KS X ISO 13655-2006 Graphic technology-Spectral measurement and colorimetric computation for graphic arts images《制图技术 制图艺术成象用光谱测量和比色的计算》.pdf

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1、KSKSKSKS SKSKSKS KSKSKS SKSKS KSKS SKS KS 2006 12 29 http:/www.kats.go.krKS X ISO 13655 KS X ISO 13655: 2006 (2011 )X ISO 13655: 2006 : ( ) ( ) ( ) : (http:/www.standard.go.kr) : :2002 11 4 : 2006 12 29 :2011 12 30 2011-0679 : : ( 02-509-72625) (http:/www.kats.go.kr). 10 5 , . ICS 37.100 KS X ISO 13

2、655: 2006(2011 ) Graphic technology Spectral measurement and colorimetric computation for graphic arts images , KS 1996 1 ISO 13655 Graphic technology Spectral measurement and colorimetric computation for graphic arts images . 1. . , , , , , , . B , D, E, F G ( ) . , , , , ( ) . , ( ) . 1. ASTM E 13

3、36 91 . ISO 2469 . 2. , . . , . IEC ISO . ISO 5 2: 1991 Photography Density measurements Part 2: Geometric conditions for transmission density ISO 5 4: 1995 Photography Density measurements Part 4: Geometric conditions for reflection density ISO 3664: 1975 Photography Illumination conditions for vie

4、wing colour transparencies and their reproductions CIE Publication 15.2: 1986 Colorimetry 3. . 3.1 CIE 3.2 CIE A, D50, D65 D 3.3 X ISO 13655: 2006 2 3.4 ( ) 3.5 ( ) 3.6 3.7 3.8 ( , ) 3.9 2. . 4. 4.1 . . 3. . H . . 4.2 4.2.1 , , 5.1 . 4.2.2 5.1 CIE D50 . 4. D50 . G . 4.3 340780 nm 10 nm , 20 nm 40070

5、0 nm . 10 nm , 10 nm . 5. . , . 4.4 4.4.1 ISO 5 4: 1995, 4.7 . D 4.4.2 45/0 0/45 ISO 5 4 . 6. 45/0 0/45 X ISO 13655: 2006 3 . “ ” . E 7. 2 mm ISO 5 4 . F . 4.4.3 100 % , 100 0.01 % . 4.5 4.5.1 / (0/d) / (d/0) ISO 5 2 CIE 15.2 . ( E ). 4.5.2 100 % , 100 0.01 % ( E ) 5. 5.1 , ISO 3664 CIE D50 CIE 15.2

6、 CIE 1931 (2 ) . 10 nm 20 nm . CIE D50 2 , ASTM E 3083 10 nm 1 , 20 nm 2 . 10 nm . 8. 2 10 . 340 nm , 1 2 . 780 nm , 1 2 . . =780340)()(XWRX =780340)()(XWTX =780340)()(YWRY =780340)()(YWTY =780340)()(ZWRZ =780340)()(ZWTZ R(): T( ): WX(): X X ISO 13655: 2006 4 WY(): Y WZ(): Z 10 nm , A . 9. 1 2 4.3 .

7、 Xn= 96.422, Yn= 100.000 Zn= 82.521 . 10. 1 2 340780 nm Xn, Yn Zn . Xn, Yn Zn ASTM E 308 . X, Y Z . 11. CIE D65 , , CIE D65 CIE 1931 (2 ) C . 12. 1 2 C.1 C.2 ASTM (Annual Book of ASTM Standards, copyright American Society of Testing and Materials, 1916 Race St., Philadelphia, PA 19130, USA) . X ISO

8、13655: 2006 5 1 10 nm D50 2 ( W ) 2 20 nm D50 2 ( W ) 20 nm , 10 nm . X ISO 13655: 2006 6 5.2 CIE 15.2 . CIELAB L*, a*, b*, Cab* hab CMC B . 5.3 , . a) ISO 13655 b) c) d) e) , f) ( ) g) X ISO 13655: 2006 7 A() 10 nm 20 nm . (10 nm 10 nm 20 nm 20 nm ). . . 10 nm 20 nm , . 10 nm 20 nm , . ( ) . . . .

