REG NASA-LLIS-0051-1991 Lessons Learned - Dry Well Transducer Installations are Susceptible to Inadvertent Removal Disposal of Contaminated Waste.pdf

上传人:diecharacter305 文档编号:1017705 上传时间:2019-03-21 格式:PDF 页数:2 大小:12.96KB
下载 相关 举报
REG NASA-LLIS-0051-1991 Lessons Learned - Dry Well Transducer Installations are Susceptible to Inadvertent Removal Disposal of Contaminated Waste.pdf_第1页
第1页 / 共2页
REG NASA-LLIS-0051-1991 Lessons Learned - Dry Well Transducer Installations are Susceptible to Inadvertent Removal Disposal of Contaminated Waste.pdf_第2页
第2页 / 共2页
亲,该文档总共2页,全部预览完了,如果喜欢就下载吧!
资源描述

1、Lessons Learned Entry: 0051Lesson Info:a71 Lesson Number: 0051a71 Lesson Date: 1991-12-27a71 Submitting Organization: KSCa71 Submitted by: David PenningtonSubject: Dry Well Transducer Installations are Susceptible to Inadvertent Removal; Disposal of Contaminated Waste Description of Driving Event: A

2、 hypergol technician erred in the removal of a temperature transducer from a 3-inch hypergol line at the “Pad A“ fuel farm, resulting in a major fuel spill and hypergol burns to himself. The installation design of the dry well and temperature transducer provides a means to remove the transducer from

3、 the system for replacement or calibration without having to “open“ the fluid volume. The dry well installation design is inadequate to preclude an untrained technician or a careless technician from inadvertently removing the dry well from the hypergol propellant line by mistake.Lesson(s) Learned: 1

4、 Adequate physical safeguards do not exist to prevent the inadvertent removal of dry wells/transducer installations from hazardous systems.2. Failure to test for hazardous levels of MMH within the sump tank, resulted in the release of contaminated waste water to the environment.Recommendation(s): 1

5、 Design of dry well/transducer installations should be modified to preclude the inadvertent removal of dry wells from hazardous systems.2. SPC-wide publicity should be given to the requirements for proper hazardous waste disposal and testing as contained in SPI SO-O37(4)KV.Evidence of Recurrence Co

6、ntrol Effectiveness: N/AProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Documents Related to Lesson: N/AMission Directorate(s): N/AAdditional Key Phrase(s): a71 Energetic Materials - Explosive/Propellant/Pyrotechnica71 Ground Operationsa71 Ground Equ

7、ipmenta71 Hazardous/Toxic Waste/Materialsa71 Human Factorsa71 Industrial Operationsa71 Packaging Handling Storagea71 Safety & Mission AssuranceAdditional Info: Approval Info: a71 Approval Date: 1994-06-01a71 Approval Name: James G. Klinea71 Approval Organization: KSC/HEIa71 Approval Phone Number: 407-867-7614Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

展开阅读全文
相关资源
猜你喜欢
  • BS QC 410204-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf BS QC 410204-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf
  • BS QC 410301-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf BS QC 410301-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf
  • BS QC 410302-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf BS QC 410302-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification sing.pdf
  • BS QC 410400-1992 Harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Sectional specification for rotary precision pote.pdf BS QC 410400-1992 Harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Sectional specification for rotary precision pote.pdf
  • BS QC 410402-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification rota.pdf BS QC 410402-1992 Specification for harmonized system of quality assessment for electronic components Potentiometers for use in electronic equipment Blank detail specification rota.pdf
  • BS QC 750106-1993 Specification for harmonized system of quality assessment for electronic components Semiconductor discrete devices Blank detail specification Field-effect transis.pdf BS QC 750106-1993 Specification for harmonized system of quality assessment for electronic components Semiconductor discrete devices Blank detail specification Field-effect transis.pdf
  • BS QC 750109-1994 Specification for harmonized system of quality assessment for electronic components Blank detail specification Rectifier diodes (including avalanche rectifier dio.pdf BS QC 750109-1994 Specification for harmonized system of quality assessment for electronic components Blank detail specification Rectifier diodes (including avalanche rectifier dio.pdf
  • BS QC 750113-1994 Specification for harmonized system of quality assessment for electronic components Blank detail specification reverse blocking triode thyristors ambient and case.pdf BS QC 750113-1994 Specification for harmonized system of quality assessment for electronic components Blank detail specification reverse blocking triode thyristors ambient and case.pdf
  • BS QC 750114-1996 Harmonized system of quality assessment for electronic components Semiconductor devices Discrete devices Field-effect transistors Blank detail specification for c.pdf BS QC 750114-1996 Harmonized system of quality assessment for electronic components Semiconductor devices Discrete devices Field-effect transistors Blank detail specification for c.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1