ImageVerifierCode 换一换
格式:PDF , 页数:14 ,大小:138.32KB ,
资源ID:699090      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-699090.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(DLA SMD-5962-87680 REV D-2013 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS 14-STAGE BINARY COUNTER MONOLITHIC SILICON.pdf)为本站会员(孙刚)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-87680 REV D-2013 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS 14-STAGE BINARY COUNTER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete vendor CAGE 27014. Change vendor CAGE 18714 to 34371. Technical changes in table I. Editorial changes throughout. 91-12-17 Michael A. Frye B Technical changes in table I. Update to new boilerplate. Delete vendor CAGE 04713. Editorial chang

2、es throughout. 94-11-07 Monica L. Poelking C Add notes to figure 4, switching waveforms and test circuit. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. - jak 06-10-19 Thomas M. Hess D Update boilerplate paragraphs to the current MIL-PRF-3

3、8535 requirements. - LTG 13-08-29 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY James E. Nicklaus DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT D

4、RAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY D. A. DiCenzo APPROVED BY Robert P. Evans MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 14-STAGE BINARY COUNTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-11-25 REVISION LEVEL D SIZE

5、 A CAGE CODE 67268 5962-87680 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E552-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DS

6、CC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87680 01 E

7、 A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54HC4060 14-stage binary counter 1.2.2 Case outline(s). The case outline(s) are

8、 as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum rati

9、ngs. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc Clamp diode current (IIK, IOK) 20 mA DC output diode current (per pin) (IOUT) 25 mA DC VCCor GND current (per pin) 50

10、 mA Storage temperature range (TSTG) -65C to +150C Maximum power dissipation (PD) . 500 mW 4/ Lead temperature (soldering, 10 seconds) . +260C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C 1/ Stresses above the absolute maximum rating may cause permanen

11、t damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, all voltages are referenced to ground. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature r

12、ange of -55C to +125C. 4/ For TC= +100C to TC= +125C, derate linearly at 8 mW/C to 300 mW. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL

13、D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range (VCC) . +2.0 V dc to +6.0 V dc Case operating temperature range (TC) -55C to +125C Input voltage range (VIN) . 0.0 V dc to VCC Output voltage range (VOUT) 0.0 V dc to VCCInput rise or fall time (tr, tf): VCC=

14、2.0 V . 0 to 1000 ns VCC= 4.5 V . 0 to 500 ns VCC= 6.0 V . 0 to 400 ns Minimum removal time, reset inactive to clock (trem): TC= +25C: VCC= 2.0 V . 160 ns VCC= 4.5 V . 32 ns VCC= 6.0 V . 27 ns TC= -55C to +125C: VCC= 2.0 V . 240 ns VCC= 4.5 V . 48 ns VCC= 6.0 V . 41 ns Minimum clock pulse width (tw1

15、): TC= +25C: VCC= 2.0 V . 90 ns VCC= 4.5 V . 18 ns VCC= 6.0 V . 15 ns TC= -55C to +125C: VCC= 2.0 V . 135 ns VCC= 4.5 V . 27 ns VCC= 6.0 V . 23 ns Minimum reset pulse width (tw2): TC= +25C: VCC= 2.0 V . 90 ns VCC= 4.5 V . 18 ns VCC= 6.0 V . 15 ns TC= -55C to +125C: VCC= 2.0 V . 135 ns VCC= 4.5 V . 2

16、7 ns VCC= 6.0 V . 23 ns Maximum clock frequency (fmax): TC= +25C: VCC= 2.0 V . 4 MHz minimum VCC= 4.5 V . 20 MHz minimum VCC= 6.0 V . 24 MHz minimum TC= -55C to +125C: VCC= 2.0 V . 2.6 MHz minimum VCC= 4.5 V . 13.0 MHz minimum VCC= 6.0 V . 15.0 MHz minimum Provided by IHSNot for ResaleNo reproductio

17、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specific

18、ation, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Speci

19、fication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings.

20、(Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified

21、 herein. Unless otherwise specified, the issues of these documents cited in the solicitation or contract. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JESD7 - Standard for Description of 54/74HCXXXXX and 54/74HCTXXXXX Advanced High-Speed CMOS Devices. (Copies of these documents are available onl

22、ine at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10thStreet, Suite 240-S Arlington, VA 22201-2107). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.

23、Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifie

24、d herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved pro

25、gram plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not aff

26、ect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, a

27、ppendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram

28、shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified in figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680

29、 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperatu

30、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PI

31、N listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance

32、 indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance.

33、A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufa

34、cturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chang

35、e. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable requir

36、ed documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE

37、VISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test conditions 1/ -55C TC +125C unless otherwise specified VCCGroup A subgroups Limits Unit Min Max High level output voltage, Q4-Q10, Q12-Q14 VOH12/ VIN= VIHminimum or VILmaximum IOH= -20 A 2.

