UL 859 CRD-2016 UL Standard for Safety Household Electric Personal Grooming Appliances - Section Paragraph Reference 43 3 Subject Input Averaging (Edition 11 June 20 2012).pdf

上传人:diecharacter305 文档编号:1068991 上传时间:2019-04-02 格式:PDF 页数:2 大小:12.53KB
下载 相关 举报
UL 859 CRD-2016 UL Standard for Safety Household Electric Personal Grooming Appliances - Section  Paragraph Reference 43 3 Subject Input Averaging (Edition 11 June 20 2012).pdf_第1页
第1页 / 共2页
UL 859 CRD-2016 UL Standard for Safety Household Electric Personal Grooming Appliances - Section  Paragraph Reference 43 3 Subject Input Averaging (Edition 11 June 20 2012).pdf_第2页
第2页 / 共2页
亲,该文档总共2页,全部预览完了,如果喜欢就下载吧!
资源描述

1、UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULUNDERWRITERS LABORATORIES INC. CERTIFICATION REQUIREMENT DECISIONThis Certification Requirement Decision is prepared and published by Underwriters Laboratories Inc.(UL). It is normative for the a

2、pplicable UL Product Certification Program(s); however, it is currently notpart of the UL Standard(s) referenced below.Product Category (CCN): QGRWStandard Number: UL 859Standard Title: Standard for Household Electric Personal Grooming AppliancesEdition Date: June 20, 2012Edition Number: 11Section /

3、 Paragraph Reference: 43.3Subject: Input AveragingDECISION:43.3 The power input to the appliance is to be measured with the appliance at operating temperatureunder full-load conditions, and while connected to a circuit of a voltage in accordance with 44.1.13. Controlswitches or the equivalent, if pr

4、ovided, are to be set to give the maximum power input. For an appliancehaving a preheat cycle of operation as defined in 5.33, the maximum input value measured during thepreheat cycle, with the appliance at room temperature at the beginning of the measurement, is to be usedto determine compliance wi

5、th the requirement specified in 43.1.Exception No. 1: The power input of an appliance that uses a positive temperature coefficient (PTC)heating element shall be measured 1 minute after it has become energized.Exception No. 2: For appliances employing a positive temperature coefficient (PTC) heating

6、element, ifpower input cannot be measured at 1 minute, the power input is determined as the mean value of thepower input occurring during a 30-minute representative period. Compliance of 43.1 is based oncalculated mean wattage.RATIONALE FOR DECISION:PTC heating elements generate a nonlinear input ov

7、er time due to the characteristic temperature versusresistance curves. Therefore it may not possible to measure a stable PTC inputs at 1 minute. Use ofelectronic controls with step functions may cause varying inputs over the 30 minute period requiring anaverage to be measured so that the measurement

8、 is not taken during a low or OFF state of the element.Measurement by input averaging has recently been adopted by IEC 60335-2-23, the IEC Standard forParticular requirements for appliances for skin or hair care, in order to address these considerations withthe intent of measurement of a more repres

9、entative input of the appliance.Copyright 2016 Underwriters Laboratories Inc.UL, in performing its functions in accordance with its objectives, does not guarantee or warrant thecorrectness of Certification Requirement Decisions it may issue or that they will be recognized or adoptedby anyone. Certif

10、ication Requirement Decisions are the opinion of Underwriters Laboratories Inc. inpractically applying the requirements of the standard. They do not represent formal interpretations of thestandard under American National Standards Institute (ANSI) processes. UL shall not be responsible toanyone for

11、the use of or reliance upon Certification Requirement Decisions by anyone. UL shall not incurany obligation or liability for damages, including consequential damages, arising out of or in connectionwith the use or reliance upon Certification Requirement Decisions. The electronic version of theCertif

12、ication Requirement Decision is the current version and previously printed copies may be outdated.UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULThis document is published as a service to ULs certification customersSTANDARD NUMBER: UL 859 -2-

展开阅读全文
相关资源
猜你喜欢
  • EN 60749-19-2003 en Semiconductor devices C Mechanical and climatic test methods Part 19 Die shear strength (Incorporating Corrigendum June 2003 Incorporates Amendment A1 2010)《半导体.pdf EN 60749-19-2003 en Semiconductor devices C Mechanical and climatic test methods Part 19 Die shear strength (Incorporating Corrigendum June 2003 Incorporates Amendment A1 2010)《半导体.pdf
  • EN 60749-2-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 2 Low Air Pressure《半导体器件 机械和气候试验方法 第2部分 低气压 IEC 60749-2-2002 部分替代 EN 60749 1999+A1-2000+A2-2001》.pdf EN 60749-2-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 2 Low Air Pressure《半导体器件 机械和气候试验方法 第2部分 低气压 IEC 60749-2-2002 部分替代 EN 60749 1999+A1-2000+A2-2001》.pdf
  • EN 60749-20-1-2009 en Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the com.pdf EN 60749-20-1-2009 en Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the com.pdf
  • EN 60749-20-2009 en Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering .pdf EN 60749-20-2009 en Semiconductor devices - Mechanical and climatic test methods - Part 20 Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering .pdf
  • EN 60749-21-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability《半导体器件 机械和气候试验方法 第21部分 可焊性》.pdf EN 60749-21-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability《半导体器件 机械和气候试验方法 第21部分 可焊性》.pdf
  • EN 60749-22-2003 en Semiconductor devices - Mechanical and climatic test methods Part 22 Bond strength《半导体器件 机械和气候试验方法 第22部分 粘结强度 IEC 60749-22-2002》.pdf EN 60749-22-2003 en Semiconductor devices - Mechanical and climatic test methods Part 22 Bond strength《半导体器件 机械和气候试验方法 第22部分 粘结强度 IEC 60749-22-2002》.pdf
  • EN 60749-23-2004 en Semiconductor devices C Mechanical and climatic test methods Part 23 High temperature operating life (Incorporates Amendment A1 2011)《半导体器件 机械和气候试验方法 第23部分 高温操作.pdf EN 60749-23-2004 en Semiconductor devices C Mechanical and climatic test methods Part 23 High temperature operating life (Incorporates Amendment A1 2011)《半导体器件 机械和气候试验方法 第23部分 高温操作.pdf
  • EN 60749-24-2004 en Semiconductor devices Mechanical and climatic test methods Part 24 Accelerated moisture resistance Unbiased HAST《半导体器件 机械和气候试验方法 第24部分 加速抗湿性 无偏HAST IEC 60749-24.pdf EN 60749-24-2004 en Semiconductor devices Mechanical and climatic test methods Part 24 Accelerated moisture resistance Unbiased HAST《半导体器件 机械和气候试验方法 第24部分 加速抗湿性 无偏HAST IEC 60749-24.pdf
  • EN 60749-25-2003 en Semiconductor devices Mechanical and climatic test methods Part 25 Temperature cycling《半导体器件 机械和气候试验方法 第25部分 温度循环 IEC 60749-25-2003》.pdf EN 60749-25-2003 en Semiconductor devices Mechanical and climatic test methods Part 25 Temperature cycling《半导体器件 机械和气候试验方法 第25部分 温度循环 IEC 60749-25-2003》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1