KS X ISO 13655-2006 Graphic technology－Spectral measurement and colorimetric computation for graphic arts images《制图技术 制图艺术成象用光谱测量和比色的计算》.pdf

1、KSKSKSKS SKSKSKS KSKSKS SKSKS KSKS SKS KS 2006 12 29 http:/www.kats.go.krKS X ISO 13655 KS X ISO 13655： 2006 (2011 )X ISO 13655： 2006 : ( ) ( ) ( ) : (http:/www.standard.go.kr) ： ：2002 11 4 : 2006 12 29 ：2011 12 30 2011-0679 ： ： ( 02-509-72625) (http:/www.kats.go.kr). 10 5 , . ICS 37.100 KS X ISO 13

2、655： 2006(2011 ) Graphic technology Spectral measurement and colorimetric computation for graphic arts images , KS 1996 1 ISO 13655 Graphic technology Spectral measurement and colorimetric computation for graphic arts images . 1. . , , , , , , . B , D, E, F G ( ) . , , , , ( ) . , ( ) . 1. ASTM E 13

3、36 91 . ISO 2469 . 2. , . . , . IEC ISO . ISO 5 2： 1991 Photography Density measurements Part 2： Geometric conditions for transmission density ISO 5 4： 1995 Photography Density measurements Part 4： Geometric conditions for reflection density ISO 3664： 1975 Photography Illumination conditions for vie

4、wing colour transparencies and their reproductions CIE Publication 15.2： 1986 Colorimetry 3. . 3.1 CIE 3.2 CIE A, D50, D65 D 3.3 X ISO 13655： 2006 2 3.4 ( ) 3.5 ( ) 3.6 3.7 3.8 ( , ) 3.9 2. . 4. 4.1 . . 3. . H . . 4.2 4.2.1 , , 5.1 . 4.2.2 5.1 CIE D50 . 4. D50 . G . 4.3 340780 nm 10 nm , 20 nm 40070

5、0 nm . 10 nm , 10 nm . 5. . , . 4.4 4.4.1 ISO 5 4： 1995, 4.7 . D 4.4.2 45/0 0/45 ISO 5 4 . 6. 45/0 0/45 X ISO 13655： 2006 3 . “ ” . E 7. 2 mm ISO 5 4 . F . 4.4.3 100 % , 100 0.01 % . 4.5 4.5.1 / (0/d) / (d/0) ISO 5 2 CIE 15.2 . ( E ). 4.5.2 100 % , 100 0.01 % ( E ) 5. 5.1 , ISO 3664 CIE D50 CIE 15.2

6、 CIE 1931 (2 ) . 10 nm 20 nm . CIE D50 2 , ASTM E 3083 10 nm 1 , 20 nm 2 . 10 nm . 8. 2 10 . 340 nm , 1 2 . 780 nm , 1 2 . . =780340)()(XWRX =780340)()(XWTX =780340)()(YWRY =780340)()(YWTY =780340)()(ZWRZ =780340)()(ZWTZ R()： T( )： WX()： X X ISO 13655： 2006 4 WY()： Y WZ()： Z 10 nm , A . 9. 1 2 4.3 .

7、 Xn= 96.422, Yn= 100.000 Zn= 82.521 . 10. 1 2 340780 nm Xn, Yn Zn . Xn, Yn Zn ASTM E 308 . X, Y Z . 11. CIE D65 , , CIE D65 CIE 1931 (2 ) C . 12. 1 2 C.1 C.2 ASTM (Annual Book of ASTM Standards, copyright American Society of Testing and Materials, 1916 Race St., Philadelphia, PA 19130, USA) . X ISO

8、13655： 2006 5 1 10 nm D50 2 ( W ) 2 20 nm D50 2 ( W ) 20 nm , 10 nm . X ISO 13655： 2006 6 5.2 CIE 15.2 . CIELAB L*, a*, b*, Cab* hab CMC B . 5.3 , . a) ISO 13655 b) c) d) e) , f) ( ) g) X ISO 13655： 2006 7 A() 10 nm 20 nm . (10 nm 10 nm 20 nm 20 nm ). . . 10 nm 20 nm , . 10 nm 20 nm , . ( ) . . . .

