SIS 73 42 12-1960 Sectional feature subdivision Code marks《部分细分的功能 代码标记》.pdf

相关资源

IRS 70778-2-2018 Recommendations for determining the carrying capacity and fatigue risks of existing metallic railway bridges.pdf

IRS 70712-2018 Rail defects.pdf

IRS 50596-6-2018 Conditions for coding intermodal loading units in combined transport combined transport lines and wagons.pdf

IRS 50596-5-2018 Transport of road vehicles on wagons-Technical Organisation-Conveyance of semi-trailers with P coding or N coding on recess wagons.pdf

IESNA TM-23-2017 Lighting Control Protocols.pdf

IESNA RP-2-2017 Recommended Practice for Retail Lighting.pdf

ITU-R RAPPORT M 766-2 FRENCH-1990 Feasibility of frequency sharing between the GPS and other services《全球定位系统和其他服务之间的频率共享的可行性》.pdf

ITU-R RAPPORT M 763-3 FRENCH-1990 Signal level variation due to multipath effects and blockage by ship-s superstructure in maritime mobile-satellite service lin.pdf

ITU-R RAPPORT M 739-1 FRENCH-1986 Interference due to intermodulation products in the land mobile service between 25 and 100 MHz《由于互调产物在陆地移动服务25和100 MHz之间产生的干扰》.pdf

ITU-R RAPPORT M 319-7 FRENCH-1990 Characteristics of equipment and principles governing the assignment of frequency channels between 25 and 100 MHz for land mob.pdf

猜你喜欢

JEDEC JEP143C-2012 Solid-State Reliability Assessment and Qualification Methodologies.pdf

JEDEC JEP144A-2011 Guideline for Internal Gas Analysis for Microelectronic Packages.pdf

JEDEC JEP145-2003 Guideline for Assessing the Current-Carrying Capability of the Leads in a Power Package System《在动力机组系统中评估引线电路载体容量的指南》.pdf

JEDEC JEP146A-2009 Guidelines for Supplier Performance Rating.pdf

JEDEC JEP147-2003 Procedure for Measuring Input Capacitance Using a Vector Network Analyzer (VNA)《使用适量网络分析(VNA)测试输入电容的程序》.pdf

JEDEC JEP148B-2014 Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment.pdf

JEDEC JEP149-2004 Application Thermal Derating Methodologies《热减额法应用》.pdf

JEDEC JEP150 01-2013 Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Components (Minor revision of JEP150 May 2005 Re.pdf

JEDEC JEP151-2015 Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices.pdf