1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-21614-6 SANS 62129:2008Edition 1IEC 62129:2006Edition 1SOUTH AFRICAN NATIONAL STANDARD Calibration of optical spectrum analyzers This nati
4、onal standard is the identical implementation of IEC 62129:2006 and is adopted with the permission of the International Electrotechnical Commission. Published by Standards South Africa 1 dr lategan road groenkloof private bag x191 pretoria 0001 tel: 012 428 7911 fax: 012 344 1568 international code
5、+ 27 12 www.stansa.co.za Standards South Africa SANS 62129:2008 Edition 1 IEC 62129:2006 Edition 1 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee StanSA SC 74A, Communication technology Fibre optics, in accordance with procedur
6、es of Standards South Africa, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in August 2008. NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 62129Premire ditionFirst edition2006-01Etalonnage des analyseurs de spectre optique Calibration of optical spectrum ana
7、lyzers Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2006 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compr
8、is la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Co
9、mmission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE XA Commission Electrotechnique InternationaleInternational Electrotechnical Commission SANS 6219:2008This s tandard ma
10、y only be used and printed by approved subscription and freemailing clients of the SABS .62129 IEC:2006 3 CONTENTS FOREWORD.7 1 Scope.11 2 Normative references11 3 Terms and definitions .13 4 Calibration test requirements 21 4.1 Preparation21 4.2 Reference test conditions 21 4.3 Traceability21 5 Res
11、olution bandwidth (spectral resolution) test23 5.1 Overview .23 5.2 Resolution bandwidth (spectral resolution) test.23 6 Displayed power level calibration 27 6.1 Overview .27 6.2 Displayed power level (DPL) calibration under reference conditions29 6.3 Displayed power level (DPL) calibration for oper
12、ating conditions 33 6.4 Calculation of expanded uncertainty in displayed power level .43 7 Wavelength calibration45 7.1 Overview .45 7.2 Wavelength calibration under reference conditions.47 7.3 Wavelength calibration for operating conditions49 7.4 Calculation of expanded uncertainty in wavelength.53
13、 8 Documentation .55 8.1 Measurement data and uncertainty 55 8.2 Measurement conditions 55 Annex A (normative) Mathematical basis for calculation of calibration uncertainty 57 Annex B (informative) Examples of calculation of calibration uncertainty65 Annex C (informative) Using the calibration resul
14、ts81 Annex D (informative) Wavelength references .91 Annex E (informative) Further reading and references for calibration of wavelength scale 101 Figure 1 Setup using a gas laser whose wavelength is known .23 Figure 2 Setup using a broadband source with a transmission device23 Figure 3 Setup using a
15、n LD with an unknown wavelength25 Figure 4 Setup for calibration of displayed power level under reference conditions 29 Figure 5 Test configuration for determining the wavelength dependence of displayed power level uncertainty33 SANS 6219:2008This s tandard may only be used and printed by approved s
16、ubscription and freemailing clients of the SABS .62129 IEC:2006 5 Figure 6 Test configuration for determining the polarization dependence of displayed power level uncertainty37 Figure 7 Configuration for testing linearity error of displayed power level uncertainty.39 Figure 8 Test configuration for
17、determining the temperature dependence of displayed power level uncertainty41 Figure 9 Test configuration for determining the temperature dependence of wavelength uncertainty53 Figure A.1 Deviation and uncertainty type B, and how to replace both with an appropriately larger uncertainty .59 95 % conf
18、idence intervals shown.89 Figure C.1 Calibration of OSA wavelength scale using krypton emission lines .89 Figure D.1 Absorption of LED light by acetylene (12C2H2) .95 Figure D.2 Absorption of LED light by hydrogen cyanide (H13C14N).97 Table 1 Recommended light sources 25 Table C.1 OSA calibration re
19、sults.87 Table C.2 Summary of OSA calibration parameters 89 Table D.1 Vacuum wavelengths (nm) of selected gas laser lines.91 Table D.2 Vacuum wavelengths (nm) of noble gas reference lines 91 Table D.3 Vacuum wavelengths (nm) for the 1+3band of acetylene 12C2H2absorption lines 1193 Table D.4 Vacuum w
20、avelengths (nm) for the 1+3band of acetylene 13C2H2absorption lines 1195 Table D.5 Vacuum wavelengths (nm) of selected hydrogen cyanide (H13C14N) absorption lines 1297 SANS 6219:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .62129 IEC:20
21、06 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CALIBRATION OF OPTICAL SPECTRUM ANALYZERS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC
22、is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) a
23、nd Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with th
24、e IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly
25、 as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that s
26、ense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees u
27、ndertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedur
28、e to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents
