1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-23165-1 SANS 61000-4-14:2009Edition 1.2IEC 61000-4-14:2009Edition 1.2SOUTH AFRICAN NATIONAL STANDARD Electromagnetic compatibility (EMC) P
4、art 4-14: Testing and measurement techniques Voltage fluctuation immunity test for equipment with input current not xceeding 16 A per phase eThis national standard is the identical implementation of IEC 61000-4-14:2009 and is adopted with the permission of the International Electrotechnical Commissi
5、on Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 61000-4-14:2009 Edition 1.2 IEC 61000-4-14:2009 Edition 1.2 Table of changes Change No. Date Scope IEC amdt 1 2001 Amended to replace
6、clauses on climatic conditions and the evaluation of test results, and to add a test report. IEC amdt 2 2009 Amended to change the title of the standard, convert dated to undated references, replace clauses on test levels, replace a table on the characteristics of the test generator, replace and add
7、 figures relating to the test sequences of voltage fluctuations, and add a figure on test generator verification load. National foreword This South African standard was approved by National Committee SABS TC 73, Electromagnetic compatibility, in accordance with procedures of the SABS Standards Divis
8、ion, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in September 2009. This SANS document supersedes SANS 61000-4-14:2003 (edition 1.1 as modified by IEC amdt 2:2009). IEC 61000-4-14Edition 1.2 2009-08INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic c
9、ompatibility (EMC) Part 4-14: Testing and measurement techniques Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase Compatibilit lectromagntique (CEM) Partie 4-14: Techniques dessai et de mesure Essai dimmunit aux fluctuations de tension pour le matriel d
10、ont le courant dentre est infrieur ou gal 16 A par phase INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE CDICS 33.100.20 PRICE CODECODE PRIXISBN 2-8318-1049-3BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrote
11、chnical Commission Marque dpose de la Commission Electrotechnique Internationale SANS 61000-4-14:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 2 61000-4-14 IEC:1999+A1:2001 +A2:2009 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normat
12、ive references6 3 General 6 3.1 Effects of voltage fluctuations 6 3.2 Sources.7 4 Definitions 7 5 Test levels7 6 Test equipment.8 6.1 Test generator.8 6.2 Characteristics and performance of the test generator .9 6.3 Verification of the test generator 9 7 Test set-up .9 8 Test procedure .9 8.1 Climat
13、ic conditions.10 8.2 Execution of the test 10 9 Evaluation of test results.10 10 Test report11 Annex A (informative) Electromagnetic environment classes.16 Bibliography17 Figure 1a Test diagram 12 Figure 1b Example of a voltage step for falling voltage13 Figure 1c Example of a voltage step for risin
14、g voltage 13 Figure 1d Example of a complete voltage fluctuation.14 Figure 1 Example of test sequences of voltage fluctuations 14 Figure 2 Example of successive applications of voltage fluctuations14 Figure 3 Schematic (single-phase) of test instrumentation for voltage fluctuations, with power ampli
15、fier 15 Figure 4 Example of test generator verification load15 Table 1 Test levels.8 Table 2 Characteristics of the test generator.9 SANS 61000-4-14:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61000-4-14 IEC:1999+A1:2001 3 +A2:2009 IN
16、TERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-14: Testing and measurement techniques Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide o
17、rganization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activiti
18、es, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dea
19、lt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined
20、 by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
21、 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they
22、are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and
23、 the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they
24、have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature wha
25、tsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publi
26、cations is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Sta
27、ndard IEC 61000-4-14 has been prepared by subcommittee 77A: Low fre-quency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This standard forms part 4-14 of IEC 61000 series. It has the status of basic EMC publication in accordance with IEC Guide 107. This consolidated versio
28、n of IEC 61000-4-14 consists of the first edition (1999) documents 77A/263/FDIS and 77A/268/RVD, its amendment 1 (2001) documents 77B/291+293/FDIS and 77B/298+300/RVD and its amendment 2 (2009) documents 77A/669/CDV and 77A/685/RVC. The technical content is therefore identical to the base edition an
29、d its amendments and has been prepared for user convenience. It bears the edition number 1.2. SANS 61000-4-14:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 4 61000-4-14 IEC:1999+A1:2001 +A2:2009 A vertical line in the margin shows wher