9、=nnnXYXW )( )(nXW ： Xn nY ： nX ： ： 0.008 856, f (X/Xn) = (X/Xn)1/3Y/Yn 0.008 856, f (Y/Yn) = (Y/Yn)1/3Z/Zn 0.008 856, f (Z/Zn) = (Z/Zn)1/3 X/Xn 0.008 856, f (X/Xn) = 7.786 7(X/Xn) 16/116 Y/Yn 0.008 856, f (Y/Yn) = 7.786 7(Y/Yn) 16/116 Z/Zn 0.008 856, f (Z/Zn) = 7.786 7(Z/Zn) 16/116 5.1 Xn= 96.422, Y

10、n= 100.000 Zn= 82.521 Cab*= (a*2 b*2)1/2hab= tan 1(b*/a*) a* 0 0 hab0 a* 0 180 hab 270 b* 0 a* 0 270 hab 360 b* 0 B.2 CIELUV (CIE 15.2 ) L*= 116f (Y/Yn) 16 u*= 13L*(u un) v*= 13L*(v vn) u= 4X/(X 15Y 3Z) v = 9Y/(X 15Y 3Z) un, vn u, v . . , , XYZ . 1976 CIE . x y X ISO 13655： 2006 9 . ( ) XYZ . , . .

11、v u . . . . , CIELAB . . XYZ (a* b* ) . . , , , u v . , , ( ) , . ( ) . , CIE LUV . B.3 CIE LAB (CIE 15.2 ) L* = L1* L2*a*= a1* a2*b* = b1* b2*2*1*abababCCC = hab= hab1 hab2 1 2 L*, a*, b* Eab* E*ab= (L*)2 (a*)2 (b*)21/2CIE , H*ab H*ab= (E*ab)2 (L*)2 (C*ab)21/2B.4 CMC(l： c) Ecmc(BS 69235 ) 2/12*2*2c

12、mc)/()/()/(HabCabLSHcSClSLE += L*, C*ab, H*ab： B.3 SL= 0.040 975 L*/(1 0.017 65 L*) L* 16 , SL= 0.511 SC= 0.063 8C*ab/(1 0.013 1C*ab) 0.638 SH= SC(FT 1 F) X ISO 13655： 2006 10 F = (C*ab)4/(C*ab)4 1 9001/2 , T = 0.36| 0.4 cos(hab 35)|, 164 hab 345 T = 0.56| 0.2 cos(hab 168)| 14. CMC ( , ) CIE , CIE .

13、 CMC , . Ecmc l = 2 . c 1 , BS 69235 ( AATCC 173 1990 ). , l c SL, SC, SH,F T . CMC . 3 E*94 CIE 116 1995 ( 2.11) . X ISO 13655： 2006 11 C() D65 2 CIE D65 CIE D65 CIE 1931 (2 ) . Xn= 95.047, Yn= 100.000, Zn= 108.883 . 15. C.1 C.2 340780 nm Xn, Yn, Zn . Xn, Yn, Zn . Xn, Yn, Zn . X ISO 13655： 2006 12

14、C.1 10 nm C.2 20 nm D65 2 D65 2 ( W ) ( W ) X ISO 13655： 2006 13 D() , . . . ISO 5 4, 4.7 . , , (1.50 0.20) ISO . . (ISO 3664) . ( , Munsell ) . . , , , , . X ISO 13655： 2006 14 E() E.1 , , . , . . 0 45 (0/45) (45/0) , 0 . 0 , 8 . , H . . , . . , . . , 0/45 45/0 . , . ISO 5 4 0/45 45/0 . 3(WG 3) ISO/TC 130 0/45 45/0 . WG 3 . . “ ” . E.3 . E.2 0/d d/0 . CIE 15.2 ISO 5 2 . ISO 5 2 ISO . . . . CIE 15.2 ( ). ISO ISO 5 2 X ISO 13655： 2006 15 . , ,