1、 TIA DOCUMENT OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test TIA-526-27 JULY 1998 TELECOMMUNICATIONS INDUSTRY ASSOCIATION The Telecommunications Industry Association represents the communications sector of NOTICE TIA Engineering Standards and Publications are designed to serve
2、the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for their particular need. The existence of such P
3、ublications shall not in any respect preclude any member or non-member of TIA from manufacturing or selling products not conforming to such Publications. Neither shall the existence of such Documents preclude their voluntary use by non-TIA members, either domestically or internationally. TIA DOCUMEN
4、TS TIA Documents contain information deemed to be of technical value to the industry, and are published at the request of the originating Committee without necessarily following the rigorous public review and resolution of comments which is a procedural part of the development of a American National
5、 Standard (ANS). Further details of the development process are available in the TIA Engineering Manual, located at http:/www.tiaonline.org/standards/sfg/engineering_manual.cfm TIA Documents shall be reviewed on a five year cycle by the formulating Committee and a decision made on whether to reaffir
6、m, revise, withdraw, or proceed to develop an American National Standard on this subject. Suggestions for revision should be directed to: Standards they may serve as warnings of some potential problems. They may also be useful for reliability design improvements . 6.2 Fail Criteria The system fails
7、the test if any of the following occur: Any parameters exceed the suppliers specifications as measured during the test or at its end Any circuit packs require replacement due to performance degradation (outside the suppliers specifications) or total failure, as determined by the systems internal dia
8、gnostics or by parametric measurements made during the test or at its end 0 Protection switching automatically occurs as a result of any internally detected problem. 10 TINEIA-526-27 7 Documentation 7.1 Reporting requirements Report the following information for each test: 7.1.1 Date of test 7.1.2 P
9、rocedure used for test (OFSTP-6) 7.1.3 SUT identification SUT Identification. The SUT shall be identified by manufacturer name, product name, application speed (e.g., OC-12), and serial code (if available). 7.1.4 Test results Test results documented in the report shall include parameters measured be
10、fore, during, and after the temperature-cycle test, and how the measurements compared to the pass/fail criteria. A statement of whether the criteria are met (see 6.2) shall also be included. 7.2 US military applications United States military applications require that the following information also
11、be reported for each test. For other (nonmilitary) applications, this information need not be reported but shall be available for review upon request. 7.2.1 Test personnel 7.2.2 Test equipment and date of latest calibration 8 Specification information The following information shall be specified in
12、the Detail Specification for the SUT: 11 STD-EIA TIA-526-27-ENGL 1998 m 3234600 Ob04102 2b0 m TINEIA-526-27 8.1 Product Specifications Obtain the following test conditions and other information from the Detail Specification for the SUT: 0 System voltage and/or current requirements 0 Data rate and in
13、put signal characteristics 0 Inputloutput measurement conditions: - minimum and maximum wavelength - minimum and maximum transmitter optical power - transmitter and receiver mating connector types - receiver sensitivity requirements (minimum and maximum receiver - maximum spectral width - maximum di
14、spersal limit - maximum back reflection limit. input) Environmental operating conditions (.e., minimum and-maximum temperature limits, maximum humidity limit, and maximum temperature change rate, if applicable) with and/or without the cover installed Special services such as cooling fans Minimum and
15、 maximum transmission distance over a specific type of transmission medium. 8.2 Procedure references Obtain the following test conditions and other information from the Detail Specification for the SUT: Include a reference to this test procedure if it is to be used. 8.3 Exceptions or deviations Note
16、 any exceptions or deviations that apply to this test procedure. 12 8.4 Acceptance or failure criteria The equipment suppier and its customers should have accumulated sufficient experience performing system testing to develop a reasoned judgment regarding the degree of confidence on the pasdfail cri
17、teria. Additional thoughts should be spent on the system configurations and specific applications. 13 STD-EIA TIA-526-27-ENGL 1998 3234b00 0604104 033 TINEIA-526-27 ANNEX Comparison Between This OFSTP and IEC, ISO, or CCITT Requirements (Nonmandatory Information) A.1 IEC It should be noted that, as
18、of this publication date, there are no known IEC test methods comparable to this OFSTP. A.2 IS0 It should be noted that, as of this publication date, there are no known IS0 test methods comparable to this OFSTP. A.3 CCITT It should be noted that, as of this publication date, there are no known CCITT
19、 test methods comparable to this OFSTP. 14 - STD.EIA TIA-526-27-ENGL 1778 3234600 Ob04305 T7T TINE IA-526-27 . Annex A Comparison between this OFSTP and IEC or ITU-T requirements TIAS FO-2 and FO-6 Committees and their various subcommittess have an established policy of making every reasonable effor
20、t to “harmonize“ their test methods with those published by IEC (International Electrotechnical Commission) and ITU-T (International Telecommunication Union- Telecommunication Standardization Sector). A.1 IEC As of the date of the final ballot for this OFSTP, there are no known test methods in IEC c
21、omparable to it. A.2 ITU-T As of the date of the final ballot for this OFSTP, there are no known test methods in ITU-T comparable to it. 15 TINEIA-526-27 Referen ces “T.S. Frank Lee, “Results of Accelerated Life Tests on a Fiber Optic System Designed for Loop Applications“, Proceedings of the National Fiber Optic Engineering Conference (NFOEC), (7 99 7). GR-4 18-CORE, %eneric Reliability Assurance Requirements for Fiber Optic Transport Systems“, Issue 7 (Bellcore 7 997). . 16