30、e the base publication has been modified by amendments 1 and 2. The committee has decided that the contents of the base publication and its amendments will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specif
31、ic publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. SANS 61000-4-14:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61000-4-14 IEC:1999+A1:2001 5 +A2:2009 INTRODUCTION I
32、EC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limit
33、s Emission limits Immunity limits (insofar as these limits do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods an
34、d devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards, or as technical reports, some of which have already been published as sections. Others will be published with the part number followed by a dash
35、and a second number identifying the subdivision (example 61000-6-1). SANS 61000-4-14:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 6 61000-4-14 IEC:1999+A1:2001 +A2:2009 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-14: Testing and measur
36、ement techniques Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase 1 Scope This part of IEC 61000 is a basic electromagnetic compatibility (EMC) publication. It considers immunity tests for electrical and/or electronic equipment in their electromagnetic
37、environment. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial power supply networks. This part aims to establish a reference for evaluating the immunity of electric and electronic equipment when subjected to positive and negative low
38、amplitude voltage fluctuations. The voltage fluctuations considered by this standard do not include flicker, which is a physiological phenomenon due to lighting luminance fluctuations. This standard applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phas
39、e. It does not apply to electrical and/or electronic equipment connected to d.c. or a.c. 400 Hz distribution networks. Tests concerning these networks will be covered by other IEC standards. The immunity test levels required for a specific electromagnetic environment, together with the performance c
40、riteria, are indicated in the product, product family or generic standards as applicable. However, most product groups do not have a history of being susceptible to voltage fluctuations. Consequently, testing for these phenomena is often not required. 2 Normative references The following referenced
41、documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 16
42、1: Electro-magnetic compatibility IEC 60068-1, Environmental testing Part 1: General and guidance IEC 61000-2-4, Electromagnetic compatibility (EMC) Part 2: Environment Section 4: Compatibility levels in industrial plants for low-frequency conducted disturbances 3 General 3.1 Effects of voltage fluc
43、tuations Electrical and electronic equipment may be affected by voltage fluctuations. Examples of these effects include the following: degradation of performances in equipment using storage devices (e.g. capacitors); loss of function in control systems; SANS 61000-4-14:2009This s tandard may only be
44、 used and printed by approved subscription and freemailing clients of the SABS .61000-4-14 IEC:1999+A1:2001 7 +A2:2009 instability of internal voltages and currents in equipment; increased ripple. 3.2 Sources There is a significant number of domestic appliances in the low-voltage network. However, f
45、luctuations caused by these appliances are not generally significant. Fluctuations are mainly produced by a) continuously but randomly varying large loads such as: 1) resistance welding machines; 2) rolling mills; 3) large motors with varying loads; 4) arc furnaces; 5) arc welding plant; b) single o
46、n/off switching of loads (e.g. motors); c) step voltage changes (due to tap voltage regulators of transformers). These industrially produced fluctuations can affect a large number of consumers. Such equipment operates continuously or infrequently. The public supply network impedance has wide variati
47、ons, consequently the transmission of the disturbances will be different for different networks. 4 Definitions For the purpose of this part of IEC 61000, the following definitions and terms apply. They are applicable only to the field of voltage fluctuations; not all of them are included in IEC 6005
48、0(161). 4.1 immunity ability of a device, equipment or system to perform without degradation of performance in the presence of an electromagnetic disturbance IEV 161-01-20 4.2 voltage fluctuations series of voltage changes or a cyclic variation of the voltage envelope IEV 161-08-05 5 Test levels Thi
49、s test may apply to all equipment intended for connection to public networks, industrial networks and electricity plants that are likely to be sensitive to this type of disturbance. It can be assumed that step voltage changes are the most disturbing type of voltage fluctuations. The equipment under test (EUT) is initially operated using a steady supply voltage and is then subjected to repetitive step voltage changes according to figure 1a. The initial voltag