38、0 V 1, 2, 3 1.9 V 4.5 V 4.4 6.0 V 5.9 VIN= VIHminimum or VILmaximum IOH= -4.0 mA 4.5 V 3.7 VIN= VIHminimum or VILmaximum IOH= -5.2 mA 6.0 V 5.2 Low level output voltage, Q4-Q10, Q12-Q14 VOL12/ VIN= VIHminimum or VILmaximum IOL= +20 A 2.0 V 1, 2, 3 0.1 V 4.5 V 0.1 6.0 V 0.1 VIN= VIHminimum or VILmaxi

39、mum IOL= +4.0 mA 4.5 V 0.4 VIN= VIHminimum or VILmaximum IOL= +5.2 mA 6.0 V 0.4 High level output voltage, Osc OUT 1 VOH22/ 3/ VIN= VCCor GND IOH= -20 A 2.0 V 1, 2, 3 1.9 V 4.5 V 4.4 6.0 V 5.9 VIN= VCCor GND IOH= -2.6 mA 4.5 V 3.7 VIN= VCCor GND IOH= -3.3 mA 6.0 V 5.2 High level output voltage, Osc

40、OUT 2 VOH32/ 3/ VIN= VIHminimum or VILmaximum IOH= -3.2 mA 4.5 V 1, 2, 3 3.7 V VIN= VIHminimum or VILmaximum IOH= -4.2 mA 6.0 V 5.2 Low level output voltage, Osc OUT 1 VOL22/ 3/ VIN= VCCor GND IOL= +20 A 2.0 V 1, 2, 3 0.1 V 4.5 V 0.1 6.0 V 0.1 VIN= VCCor GND IOL= +2.6 mA 4.5 V 0.4 VIN= VCCor GND IOL

41、= +3.3 mA 6.0 V 0.4 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I.

42、 Electrical performance characteristics Continued. Test Symbol Test conditions 1/ -55C TC +125C unless otherwise specified VCCGroup A subgroups Limits Unit Min Max Low level output voltage, Osc OUT 2 VOL32/ 3/ VIN= VIHminimum or VILmaximum IOL= +3.2 mA 4.5 V 1, 2, 3 0.4 V VIN= VIHminimum or VILmaxim

43、um IOL= +4.2 mA 6.0 V 0.4 High level input voltage VIH4/ 2.0 V 1, 2, 3 1.5 V 4.5 V 3.15 6.0 V 4.2 Low level input voltage VIL4/ 2.0 V 1, 2, 3 0.5 V 4.5 V 1.35 6.0 V 1.8 Input capacitance CINTC+25C, see 4.3.1c GND 4 10 pF Quiescent supply current ICCVIN= VCCor GND 6.0 V 1, 2, 3 160 A Input leakage cu

44、rrent IINVIN= VCCor GND 6.0 V 1, 2, 3 1 A Functional tests See 4.3.1d 7, 8 Propagation delay time, CLOCK to Q4 tPHL1, tPLH15/ CL= 50 pF minimum See figure 4 2.0 V 9 530 ns 10, 11 795 4.5 V 9 106 10, 11 159 6.0 V 9 90 10, 11 135 Propagation delay time, Qn to Qn + 1 tPHL2, tPLH25/ CL= 50 pF minimum Se

45、e figure 4 2.0 V 9 125 ns 10, 11 190 4.5 V 9 25 10, 11 38 6.0 V 9 21 10, 11 32 Propagation delay time, RESET to any Q tPHL35/ CL= 50 pF minimum See figure 4 2.0 V 9 240 ns 10, 11 360 4.5 V 9 48 10, 11 72 6.0 V 9 41 10, 11 61 See footnotes on next sheet. Provided by IHSNot for ResaleNo reproduction o

46、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87680 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions 1/ 55C TC +125C un

47、less otherwise specified VCCGroup A subgroups Limits Unit Min Max Transition time tTHL, tTLH6/ CL= 50 pF minimum See figure 4 2.0 V 9 75 ns 10, 11 110 4.5 V 9 15 10, 11 22 6.0 V 9 13 10, 11 19 1/ For power supply of 5.0 V 10 percent, the worst case output voltages (VOHand VOL) occur for high-speed C

48、MOS at 4.5 V. Thus, the 4.5 V values should be used when designing with this supply. Worst cases VIHand VILoccur at VCC= 5.5 V and 4.5 V, respectively. (The VIHvalue at VCC= 5.5 V is 3.85 V). The worst case leakage currents (IINand ICC) occur for CMOS at the higher voltage, so the 6.0 V values should be used. Power dissipation capacitance (CPD), typically 100 pF, determines the no load dynamic power consumption, PD= CPDVCC2 f + ICCVCC, and the no load dynamic current consumption, IS= CPDVCCf + ICC. 2/ VCC= 2.0 V and VCC= 6.0 V shall be guaranteed,

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1