BS EN 60749-2-2002 Semiconductor devices - Mechanical and climatic test methods - Low air pressure《半导体装置 机械和气候试验方法 低气压》.pdf

1、BRITISH STANDARD BS EN 60749-2:2002 Semiconductor devices Mechanical and climatic test methods Part 2: Low air pressure The European Standard EN 60749-2:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-2:2002 This British Standard, having been prepared under the direction of the E

2、lectrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 24 September 2002 BSI 24 September 2002 ISBN 0 580 40397 1 National foreword This British Standard is the official English language version of EN 60749-2:2002. It

3、 is identical with IEC 60749-2:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its

4、 secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic

5、Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to underst

6、and the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises

7、a front cover, an inside front cover, the EN title page, pages 2 to 7 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-2 NORME EUROPENNE EUROPISCHE NOR

8、M August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any m

9、eans reserved worldwide for CENELEC members. Ref. No. EN 60749-2:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconductor devices - Mechanical and climatic test methods Part 2: Low air pressure (IEC 60749-2:2002) Dispositifs semiconducteurs - Mthodes des

10、sais mcaniques et climatiques Partie 2: Basse pression atmosphrique (CEI 60749-2:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 2: Niedriger Luftdruck (IEC 60749-2:2002) This European Standard was approved by CENELEC on 2002-07-02. CENELEC members are bound to comply wit

11、h the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretari

12、at or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the o

13、fficial versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.E

14、N 64709-:20022 - 2 Foreword The text of document 47/1601/FDIS, future edition 1 of IEC 60749-2, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-2 on 2002-07-02. This mechanical and climatic test method, as it relate

15、s to low air pressure, is a complete rewrite of the test contained in clause 3, chapter 3 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2003-04-01 latest d

16、ate by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Stand

17、ard IEC 60749-2:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN607492:2002067-942 EI:C0022 3 INTRODUCTION The barometric-pressure test is performed under conditions simulating the low atmospheric pressure encountered in the non-pressurized portions of aircraf

18、t and other vehicles in high- altitude flight. Even when low pressures do not produce complete electrical breakdown, corona and its undesirable effects, including losses and ionization, are intensified. The simulated high-altitude conditions of this test can also be employed to investigate the influ

19、ence on component operating characteristics, of other effects of reduced pressure, including changes in dielectric constants of materials, and decreased ability of thinner air to transfer heat away from heat-producing components. Page3 EN607492:2002067-942 EI:C0022 4 SEMICONDUCTOR DEVICES MECHANICAL

20、 AND CLIMATIC TEST METHODS Part 2: Low air pressure 1 Scope This part of IEC 60749 covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectr

21、ic strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-rel

22、ated applications only. In general, this test of low air pressure is in conformity with IEC 60068-2-13 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following referenced documents are indispensable for the application of this docu

23、ment. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-13, Environmental testing Part 2: Tests Test M: Low air pressure 3 Test apparatus The apparatus used for the barometric-pr

24、essure test shall consist of a vacuum pump and a suitable sealed chamber having means for visual observation of the specimen under test when necessary, a suitable pressure indicator to measure the simulated altitude in metres in the sealed chamber, and a microammeter or oscilloscope capable of detec

25、ting current over the range from d.c. to 30 MHz. 4 Procedure The specimens shall be mounted in the test chamber and the pressure reduced to the value indicated in one of the test conditions specified in table 1. While the specimens are maintained at the specified pressure, they shall be subjected to

26、 the appropriate tests. During this test and for a period of 20 min before, the test temperature shall be 25 C 10 C. The device shall have the specified voltage applied and shall be monitored over the range from atmospheric pressure to the specified minimum pressure and return for any device malfunc

27、tions. Page4 EN607492:2002067-942 EI:C0022 5 Table 1 Test conditions of air pressure corresponding to altitude Test condition Maximum pressure Pa Altitude m A 59 000 4 500 B 30 000 9 000 C 12 000 15 000 D 4 400 21 000 E 1 000 30 000 F 150 45 000 G 3,2 10 4 200 000 4.1 Test measurement The device sha

28、ll be connected for measurement and have the specified voltages applied during the entire pump-down cycle. The terminals to which the maximum voltage (see 5c) is applied shall be monitored with a microammeter or oscilloscope for corona currents in the range from d.c. to 30 MHz. Provision shall be ma

29、de for calibrating the current flow in the test circuit minus the device under the applicable test condition to ensure that test readings are characteristic of the device under test. 4.2 Post-exposure treatment At the end of the test period, the specimen shall be removed from the test chamber and ma

30、intained under standard atmospheric conditions for between 2 h and 24 h. Where ice or water particles adhere to the specimen, they shall be removed beforehand. 4.3 Failure criteria A device shall be defined as a failure if parametric limits are exceeded or if functionality cannot be demonstrated und

31、er the conditions specified in the relevant specification. A device which exhibits arc-overs, harmful coronas, or any other defect or deterioration which may interfere with the operation of the device, shall be considered a failure. Page5 EN607492:2002067-942 EI:C0022 6 5 Summary The following detai

32、ls shall be specified in the applicable procurement document. a) Method of mounting (see clause 4). b) Test condition (see clause 4). Unless otherwise specified, condition E shall be used. c) Tests during exposure to reduced pressure (see clause 4). Unless otherwise specified, the device shall be su

33、bjected to the maximum voltage it would be subjected to under rated operating conditions. d) Post-exposure treatment time period (see clause 4). e) Final measurements, if applicable (see clause 4). Unless otherwise specified, the device shall be subjected to full electrical tests of specified device

34、 characteristics or parameters. f) Sample size. _ Page6 EN607492:2002- 3 E N64709-:20022 Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other pub

35、lications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revis

36、ion. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-13 1983 Enviro

37、nmental testing Part 2: Tests - Test M: Low air pressure EN 60068-2-13 1999 Page7 EN607492:2002BS EN 60749-2:2002 BSI 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsible for preparing British Standards. It presents the UK view on st

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