9、=nnnXYXW )( )(nXW : Xn nY : nX : : 0.008 856, f (X/Xn) = (X/Xn)1/3Y/Yn 0.008 856, f (Y/Yn) = (Y/Yn)1/3Z/Zn 0.008 856, f (Z/Zn) = (Z/Zn)1/3 X/Xn 0.008 856, f (X/Xn) = 7.786 7(X/Xn) 16/116 Y/Yn 0.008 856, f (Y/Yn) = 7.786 7(Y/Yn) 16/116 Z/Zn 0.008 856, f (Z/Zn) = 7.786 7(Z/Zn) 16/116 5.1 Xn= 96.422, Y

10、n= 100.000 Zn= 82.521 Cab*= (a*2 b*2)1/2hab= tan 1(b*/a*) a* 0 0 hab0 a* 0 180 hab 270 b* 0 a* 0 270 hab 360 b* 0 B.2 CIELUV (CIE 15.2 ) L*= 116f (Y/Yn) 16 u*= 13L*(u un) v*= 13L*(v vn) u= 4X/(X 15Y 3Z) v = 9Y/(X 15Y 3Z) un, vn u, v . . , , XYZ . 1976 CIE . x y X ISO 13655: 2006 9 . ( ) XYZ . , . .

11、v u . . . . , CIELAB . . XYZ (a* b* ) . . , , , u v . , , ( ) , . ( ) . , CIE LUV . B.3 CIE LAB (CIE 15.2 ) L* = L1* L2*a*= a1* a2*b* = b1* b2*2*1*abababCCC = hab= hab1 hab2 1 2 L*, a*, b* Eab* E*ab= (L*)2 (a*)2 (b*)21/2CIE , H*ab H*ab= (E*ab)2 (L*)2 (C*ab)21/2B.4 CMC(l: c) Ecmc(BS 69235 ) 2/12*2*2c

12、mc)/()/()/(HabCabLSHcSClSLE += L*, C*ab, H*ab: B.3 SL= 0.040 975 L*/(1 0.017 65 L*) L* 16 , SL= 0.511 SC= 0.063 8C*ab/(1 0.013 1C*ab) 0.638 SH= SC(FT 1 F) X ISO 13655: 2006 10 F = (C*ab)4/(C*ab)4 1 9001/2 , T = 0.36| 0.4 cos(hab 35)|, 164 hab 345 T = 0.56| 0.2 cos(hab 168)| 14. CMC ( , ) CIE , CIE .

13、 CMC , . Ecmc l = 2 . c 1 , BS 69235 ( AATCC 173 1990 ). , l c SL, SC, SH,F T . CMC . 3 E*94 CIE 116 1995 ( 2.11) . X ISO 13655: 2006 11 C() D65 2 CIE D65 CIE D65 CIE 1931 (2 ) . Xn= 95.047, Yn= 100.000, Zn= 108.883 . 15. C.1 C.2 340780 nm Xn, Yn, Zn . Xn, Yn, Zn . Xn, Yn, Zn . X ISO 13655: 2006 12

14、C.1 10 nm C.2 20 nm D65 2 D65 2 ( W ) ( W ) X ISO 13655: 2006 13 D() , . . . ISO 5 4, 4.7 . , , (1.50 0.20) ISO . . (ISO 3664) . ( , Munsell ) . . , , , , . X ISO 13655: 2006 14 E() E.1 , , . , . . 0 45 (0/45) (45/0) , 0 . 0 , 8 . , H . . , . . , . . , 0/45 45/0 . , . ISO 5 4 0/45 45/0 . 3(WG 3) ISO/TC 130 0/45 45/0 . WG 3 . . “ ” . E.3 . E.2 0/d d/0 . CIE 15.2 ISO 5 2 . ISO 5 2 ISO . . . . CIE 15.2 ( ). ISO ISO 5 2 X ISO 13655: 2006 15 . , ,

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