1、 NASA HANDBOOK Measuring and Test Equipment Specifications NASA Measurement Quality Assurance Handbook ANNEX 2 Measurement System Identification: Metric July 2010 National Aeronautics and Space Administration Washington DC 20546 NASA-HDBK-8739.19-2Approved: 2010-07-13 Baseline APPROVED FOR PUBLIC RE
2、LEASE DISTRIBUTION UNLIMITED Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i This page intentionally left blank. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ii DOCUMENT HISTORY LOG Status Docume
3、nt Revision Approval Date Description Baseline 2010-07-13 Initial Release (JWL4)This document is subject to reviews per Office of Management and Budget Circular A-119, Federal Participation in the Development and Use of Voluntary Standards (02/10/1998) and NPD 8070.6, Technical Standards (Paragraph
4、1.k). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-iii This page intentionally left blank. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking
5、 permitted without license from IHS-,-,-v This page intentionally left blank. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vi TABLE OF CONTENTS FOREWORD. IV TABLE OF CONTENTS . VI LIST OF FIGURES XI LIST OF TABLES .XII ACKNOWLEDGEMENTS XIII EXECUT
6、IVE SUMMARY . XIV READERS GUIDE. XIV ACRONYMS AND INITIALISMS XVI CHAPTER 1: INTRODUCTION 1 1.1 PURPOSE 1 1.2 SCOPE .1 1.3 BACKGROUND .1 1.4 APPLICATION .2 CHAPTER 2: MEASURING AND TEST EQUIPMENT 3 2.1 ARTIFACTS 3 2.2 INSTRUMENTS3 2.3 SENSORS AND TRANSDUCERS 3 2.4 SIGNAL CONDITIONERS 4 2.5 DATA ACQU
7、ISITION EQUIPMENT5 2.6 DATA PROCESSORS 5 2.7 OUTPUT DISPLAYS 5 2.8 CABLES AND CONNECTORS .5 CHAPTER 3: PERFORMANCE CHARACTERISTICS 6 3.1 STATIC CHARACTERISTICS 6 3.1.1 Sensitivity 6 3.1.2 Zero Offset . 7 3.1.3 Nonlinearity . 7 3.1.4 Hysteresis 8 3.1.5 Noise 8 3.1.6 Resolution 9 3.2 DYNAMIC CHARACTER
8、ISTICS .9 3.2.1 Response Time 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vii 3.2.2 Frequency Response 10 3.2.3 Damping Ratio . 12 3.2.4 Stability 12 3.3 OTHER CHARACTERISTICS .12 3.3.1 Span, Deadband and Threshold . 13 3.3.2 Environmental Oper
9、ating Conditions 13 3.3.3 Environmental Effects . 13 3.3.4 Temperature Compensation . 14 3.3.5 Excitation Voltage or Current 14 CHAPTER 4: ESTABLISHING PERFORMANCE CHARACTERISTICS .15 4.1 ENGINEERING ANALYSIS 15 4.1.1 Analysis Methods and Tools . 15 4.2 FIRST ARTICLE TESTING .19 4.2.1 Environmental
10、Testing 21 4.2.2 Accelerated Life Testing . 22 4.2.3 Design of Experiments 24 4.2.4 Data Analysis Methods and Techniques . 28 4.3 MEASUREMENT QUALITY ASSURANCE34 4.3.1 Test Equipment Calibration . 34 4.3.2 Measurement Uncertainty 34 4.4 ENGINEERING AND TESTING REPORTS.35 4.4.1 Reporting Engineering
11、Analysis Results . 35 4.4.2 Reporting Test Results. 36 CHAPTER 5: DEVELOPING SPECIFICATIONS 37 5.1 ENGINEERING ANALYSIS 37 5.2 FINAL ARTICLE TESTING 37 5.3 MEASUREMENT QUALITY ASSURANCE38 5.4 SPECIFICATION LIMITS 39 5.4.1 Probability Distributions 39 5.4.2 Confidence Levels . 40 5.4.3 Confidence Lim
12、its . 40 CHAPTER 6: VERIFYING AND MODIFYING SPECIFICATIONS .44 6.1 ACCEPTANCE TESTING 44 6.2 PRODUCTION MONITORING .44 6.2.1 Sampling Procedures . 45 6.2.2 Statistical Quality Control . 46 6.3 MEASUREMENT QUALITY ASSURANCE48 6.3.1 Test Equipment Calibration . 48 6.3.2 Measurement Uncertainty 49 Prov
13、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-viii 6.4 ENGINEERING ANALYSIS 49 6.4.1 MTE Manufacturers 49 6.4.2 MTE End Users . 49 6.5 MODIFYING SPECIFICATION LIMITS 49 6.6 VERIFICATION REPORTS .51 6.6.1 Acceptance Testing Report 51 6.6.2 Production Mo
