NF X41-535-2-1993 Wood preservatives Determination of the protective effectiveness against lyctus brunneus (stephens) Part 2 application by impregnation (laboratory method) 《木材防腐剂.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

KS C IEC 60749-1-2006 Semiconductor devices－Mechanical and climatic test methods－Part 1：General《半导体器件 机械和气候试验方法 第1部分 总则》.pdf

KS C IEC 60749-14-2006 Semiconductor devices－Mechanical and climatic test methods－Part 14：Robustness of terminations(lead integrity)《半导体器件 机械和气候试验方法 第14部分 终端装置的坚固性(引线牢固性)》.pdf

KS C IEC 60749-16-2006 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)《半导体器件 机械和气候试验方法 第16部分 粒子冲击噪声探测(PIND)》.pdf

KS C IEC 60749-17-2006 Semiconductor devices－Mechanical and climatic test methods－Part 17：Neutron irradiation《半导体器件 机械和气候试验方法 第17部分 中子辐照》.pdf

KS C IEC 60749-18-2006 Semiconductor devices－Mechanical and climatic test methods－Part 18：Ionizing radiation(total dose)《半导体器件 机械和气候试验方法 第18部分 电离辐射(总剂量)》.pdf

KS C IEC 60749-23-2006 Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life《半导体器件 机械和气候试验方法 第23部分 高温操作寿命》.pdf

KS C IEC 60749-24-2006 Semiconductor devices－Mechanical and climatic test methods－Part 24：Accelerated moisture resistance－Unbiased HAST《半导体器件 机械和气候试验方法 第24部分 加速抗湿性 无偏HAST》.pdf

KS C IEC 60749-31-2006 Semiconductor devices－Mechanical and climatic test methods－Part 31：Flammability of plastic-encapsulated devices(internally induced)《半导体器件 机械和气候试验方法 第31部分 塑料密.pdf

KS C IEC 60749-32-2006 Semiconductor devices－Mechanical and climatic test methods－Part 32：Flammability of plastic-encapsulated devices(externally induced)《半导体器件 机械和气候试验方法 第32部分 塑料密.pdf