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本文(DLA SMD-5962-90780 REV C-2012 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 10-BIT BUS INTERFACE FLIP-FLOPS WITH NON-INVERTING AND INVERTING INPUTS MONOLITHIC SILICON.pdf)为本站会员(eveningprove235)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90780 REV C-2012 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 10-BIT BUS INTERFACE FLIP-FLOPS WITH NON-INVERTING AND INVERTING INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R010-96. -ltg 95-12-04 Monica L. Poelking B Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 04-09-07 Raymond Monnin C Update drawing as part of 5 year review. jt

2、12-10-15 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.

3、mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Tim H. Noh APPROVED BY William K. Heckman MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, 10-BIT BUS INTERFACE FLIP-FLOPS WITH NON-INVERTING AND INVERTI

4、NG INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 91-02-06 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90780 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E465-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

5、ZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of cas

6、e outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90780 01 M L A Federal stock class design

7、ator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropri

8、ate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic nu

9、mber Circuit function 01 54AS821A 10-bit bus interface flip-flops with non-inverting inputs and three-state outputs 02 54AS822 10-bit bus interface flip-flops with inverting inputs and three-state outputs 03 54AS825A 8-bit bus interface flip-flops with non-inverting inputs and three-state outputs 04

10、 54AS826 8-bit bus interface flip-flops with inverting inputs and three-state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the re

11、quirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designato

12、r Terminals Package style L GDIP3-T24 or CDIP4-T24 24 dual-in-line K GDFP2-F24 or CDFP3-F24 24 flat 3 CQCC1-N28 28 square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot fo

13、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) -0.5 V dc to +7.0 V dc DC

14、input voltage . -1.2 V dc at 18 mA to +7.0 V dc Voltage applied to a disabled 3-state output . +5.5 V dc Storage temperature range -65C to +150C Continuous power dissipation (PD) 621.5 mW 2/ Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Thermal resistance, junction-t

15、o-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH): . 2.0 V dc Maximum low level input voltage (VIL): 01, 02, 04 0.8 V dc 03 . 0.7 V dc Maximum high level output current (IOH) -24 mA Maximum lo

16、w level output current (IOL) +32 mA Case operating temperature range (TC) . -55C to +125C Minimum setup time, (ts) before CLK : from data, 01, 02 7 ns from CLR inactive, 03, 04 8 ns from data, 03, 04 7 ns from CLKEN high or low: 03 10.5 ns 04 7 ns Minimum hold time, (th) CLKEN or data, after CLK 0 n

17、s Minimum pulse duration, (tw): CLK high or low: 01, 02, 04 9 ns 03 9.5 ns CLR low: 03 7 ns 04 5 ns 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless

18、 otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the de

19、vice. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Continuous power dissipation is defined as VCCX ICC, and must withstand the added PDdue to short circuit test e.g., IOSProvided by IHSNot for ResaleNo reproduction or networking permitted without licens

20、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case

21、Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, B

22、uilding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific e

23、xemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall

24、 not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction

25、, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections sha

26、ll be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter lim

27、its. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroup

28、s specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space

29、 limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MI

30、L-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For dev

31、ice classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approve

32、d source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-3853

33、5 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEV

34、EL C SHEET 5 DSCC FORM 2234 APR 97 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of c

35、hange for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land

36、and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device cla

37、ss M. Device class M devices covered by this drawing shall be in microcircuit group number 10 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUM

38、BUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH = -2 mA/ 1, 2, 3 All

39、2.5 V VIN= 2.0 V, IOH = -15 mA 2.4 VIL= Max 2/ IOH = -24 mA 2.0 Low level output voltage VOLVCC= 4.5 V, VIN= 2.0 V, VIL= Max 2/ IOL = 32 mA 1, 2, 3 All 0.5 V Input clamp voltage VICVCC= 4.5 V IIN = -18 mA 1, 2, 3 All -1.2 V High level input current IIH1VCC= 5.5 V VIN= 7.0 V 1, 2, 3 All 100 A IIH2VIN

40、= 2.7 V 20 Low level input current IILVCC= 5.5 V VIN= 0.4 V 1, 2, 3 All -0.5 mA Output current IOVCC= 5.5 V 3/ VOUT= 2.25 V 1, 2, 3 All -30 -112 mA Supply current ICCHVCC= 5.5 V Outputs high 1, 2, 3 01, 02 88 mA 03, 04 73 ICCLOutputs low 01, 02 109 03, 04 90 ICCZOutputs disabled 01, 02 113 03, 04 95

41、 Off-state output leakage IOZHVCC= 5.5 V VOUT= 2.4 V 1, 2, 3 All 50 A current IOZLVOUT= 0.4 V -50 Functional tests See 4.3.1c VCC= 4.5 and 5.5 V 7, 8 All See notes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

42、 DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max

43、Propagation delay time, tPLH1VCC= 4.5 V to 5.5 V, 9, 10, 11 All 3.5 9 ns CLK to any Q tPHL1CL= 50 pF, 01 3.5 14 ns R1= R2= 500, 02, 04 3.5 11.5 See figure 3 4/ 03 3.5 13.5 Propagation delay time, tPHL29, 10, 11 03 3.5 16.5 ns CLR to any Q 04 3.5 14 Output enable time, tPZH9, 10, 11 All 4 12 ns OC to

44、 any Q tPZLAll 4 13 ns Output disable time, tPHZ9, 10, 11 01, 03 1 10 ns OC to any Q 02, 04 2 10 tPLZAll 2 10 ns 1/ Unused inputs that do not directly control the pin under test must be put at 2.5 V or 0.4 V. No unused inputs shall exceed 5.5 V or go less than 0.0 V. No inputs shall be floated. 2/ A

45、ll outputs must be tested. In the case where only one input at VILmaximum or VIHminimum produces the proper state, the test must be performed with each input being selected as the VILmaximum or VIHminimum input. 3/ The output conditions have been chosen to produce a current that closely approximates

46、 one-half of the true short circuit output current, IOS. Not more than one output will be tested at one time and duration of the test condition shall not exceed one second. 4/ Propagation delay limits are based on single output switching. Unused inputs = 3.5 V or 0.3 V. Provided by IHSNot for Resale

47、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device type 01 02 03 04 Case outlines K, L 3 K, L 3 K, L 3 K, L 3 Terminal number Termin

48、al symbol Terminal symbol Terminal symbol Terminal symbol 1 OC NC OC NC OC 1 NC OC 1 NC 2 1D OC 1 D OC OC 2 OC 1 OC 2 OC 1 3 2D 1D 2 D 1 D 1D OC 2 1 D OC 2 4 3D 2D 3 D 2 D 2D 1 D 2 D 1 D 5 4D 3D 4 D 3 D 3D 2 D 3 D 2 D 6 5D 4D 5 D 4 D 4D 3 D 4 D 3 D 7 6D 5D 6 D 5 D 5D 4 D 5 D 4 D 8 7D NC 7 D NC 6D 5 D 6 D NC 9 8D 6D 8 D 6 D 7D NC 7 D 5 D 10 9D 7D 9 D 7 D 8D 6 D 8 D 6 D 11 10D 8D 10D 8 D CLR 7 D CLR 7 D 12 GND 9D GND 9 D GND 8 D GND 8 D 13 CLK 10D CLK 10 D CLK CLR CLK CLR 14 10Q GND 10Q GND CLKENGND C

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