14、nitoring Report . 51 6.6.3 Engineering Analysis Report . 52 CHAPTER 7: REPORTING SPECIFICATIONS 53 7.1 OPERATING PRINCIPLES .53 7.1.1 Physical Design Characteristics . 53 7.1.2 Transfer Function 54 7.2 PERFORMANCE CHARACTERISTICS 54 7.2.1 Baseline Specifications 54 7.2.2 Secondary Specifications . 5
15、5 7.2.3 Time-dependent Specifications . 55 7.3 OPERATING CONDITIONS .55 7.4 TERMS, DEFINITIONS AND ABBREVIATIONS 56 7.5 PROBABILITY DISTRIBUTIONS 56 7.6 CONFIDENCE LEVELS 57 7.7 SPECIFICATION UNITS AND CONVERSION FACTORS 57 7.8 SPECIFICATION FORMAT 58 CHAPTER 8: OBTAINING SPECIFICATIONS .59 8.1 PROD
16、UCT DATA SHEETS .59 8.2 USER GUIDES AND MANUALS .60 8.3 APPLICATION NOTES .60 8.4 TECHNICAL NOTES AND ARTICLES .60 8.5 OTHER RESOURCES 60 8.5.1 Third Party Websites . 60 8.5.2 Engineering Handbooks 61 CHAPTER 9: INTERPRETING SPECIFICATIONS 62 9.1 OPERATING PRINCIPLES .62 9.2 PERFORMANCE CHARACTERIST
17、ICS 63 9.3 OPERATING CONDITIONS & RELATED SPECIFICATIONS .65 9.4 TERMS, DEFINITIONS AND ABBREVIATIONS 65 9.5 SPECIFICATION UNITS .66 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ix 9.6 QUALIFICATIONS, STIPULATIONS AND WARNINGS 67 9.7 CONFIDENCE LE
18、VELS AND COVERAGE FACTORS .67 9.8 PROBABILITY DISTRIBUTIONS 68 9.9 COMBINING SPECIFICATIONS 69 CHAPTER 10: VALIDATING CONFORMANCE TO SPECIFICATIONS 72 10.1 ACCEPTANCE TESTING 72 10.1.1 Static Performance Characteristics 73 10.1.2 Dynamic Performance Characteristics 74 10.1.3 Environmental Testing 75
19、 10.1.4 Accelerated Life Testing . 77 10.1.5 Testing Plans and Procedures 77 10.2 PERIODIC CALIBRATION .78 10.2.1 Laboratory Calibration 79 10.2.2 In-Situ Calibration . 81 10.2.3 Self-Calibrating Equipment. 83 10.2.4 Measurement Uncertainty . 83 10.2.5 Measurement Traceability . 84 10.2.6 Conformanc
20、e Testing 85 10.2.7 Calibration Records . 87 10.2.8 Calibration Intervals 87 10.3 BAYESIAN ANALYSIS.88 10.4 VALIDATION REPORTS 89 CHAPTER 11: APPLYING SPECIFICATIONS 91 11.1 MEASUREMENT UNCERTAINTY ANALYSIS .91 11.2 TOLERANCE LIMITS .97 11.3 MEASUREMENT DECISION RISK ANALYSIS 98 11.3.1 In-tolerance
21、Probability . 104 11.3.2 Relative Accuracy Criterion 107 11.4 CALIBRATION INTERVAL ANALYSIS .108 11.4.1 Reliability Modeling . 108 11.4.2 Manufacturer Specified Intervals 110 CHAPTER 12: FIRMWARE AND SOFTWARE-BASED SPECIFICATIONS .111 12.1 BACKGROUND .111 12.2 ADVANTAGES 111 12.3 DISADVANTAGES 112 1
22、2.4 LIMITATIONS AND PROBLEMS 112 12.5 METROLOGY AND CALIBRATION SUPPORT 112 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-x CHAPTER 13: MEASUREMENT QUALITY AND SPECIFICATIONS .113 13.1 DEFINING MEASUREMENT REQUIREMENTS .113 13.2 MEASUREMENT SYSTEM
23、DESIGN .115 13.3 SELECTING MEASURING EQUIPMENT .117 13.3.1 Establishing MTE Performance Requirements . 117 13.3.2 Selecting Candidate MTE . 118 13.3.3 Acceptance Testing . 119 13.4 CALIBRATION AND MAINTENANCE 120 APPENDIX A TERMS AND DEFINITIONS 122 Definition 122 APPENDIX B - STANDARDS FOR THE TEST
24、ING AND REPORTING OF MTE PERFORMANCE CHARACTERISTICS 134 APPENDIX C - GENERALIZED TRANSFER FUNCTIONS FOR SELECTED MTE .138 APPENDIX D - LOAD MEASUREMENT SYSTEM ANALYSIS 141 REFERENCES .159 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-xi LIST OF FI
25、GURES Figure 3-1 Sensitivity and Sensitivity Error 6 Figure 3-2 Offset Error 7 Figure 3-3 Nonlinearity Error 8 Figure 3-4 Hysteresis Error 8 Figure 3-5 Repeatability or Noise Error 9 Figure 3-6 Response Time for First-order Device .10 Figure 3-7 Response Time Error for First-order Device .10 Figure
