1、 Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United State
2、s of AmericaISBN 0-7381-No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std C57.18.10-1998(R2003)(Revision and redesignation ofANSI/IEEE C57.18-1964)IEEE Standard Practices and Requi
3、rements for Semiconductor Power Rectifier TransformersSponsorTransformers Committeeof theIEEE Power Engineering SocietyApproved 4 February 1999American National Standards InstituteApproved 19 March 1998IEEE-SA Standards BoardAbstract: Practices and requirements for semiconductor power rectifier tran
4、sformers for dedicatedloads rated single-phase 300 kW and above and three-phase 500 kW and above are included.Static precipitators, high-voltage converters for dc power transmission, and other nonlinear loadsare excluded. Service conditions, both usual and unusual, are specified, or other standards
5、arereferenced as appropriate. Routine tests are specified. An informative annex provides severalexamples of load loss calculations for transformers when subjected to nonsinusoidal currents,based on calculations provided in the standard.Keywords: eddy current losses, harmonic load losses, single-phas
6、e transformers, three-phasetransformers, three-winding transformers, transformer load losses, two-winding transformersIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the
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17、ered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquir
18、ies intothe legal validity or scope of those patents that are brought to its attention.Copyright 1998 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std C57.18.10-1998, IEEE Standard Practices and Requirements for Semiconduc-tor Power Rectifier Transformers.)Early ed
19、itions of ANSI C57.18 were written for transformers used with pool cathode mercury arc rectifiers.The last revision date for ANSI C57.18 was 1964. That standard did not reflect the practices that have devel-oped with the use of semiconductor rectifying or converting devices, nor did it reflect the l
20、atest transformertechnology. As a result, much of it is inconsistent with current practices and with other related standards,such as ANSI C34.2*, that deal with semiconductor converters. This new standard is the result of the deci-sion to write a new rectifier transformer standard instead of revisin
21、g the old standard. Suggestions forimprovement of these practices will be welcomed.Basic impulse level (BIL) ratings for windings connected to converters are not specified by this standard.There are many practical reasons why windings connected to converters need not have a BIL test or rating.These
22、windings are often high-current, low-voltage windings that will not produce ANSI standard wave-forms when tested. Interleaved windings cannot be impulse tested easily. Usually the converter and thetransformer are close coupled in a throat connection and not subject to lightning strikes. The converte
23、r usu-ally cannot withstand normal transformer BIL ratings for the winding voltages to which they are connected.These conditions arent always true, however. If a user wishes to have a BIL rating or test, this may bearranged through commercial negotiations and technical specifications that may overri
24、de this standard. Thisshould also be acknowledged by the transformer manufacturer during the bidding process.Hottest-spot winding temperatures are referred to in this standard. These are not tested values. Hottest-spottemperatures cannot be measured from a practical standpoint on production units. T
25、herefore, average wind-ing temperatures plus a hottest-spot increment may be used. There is continuing work in other standardsgroups on this matter. The methods of rating the transformer kVA and currents in previous editions of ANSI C57.18 were based onthe rms equivalent of a rectangular current wav
26、e shape based on the dc rated load commutated with zerocommutating angle. This is the rms kVA and current method. All of the tables in Clause 10 are based on thistraditional method. A new approach is to base the transformer kVA and currents on the rms value of the fun-damental current and kVA. This
27、is the fundamental kVA and current method. The fundamental kVA methodis in use in IEC standards. This approach needs to be reflected in ANSI C34.2 and ANSI C34.3 as well as inthis standard. The traditional tables are retained in Clause 10 to maintain its method. Both kVA values willbe shown on the n
28、ameplate to accommodate either method. Specifying engineers should clearly definewhether they are specifying the traditional rms kVA or the fundamental kVA so as to avoid confusion. RMSkVA is beneficial to users who utilize their primary metering on the transformer to monitor load. The funda-mental
29、kVA is related directly to the real power used by the rectifier or convertor. The rms kVA can be deter-mined when the fundamental kVA is given along with the harmonic spectrum for the load. The specifyingengineer is always obligated to supply the harmonic spectrum in order to properly rate and desig
30、n the trans-former. The specifying engineer has overall system responsibility; definition of the harmonic spectrum is notthe transformer manufacturers responsibility. The difference between the two methods should result in onlya small percentage error in kVA sizing, but in some cases it may be deter
31、mined to be critical. Future coordi-nation with ANSI C34.2 and ANSI C34.3 working groups should give a final direction with regard to kVArating method.Two cautionary notes are in order regarding testing. First, errors may result when measuring losses on transformers with low power factors. Care must
32、 be exer-cised in making the loss measurements for rectifier transformers with high reactance and low losses. Test tol-*A new working group has been formed to revise ANSI C34.2.ivCopyright 1998 IEEE. All rights reserved.erances should be held to 3% throughout the ranges of reactance and losses so as
33、 to accurately measure straylosses for the harmonic calculations. There is ongoing work on this subject within the Loss MeasurementWorking Group of the Performance Characteristics Subcommittee. Second, other errors regarding resistance readings for losses or temperature rise tests are possible on lo
34、w-voltage, high-current windings having very low resistance, often with bolted joints. Connection losses mayalter normal resistance measurements. Work on this topic should be undertaken in the future. The exact methodology for temperature rise testing using service losses enhanced with harmonics nee
35、ds tobe more fully developed. After this standard has been in use, it is expected that manufacturers and users willdevelop more detailed preferred methods. Experience will also provide insight as to whether there are anyserious shortcomings in these methods. It is hoped that they will be found to be
36、 safely conservative. It isbelieved that some development time is necessary with the new approach before exact methods are pre-scribed.Work should be done on future revisions to this standard to develop more detailed methods of interphasetransformer loss testing. More precise methods for determining
37、 losses for commercial guarantee purposes,as well as thermal and magnetic capability, are needed. These were not attempted in this standard revisiondue to lack of time. This standard was developed by a Working Group of the Subcommittee on Performance Characteristics ofthe IEEE Transformer Committee.
