1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-23159-0 SANS 61326-2-5:2009Edition 1IEC 61326-2-5:2006Edition 1SOUTH AFRICAN NATIONAL STANDARD Electrical equipment for measurement, contr
4、ol and laboratory use EMC requirements Part 2-5: Particular requirements Test configurations, operational conditions and performance criteria for field devices with interfaces according to IEC 61784-1, CP 3/2 This national standard is the identical implementation of IEC 61326-2-5:2006 and is adopted
5、 with the permission of the International Electrotechnical Commission WARNING Can only be used in conjunction with SANS 61326-1. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 61326-2-
6、5:2009 Edition 1 IEC 61326-2-5:2006 Edition 1 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS TC 73, Electromagnetic compatibility, in accordance with procedures of the SABS Standards Division, in compliance with annex 3 of
7、 the WTO/TBT agreement. This SANS document was published in October 2009. NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 61326-2-5Premire ditionFirst edition2006-06Matriel lectrique de mesure, de commande et de laboratoire Exigences relatives la CEM Partie 2-5: Exigences particulires Configuration
8、s dessai, conditions de fonctionnement et critres daptitude la fonction pour les dispositifs en exploitation avec des interfaces conformes la CEI 61784-1, CP 3/2 Electrical equipment for measurement, control and laboratory use EMC requirements Part 2-5: Particular requirements Test configurations, o
9、perational conditions and performance criteria for field devices with interfaces according to IEC 61784-1, CP 3/2 Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2006 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tr
10、e reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including phot
11、ocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE J Commissio
12、n Electrotechnique InternationaleInternational Electrotechnical Commission SANS 61326-2-5:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61326-2-5 IEC:2006 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRICAL EQUIPMENT FOR MEASUREMEN
13、T, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-5: Particular requirements Test configurations, operational conditions and performance criteria for field devices with interfaces according to IEC 61784-1, CP 3/2 FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide orga
14、nization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities,
15、 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt
16、with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by
17、 agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3)
18、 IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are
19、 used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and th
20、e corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they hav
21、e the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatso
22、ever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publicat
23、ions is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standa
24、rd IEC 61326-2-5 has been prepared by subcommittee 65A: System aspects, of IEC technical committee 65: Industrial-process measurement and control. The IEC 61326 series cancels and replaces IEC 61326:2002 and constitutes a technical revision. SANS 61326-2-5:2009This s tandard may only be used and pri
25、nted by approved subscription and freemailing clients of the SABS .61326-2-5 IEC:2006 5 The text of this standard is based on the following documents: FDIS Report on voting 65A/474/FDIS 645A/479/RVD Full information on the voting for the approval of this standard can be found in the report on voting
26、 indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This part of IEC 61326 is to be used in conjunction with IEC 61326-1 and follows the same numbering of clauses, subclauses, tables and figures as that standard. IEC 61326 consists of t
27、he following parts, under the general title Electrical equipment for measurement, control and laboratory use EMC requirements: Part 1: General requirements Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipm
28、ent for EMC unprotected applications Part 2-2: Particular requirements Test configurations, operational conditions and performance criteria for portable test, measuring and monitoring equipment used in low-voltage distribution systems Part 2-3: Particular requirements Test configuration, operational
29、 conditions and performance criteria for transducers with integrated or remote signal conditioning Part 2-4: Particular requirements Test configurations, operational conditions and performance criteria for insulation monitoring devices according to IEC 61557-8 and for equipment for insulation fault
30、location according to IEC 61557-9 Part 2-5: Particular requirements Test configurations, operational conditions and performance criteria for field devices with interfaces according to IEC 61784-1, CP 3/2 Part 2-6: Particular requirements In vitro diagnostic (IVD) medical equipment Part 3-1: Immunity
31、 requirements for equipment performing or intended to perform safety-related functions (functional safety) General industrial applications The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http