26、3-8 Frequency Response Curve 11 Figure 3-9 Phase Shift 11 Figure 3-10 Damping Ratio .12 Figure 3-11 Deadband, Threshold, Span and Full Scale Output .13 Figure 4-1 Sensitivity Diagram 19 Figure 4-2 Response of Output Y to Input Factors X1and X2.24 Figure 4-3 Two-level 23Factorial Design .26 Figure 4-
27、4 Interaction of Input Factors X1and X226 Figure 4-5 Midpoints used to Test for Curvature (non-linearity) 27 Figure 4-6 Box-Behnken Three-level, Three-Factor Design .28 Figure 5-1 Normal Parameter Probability Distribution .41 Figure 5-2 Uniform Parameter Probability Distribution 41 Figure 5-3 Combin
28、ed Measurement Error Distribution .42 Figure 5-4 Combined Measurement Error and Parameter Distribution .43 Figure 6-1 General Control Chart Format .47 Figure 6-2 Modified Specification Limits .50 Figure 8-1 Load Cell Product Data Sheet 59 Figure 10-1 Measurement Traceability Chain .84 Figure 10-2 Fo
29、ur Calibration Results Relative to Specification Limits 86 Figure 10-3 Measurement Uncertainty Growth. 87 Figure 10-4 Measurement Reliability versus Time .88 Figure 11-1 Pareto Chart for Uncertainty in Load Cell Output .97 Figure 11-2 Pareto Chart for Load Cell Calibration Uncertainty 103 Figure 11-
30、3 Load Cell Bias Distribution 3 lbfInput Load 104 Figure 11-4 OOT Probability of Calibrated Load Cell 104 Figure 11-5 Parameter Bias Distribution. 109 Figure 11-6 Measurement Reliability versus Time. 110 Figure 13-1 Probability Distribution for Measured Quantity x .115 Figure 13-2 Overview of Measur
31、ement System Development Process 116 Figure 13-3 Measurement System Design Process 116 Figure D-1 Block Diagram of Load Measurement System .141 Figure D-2 Pareto Chart for Load Cell Module .153 Figure D-3 Pareto Chart for Amplifier Module .153 Figure D-4 Pareto Chart for Digital Multimeter Module .1
32、53 Figure D-5 Pareto Chart for Data Processor Module .154 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-xii LIST OF TABLES Table 2-1. Sensors and Transducers 3 Table 2-2. Signal Conditioning Methods .4 Table 4-1. Examples of Failure Mode Occurrence
33、, Severity and Detection Rankings .17 Table 4-2. Tests Required for Three-Level Factorial Designs 27 Table 4-3. ANOVA Data for Two-Factorial Experiment 30 Table 4-4. General Two-Factor ANOVA Equations .30 Table 9-1. Specifications for MDB-5-T Load Cell 64 Table 9-2. Common MTE Abbreviations 65 Table
34、 9-3. Specification Conversion Factors .66 Table 9-4. DC Voltage Specifications for 8062A Digital Multimeter .69 Table 9-5. DC Voltage Accuracy Specifications .70 Table 9-6. Tolerance Grades for Metric Gage Blocks (m) 70 Table 9-7. Additional Tolerance for Length, Flatness, and Parallelism (m) .71 T
35、able 11-1. Parameters used in Load Cell Output Equation .93 Table 11-2. Estimated Uncertainties for Load Cell Parameters 95 Table 11-3. Uncertainty in Load Cell Output Voltage versus Applied Load 97 Table 11-4. DC Voltage Specifications for 8062A Multimeter .99 Table 11-5. DC Voltage Readings .100 T
36、able 11-6. Parameters used in Load Cell Calibration Output Equation 100 Table 11-7. Estimated Uncertainties for Load Cell Calibration Output 102 Table B-1. Testing Standards for Transducers 134 Table B-2. Testing Standards for Dimensional and Volumetric Measuring Devices 136 Table B-3. Testing Stand
37、ards for Complex Instruments .137 Table C-1. General Transfer Functions for Selected MTE 138 Table D-1. Estimated Uncertainties for Load Cell Parameters 141 Table D-2. Specifications for TMO-2 Amplifier .142 Table D-3. Parameters used in Amplifier Module Equation .144 Table D-4. Estimated Uncertaint