38、 The Working Group had the following membership: Sheldon P. Kennedy,ChairRajendra AhujaJohn ArmstrongKal AtoutJacques AubinRoy A. BancroftAlfons BimbrisJerry L. CorkranJohn CrouseJohn A. EbertJoseph Foldi Jerry FrankJohn GraceRoger HayesPhilip J. HopkinsonMike H. ImanCharles W. JohnsonAnthony J. Jon
39、nattiEd KalksteinEric KauffmanLawrence A. KirchnerA. D. KlineAllan LudbrookRick Marek Michael J. MitelmanGlenn MorrisseyB. K. PatelDhiru S. PatelCharlie PoundsGuy PregentJeewan PuriSubhas SarkarIbrahim ShteyhAnthony J. SiebertHyeong Jin Sim Kenneth R. SkingerVis ThenappanRobert A. Veitch Kenneth Zie
40、mannCopyright 1998 IEEE. All rights reserved.vThe following persons were on the balloting committee:When the IEEE-SA Standards Board approved this standard on 19 March 1998, it had the followingmembership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudith Gorman,SecretaryMember EmeritusKris
41、tin M. DittmannIEEE Standards Project EditorR. K. AhujaGeorge AllenJim AntweilerJ. ArteagaRoy A. BancroftE. BetancourtWallace B. BinderJoe V. BonucchiMax A. CambreDon ChuPeter W. ClarkeJerry L. CorkranRobert C. DegeneffDieter DohnalJ. C. DuartJohn A. EbertGary R. EngmannD. J. FallonJoseph FoldiMicha
42、el A. FranchekJuergen GerthSaurabh GhoshRichard D. GrahamRobert L. GrubbRobert L. GrunertMichael E. HaasPatrick HananErnst HaniqueN. Wayne HansenR. R. HayesPeter J. HoeflerT. L. HoldwayPhilip J. HopkinsonRichard HuberA. F. HuestonJohn S. HurstCharles W. JohnsonAnthony J. JonnattiLars-Erik JuhlinShel
43、don P. KennedyL. KogaBarin KumarJohn G. LackeyLarry A. LowdermilkJoe D. MacDonaldWilliam A. MaguireK. T. MassoudaJohn W. MatthewsL. Bruce McClungJack W. McGillNigel P. McQuinC. Patrick McShaneDaleep C. MohlaChuck R. MurrayWilliam H. Mutschler, Jr.Gerald A. PaivaB. K. PatelDhiru S. PatelPaulette A. P
44、ayneCarlos PeixotoDan D. PercoMark D. PerkinsLinden W. PierceGeorge J. ReitterJ. C. RiboudHazairin SamaulahLeo J. SavioWilliam E. SaxonWes W. SchwartzPat ScullyAnthony J. SiebertMark SiehlingHyeong Jin SimKenneth R. SkingerJ. Ed SmithJames E. SmithRonald J. StaharaJames E. StephensPeter G. StewartRo
45、n W. StonerJohn C. SullivanVis ThenappanJames A. ThompsonThomas P. TraubEdger R. TrummerJohn VandermaarRobert A. VeitchLoren B. WagenaarBarry H. WardRichard F. WeddletonWilliam G. WimmerSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay ForsterThomas F. GarrityRuben D.
46、GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. “Al” KienerJoseph L. KoepfingerStephen R. LambertJim LogothetisDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. ZipseviCopyright 1998 IEE
47、E. All rights reserved.Copyright 1998 IEEE. All rights reserved.viiContents1. Overview 11.1 Scope 11.2 Mandatory requirements 12. References 13. Definitions 24. Symbols . 35. Service conditions 45.1 Usual service conditions 45.2 Unusual service conditions 46. Rating data . 56.1 Taps on rectifier tra
48、nsformers 66.2 Cooling classes of transformers. 66.3 Frequency. 66.4 Phases. 66.5 Rated kVA . 66.6 Compensation on rectifier transformers.66.7 Rated current 76.8 Connections 76.9 Polarity, angular displacement, and lead markings . 76.10 Impedance 86.11 Losses. 86.12 Temperature rise and insulation s
49、ystem capability 86.13 Nameplates. 87. Construction. 117.1 Mounting and location . 117.2 Tanks 117.3 Method of coolant preservation . 117.4 Grounding 117.5 Connections for shipping . 117.6 Accessories 118. Testing and calculations. 128.1 Routine tests. 128.2 Symbols used in tests. 138.3 Resistance measurement 138.4 Dielectric tests 138.5 Excitation losses. 138.6 Load losses. 138.7 Losses in interphase transformers 198.8 Impedance tests 19viiiCopyright 1998 IEEE. All rights reserved.8.9 Ratio tests. 208.10 Temperature rise test 208.11 Short-circuit tests . 228.12 Polarity an
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