfANSI T1 605-1991 Integrated Services Digital Network (ISDN) - Basic Access Interface for S and T Reference Points (Layer 1 Specification)《综合服务数字网络(ISDN) S和T基准点的.pdf
  • 猜你喜欢
    相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > ANSI

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1