32、:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. SANS 61326-2-5:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61
33、326-2-5 IEC:2006 7 ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-5: Particular requirements Test configurations, operational conditions and performance criteria for field devices with interfaces according to IEC 61784-1, CP 3/2 1 Scope In addition to the re
34、quirements of IEC 61326-1, this part of IEC 61326 treats the particular features for EMC testing of field devices with interfaces according to IEC 61784-1, CP 3/2. This part of IEC 61326 covers only the field-bus interface of the equipment. NOTE The other functions of the equipment are covered by ot
35、her parts of the IEC 61326 series. This part of IEC 61326 refers only to field devices intended for use in process control and process measuring. For interface operation and the interface parameters, this part of IEC 61326 is in accordance with IEC 61784-1, CP 3/2. That standard specifies a set of p
36、rotocol specific communication profiles based on the IEC 61158 series. The manufacturer specifies the environment for which the product is intended to be used and/or selects the appropriate test level specifications of IEC 61326-1. 2 Normative references The following referenced documents are indisp
37、ensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. Clause 2 of IEC 61326-1 applies, except as follows: Addition: IEC 61326-1:2005, Electrical equ
38、ipment for measurement, control and laboratory use EMC requirements Part 1: General requirements IEC 61158 (all parts), Digital data communications for measurement and control Field-bus for use in industrial control systems IEC 61158-2, Digital data communications for measurement and control Field-b
39、us for use in industrial control systems Part 2 :Physical layer specification and service definition IEC 61158-3, Digital data communications for measurement and control Field-bus for use in industrial control systems Part 3 :Data link service definition SANS 61326-2-5:2009This s tandard may only be
40、 used and printed by approved subscription and freemailing clients of the SABS .61326-2-5 IEC:2006 9 IEC 61158-5, Digital data communications for measurement and control Field-bus for use in industrial control systems Part 5 : Application layer service definition IEC 61158-6, Digital data communicat
41、ions for measurement and control Field-bus for use in industrial control systems Part 6 : Application layer protocol specification IEC 61784 (all parts1), Digital data communications for measurement and control IEC 61784-1, Digital data communications for measurement and control Part 1 : Profile set
42、s for continuous and discrete manufacturing relative to fieldbus use in industrial control systems 3 Terms and definitions Clause 3 of IEC 61326-1 applies. 4 General Clause 4 of IEC 61326-1 applies. 5 EMC test plan 5.1 General Subclause 5.1 of IEC 61326-1 applies. 5.2 Configuration of EUT during tes
43、ting Subclause 5.2 of IEC 61326-1 is applicable, except as follows: Addition: 5.2.101 Test configuration In order to assign any malfunction of the communication during the EMC test to the EUT, the configuration of field devices with interfaces according to IEC 61784-1, CP 3/2, shall be limited to th
44、e operation of one master and one slave (EUT) during EMC type tests. For the slave, auxiliary connections for power supply or signalling are possible. The slave is connected via a three-port field distributor with the signal coupler. The signal coupler is connected to the automation system. A standa
45、rdized field-bus terminator is attached at the third port of the field distributor. The components EUT, signal coupler, field distributor and terminator are connected by means of a standardized field-bus cable. 1Other parts are under consideration. SANS 61326-2-5:2009This s tandard may only be used
46、and printed by approved subscription and freemailing clients of the SABS .61326-2-5 IEC:2006 11 The shield shall be connected at any individual component by a low-impedance grounding strip (connection between the shield and the case with a large surface). The individual cable lengths L1, L2, L3 orig
47、inate from a practice-adjusted setup, such as the one given in Figure 101. The cable length L4 should be in the range of 8 m, in the case where the respective basic standards do not specify other lengths. The cable installation shall be in accordance with the appropriate basic standard. The connecti
48、on of the shield at the shield grounding point may be produced by partially removing the isolation of the cable shield and fixing the cable shield with a metal clamp or by means of conductive leading-in conductors such as a metallic cable gland at the ground plane or at the shielding metal wall, res
49、pectively. The location and execution of the shield grounding point depends on the given test facility; for example, by use of an anechoic chamber or a shielded cabin, it is the metal wall penetration; and with tests on tables with ground plane the shield grounding point is on the ground plane. 5.2.102 Connection line A standard bus cable type A shall be used as the communication line (see 11.