38、ies for Amplifier Module Parameters 145 Table D-5. DC Voltage Specifications for 8062A Multimeter 147 Table D-6. Parameters used in Modified Multimeter Module Equation .147 Table D-7. Estimated Uncertainties for Digital Multimeter Module Parameters 148 Table D-8. Estimated Uncertainties for Data Pro
39、cessor Module Parameters 151 Table D-9. Summary of Results for Load Measurement System Analysis .152 Table D-10. Specifications for 1785B DC Power Supply .154 Table D-11. Parameters used in Power Supply Error Model .155 Table D-12. Estimated Uncertainties for Power Supply Parameters .156 Table D-13.
40、 Estimated Uncertainties for Load Cell Parameters 156 Table D-14. Uncertainty in System Output versus Applied Load .158 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-xiii ACKNOWLEDGEMENTS The principal author of this publication is Ms. Suzanne Cast
41、rup of Integrated Sciences Group (ISG), Inc. of Bakersfield, CA under NASA Contract. Additional contributions and critical review were provided by: Scott M. Mimbs NASA Kennedy Space Center James Wachter, MEI Co., NASA Kennedy Space Center Charles P. Wright The Aerospace Corporation Dave Deaver Fluke
42、 Corporation Mihaela Fulop SGT, NASA Glenn Research Center, OH Roger Burton Honeywell International, Inc. Steve Lewis Lockheed Martin Mission Systems & Sensors Dr. James Salsbury Mitutoyo America Corporation This Publication would not exist without the recognition of a priority need by the NASA Metr
43、ology and Calibration Working Group and funding support by NASA/HQ/OSMA and NASA/Kennedy Space Center. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-xiv EXECUTIVE SUMMARY Manufacturer specifications are an important element of cost and quality cont
44、rol for testing, calibration and other measurement processes. They are used in the selection of measuring and test equipment (MTE) and in the establishment of suitable equipment substitutions for a given measurement application. In addition, manufacturer specifications are used to estimate bias unce
45、rtainties and establish tolerance limits for MTE attributes and parameters. MTE attributes and parameters are periodically calibrated to determine if they are in conformance with manufacturer specified tolerance limits. The elapsed-time or interval between calibrations is often based on in-tolerance
46、 or out-of-tolerance data acquired from periodic calibrations. Therefore, it is important that manufacturer specifications provide sufficient information about the MTE performance attributes and parameters and that the specifications are properly interpreted and applied in the establishment of test
47、tolerance limits or the estimation of measurement uncertainty. Manufacturers of complex instruments often include numerous time and range dependent specifications. And, since specification documents are also a means for manufacturers to market their products, they often contain additional informatio
48、n about features and operating condition limits that must be carefully reviewed and understood. Unfortunately, there are no universal guidelines or standards regarding the content and format of MTE specification documents. This is evident from the inconsistency in the manufacturer specifications for similar equipment. Some manufacturers provide specifications for individual performance parameters, while others provide a single specification for overall accuracy. Inconsistencies
