1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-23146-0 SANS 61326-2-1:2009Edition 1 IEC 61326-2-1:2005Edition 1SOUTH AFRICAN NATIONAL STANDARD Electrical equipment for measurement, cont
4、rol and laboratory use EMC requirements Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications This national standard is the identical implementation of IEC 61326-2-1:2005, a
5、nd is adopted with the permission of the International Electrotechnical Commission. WARNING Can only be used in conjunction with SANS 61326-1. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS
6、 SANS 61326-2-1:2009 Edition 1 IEC 61326-2-1:2005 Edition 1 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS TC 73, Electromagnetic compatibility, in accordance with procedures of the SABS Standards Division, in compliance w
7、ith annex 3 of the WTO/TBT agreement. This SANS document was published in October 2009. NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 61326-2-1Premire ditionFirst edition2005-12Matriel lectrique de mesure, de commande et de laboratoire Exigences relatives la CEM Partie 2-1: Exigences particulires
8、 Configurations dessai, conditions fonctionnelles et critres de performance pour essai de sensibilit et quipement de mesures pour les applications non protges de la CEM Electrical equipment for measurement, control and laboratory use EMC requirements Part 2-1: Particular requirements Test configurat
9、ions, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2005 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publ
10、ication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanic
11、al, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRIC
12、E CODE H Commission Electrotechnique InternationaleInternational Electrotechnical Commission SANS 61326-2-1:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61326-2-1 IEC:2005 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRICAL EQUIPM
13、ENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications FOREWORD 1) The International Electrotechnical Commiss
14、ion (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in
15、addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee int
16、erested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance
17、with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all intereste
18、d IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible
19、for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence betwe
20、en any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All user
21、s should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or othe
22、r damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. U
23、se of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent
24、 rights. International Standard IEC 61326-2-1 has been prepared by subcommittee 65A: System aspects, of IEC technical committee 65: Industrial-process measurement and control. The IEC 61326 series cancels and replaces IEC 61326:2002 and constitutes a technical revision. SANS 61326-2-1:2009This s tan
25、dard may only be used and printed by approved subscription and freemailing clients of the SABS .61326-2-1 IEC:2005 5 The text of this standard is based on the following documents: FDIS Report on voting 65A/454/FDIS 65A/458/RVDFull information on the voting for the approval of this standard can be fo
26、und in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. It consists of the following parts, under the general title: Electrical equipment for measurement, control and laboratory use EMC requirements Part 1: Genera
27、l requirements (Annexes A and B of IEC 61326: 2002 are integrated in the main body of IEC 61326-1) Part 2-1: Sensitive test and measurement equipment for EMC unprotected applications (Annex D of IEC 61326:2002) Part 2-2: Portable test, measuring and monitoring equipment used in low-voltage distribut
28、ion systems (Annex E of IEC 61326:2002) Part 2-3: Transducers with integrated or remote signal conditioning (includes Annex F of IEC 61326:2002)1Part 2-4: Insulation monitoring devices according to IEC 61557-8 and for equipment for insulation fault location according to IEC 61557-9 1Part 2-5: Test c
29、onfigurations, operational conditions and performance criteria for field devices with interfaces according to communication profile Family 3 Profile 3/2 1Part 2-6: In vitro diagnostic (IVD) medical equipment Part 3-1: Immunity requirements for equipment performing or intended to perform safety relat
30、ed functions (functional safety) Part 3.1: General industrial applications (The matter of functional safety in Table 2 of IEC 61326:2002 is incorporated into IEC 61326-3-1)1The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicat
31、ed on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. 1 To be publishedSANS 61326-2-1:2009This s tandard may only be used and printed by approved s
32、ubscription and freemailing clients of the SABS .61326-2-1 IEC:2005 7 ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment
33、for EMC unprotected applications 1 Scope In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that
34、 are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and/or selects the appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include, but
35、 are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, digital multimeters (DMM) and board test systems. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited
36、 applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-161:1990, International Electrotechnical Vocabulary (IEV) Part 161: Electro-magnetic compatibility IEC 61326-1:2005, Electrical equipment for measurement, control and laborat
37、ory use EMC requirements Part 1: General requirements 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 61326-1 and IEC 60050(161) apply. 4 General IEC 61326-1 applies. 5 EMC test plan 5.1 General IEC 61326-1 applies. SANS 61326-2-1:2009This s tandard
38、may only be used and printed by approved subscription and freemailing clients of the SABS .61326-2-1 IEC:2005 9 5.2 Configuration of EUT during testing IEC 61326-1 applies, except as follows: Addition: 5.2.401 I/O ports for Test and Measurement purposes (T&M ports) Test and Measurement (T&M) input p
39、orts shall be capped and shorted unless this leads to an operating condition unsuitable for measuring the emission and immunity performance of the product. In this case, an appropriate input signal shall be applied. Test and Measurement (T&M) output ports not needed to evaluate the essential functio
40、ns of the EUT shall be capped and/or terminated. NOTE 1 Probes and/or test leads to be used with the test and measurement ports do not need to be connected. Such test leads can vary substantially from one application to another and are often connected to equipment that has the covers removed and may
41、 be in various stages of disassembly to provide access to test points inside. Connected test leads may increase emissions and/or reduce immunity in certain applications. NOTE 2 Capped means locally covered with a screen. 5.2.501 Auxiliary equipment Auxiliary equipment necessary for the normal operat
42、ion of the equipment under test (EUT) shall be included as part of the equipment to be tested 5.3 Operation conditions of EUT during testing IEC 61326-1 applies, except as follows: Addition: 5.3.101 Operational conditions When both battery and a.c. options are available, both modes of operation shal
43、l comply. 5.3.102 Oscilloscopes The oscilloscope ports shall be set for maximum sweep speed, maximum sensitivity and continuous acquisition mode unless other modes are known to provide worst-case emission or immunity results within normal applications. 5.3.103 Logic analysers The logic analyser shal
44、l be set for data analysis modes during emissions testing and continuous data acquisition mode during immunity testing unless other modes are known to provide worst-case emission or immunity results within normal applications. 5.3.104 Digital multimeters (DMM) Typical set-ups include: peak detect, m
45、aximum sensitivity (usually auto-range, if available, will suffice) and continuous acquisition mode. SANS 61326-2-1:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61326-2-1 IEC:2005 11 5.3.105 Other equipment For equipment not mentioned
46、in 5.3.102 to 5.3.104, the following philosophy shall apply. A selection of representative operation modes shall be made, taking into account that not all functions, but only the most typical functions of the equipment can be tested. The estimated worst-case operating modes for normal application sh
47、all be selected 5.4 Specification of performance criteria IEC 61326-1 applies. 5.5 Test description IEC 61326-1 applies. 6 Immunity requirements 6.1 Conditions during the tests IEC 61326-1 applies. 6.2 Immunity test requirements IEC 61326-1 applies, except as follows: Addition: 6.2.101 Tests with tr
48、ansient electromagnetic phenomenon During testing, the EUT may have temporary degradation or loss of function or performance which is self-recovering. Self-recovery times greater than 10 s shall be specified by the manufacturer. Trigger functions shall not be evaluated. No change in actual operating
49、 state or loss of stored data is allowed. Electrostatic discharges shall be applied to the housing shield, but not to the inner pins of shielded port or cable connectors. Examples include: BNC, D-subminiature, IEEE 488 (GPIB), RS232 and IEEE 1284-B (parallel printer port), etc. 6.2.102 Tests with continuously present electromagnetic phenomenon No visual degradation of parameters of the EUT is allowed during application of the test