29、including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or
30、reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of t
31、he elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62129 has been prepared by IEC technical committee 86: Fibre optics. IEC 62129 cancels and replaces IEC/PAS 62129, publ
32、ished in 2004, and constitutes a technical revision. The text of this standard is based on the following documents: FDIS Report on voting 86/245/FDIS 86/250/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This pu
33、blication has been drafted in accordance with the ISO/IEC Directives, Part 2. SANS 6219:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .62129 IEC:2006 9 The committee has decided that the contents of this publication will remain unchanged
34、 until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. SANS 6219:2008This s tandard may only be used and p
35、rinted by approved subscription and freemailing clients of the SABS .62129 IEC:2006 11 CALIBRATION OF OPTICAL SPECTRUM ANALYZERS 1 Scope This International Standard provides procedures for calibrating an optical spectrum analyzer designed to measure the power distribution of an optical spectrum. Thi
36、s analyzer is equipped with an input port for use with a fibre-optic connector. An optical spectrum analyzer is equipped with the following minimum features: a) the ability to present a display of an optical spectrum with respect to absolute wavelength; b) a marker/cursor that displays the optical p
37、ower and wavelength at a point on the spectrum display. NOTE This standard applies to optical spectrum analyzers developed for use in fibre-optic communications, and is limited to equipment that can directly measure the optical spectrum output from an optical fibre, where the optical fibre is connec
38、ted to an input port installed in the optical spectrum analyzer through a fibre-optic connector. In addition, an optical spectrum analyzer can measure the spectral power distribution with respect to the absolute wavelength of the tested light and display the results of such measure-ments. It will no
39、t include an optical wavelength meter that measures only centre wavelengths, a Fabry-Perot interferometer or a monochromator that has no display unit. The procedures outlined in this standard are considered to be mainly performed by users of optical spectrum analyzers. The document, therefore, does
40、not include correction using the calibration results in the main body. The correction procedures are described in Annex C. Of course, this standard will be useful in calibration laboratories and for manufacturers of optical spectrum analyzers. 2 Normative references The following referenced document
41、s are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-731, International Electrotechnical Vocabulary (IEV) Chapter 731: Optica
42、l fibre communication IEC 60359, Electrical and electronic measurement equipment Expression of performance IEC 60793-1 (all parts), Optical fibres Part 1: Measurement methods and test procedures IEC 60825-1, Safety of laser products Part 1: Equipment classification, requirements and users guide IEC
43、60825-2, Safety of laser products Part 2: Safety of optical fibre communication systems IEC 61290-3-1, Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method SANS 6219:2008This s tandard may only be used and printed by approved subscription and freemailing
44、 clients of the SABS .62129 IEC:2006 13 BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, and OIML:1993, International vocabulary of basic terms in metrology (VIM) BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, and OIML, Guide to the expression of uncertainty in measurement (GUM) 3 Terms and definitions For the purposes of
45、this document, the terms and definitions contained in IEC 60050-731 and the following terms and definitions apply. 3.1 calibration set of operations which establishes, under specified conditions, the relationship between the values indicated by the measuring instrument and the corresponding known va
46、lues of that quantity (see also VIM, definition 6.11) 3.2 calibration under reference conditions calibration which includes the evaluation of the test analyzer uncertainty under reference conditions (3.17) 3.3 calibration for operating conditions the calibration for operating conditions of an optica
47、l spectrum analyzer (3.16) including the evaluation of the test analyzer operational uncertainty 3.4 centre wavelength centrethe power-weighted mean wavelength of a light source in a vacuum, in nanometers (nm) For a continuous spectrum the centre wavelength is defined as: centre = (1 / Ptotal ) () d
48、 (1) For a spectrum consisting of discrete lines, the centre wavelength is defined as: centre= / iiiiiPP (2) where () is the power spectral density of the source, for example in W/nm; iis the ithdiscrete wavelength; Pi is the power at i, for example, in watts; Ptotal is Pi= total power, for example,
49、 in watts. NOTE The above integrals and summations theoretically extend over the entire spectrum of the light source. 3.5 confidence level an estimation of the probability that the true value of a measured parameter lies in the given range (see expanded uncertainty (3.11) SANS 6219:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS
