UL SUBJECT 2570-2008 OUTLINE OF INVESTIGATION FOR PART 6 LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONS ELECTRONIC CURRENT LIMITERS (ECL) (Issue 1)《第6部分 能经受低压浪涌的通信用电子流限制器调查大纲 发布编号 .pdf

上传人:testyield361 文档编号:1069308 上传时间:2019-04-02 格式:PDF 页数:4 大小:14.09KB
下载 相关 举报
UL SUBJECT 2570-2008 OUTLINE OF INVESTIGATION FOR PART 6 LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONS ELECTRONIC CURRENT LIMITERS (ECL) (Issue 1)《第6部分 能经受低压浪涌的通信用电子流限制器调查大纲 发布编号 .pdf_第1页
第1页 / 共4页
UL SUBJECT 2570-2008 OUTLINE OF INVESTIGATION FOR PART 6 LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONS ELECTRONIC CURRENT LIMITERS (ECL) (Issue 1)《第6部分 能经受低压浪涌的通信用电子流限制器调查大纲 发布编号 .pdf_第2页
第2页 / 共4页
UL SUBJECT 2570-2008 OUTLINE OF INVESTIGATION FOR PART 6 LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONS ELECTRONIC CURRENT LIMITERS (ECL) (Issue 1)《第6部分 能经受低压浪涌的通信用电子流限制器调查大纲 发布编号 .pdf_第3页
第3页 / 共4页
UL SUBJECT 2570-2008 OUTLINE OF INVESTIGATION FOR PART 6 LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONS ELECTRONIC CURRENT LIMITERS (ECL) (Issue 1)《第6部分 能经受低压浪涌的通信用电子流限制器调查大纲 发布编号 .pdf_第4页
第4页 / 共4页
亲,该文档总共4页,全部预览完了,如果喜欢就下载吧!
资源描述

1、UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULMarch 6, 20081SUBJECT 2570OUTLINE OF INVESTIGATIONFORPART 6: LOW-VOLTAGE SURGE WITHSTAND TELECOMMUNICATIONSELECTRONIC CURRENT LIMITERS (ECL)ISSUE NO. 1MARCH 6, 2008Summary of TopicsThis first iss

2、ue of the Outline of Investigation for Low-Voltage SurgeWithstand Telecommunications Electronic Current Limiters (ECL), Subject2570, applies to Electronic Current Limiters for up to 600 Vac, 60 A limitedduration current interrupting capability.The UL Foreword is no longer located within the UL Stand

3、ard. For informationconcerning the use and application of the requirements contained in thisStandard, the current version of the UL Foreword is located onULStandardsInfoNet at: http:/ 2008 UNDERWRITERS LABORATORIES INC.UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WI

4、THOUT PERMISSION FROM ULMARCH 6, 2008SUBJECT 25702No Text on This PageUL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULCONTENTS1 General 41.1 Scope .42.0 Definitions 43.0 Service Environment Conditions .44.0 Classification .4MARCH 6, 2008 SUBJE

5、CT 2570 3UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM UL1 GeneralNote: This Part is intended to be read together with Low-Voltage Surge Withstand TelecommunicationsOvercurrent Protector Components Part 1: General Requirements, hereafter refer

6、red to as Part 1. Thenumbering of the Clauses in this Part corresponds to like numbered Clauses in Part 1. The requirementsof Part 1 apply unless modified by this Part.1.1 ScopeThis Part applies to Electronic Current Limiters for up to 600 Vac, 60 A limited duration current interruptingcapability.2.

7、0 DefinitionsPeak Impulse Voltage (Vimp) The maximum ECL rated voltage for lightning impulse faults.3.0 Service Environment ConditionsThe manufacturer may specify that the DUT be coordinated with a specified overvoltage protector shuntedacross it, as described in Part 1, subclause 7.6.4.0 Classifica

8、tion4.1 Category 1 Product meets intended template.4.2 Category 2 Product meets intended template with a complementary overvoltage protection devicewhich meets the following conditions:1) OVP device DC breakover voltage is greater than the maximum AC stress voltage for theintended template.2) OVP device impulse breakover voltage is less than the ECL Vimp rating for all Impulsestress voltages of the intended template.MARCH 6, 2008SUBJECT 25704

展开阅读全文
相关资源
猜你喜欢
  • DIN EN 60512-25-5-2005 Connectors for electronic equipment - Tests and measurements - Part 25-5 Test 25e - Return loss (IEC 60512-25-5 2004) German version EN 60512-25-5 2004《电子设备连.pdf DIN EN 60512-25-5-2005 Connectors for electronic equipment - Tests and measurements - Part 25-5 Test 25e - Return loss (IEC 60512-25-5 2004) German version EN 60512-25-5 2004《电子设备连.pdf
  • DIN EN 60512-25-6-2004 Connectors for electronic equipment - Tests and measurements - Part 25-6 Test 25f Eye pattern and jitter (IEC 60512-25-6 2004) German version EN 60512-25-6 2.pdf DIN EN 60512-25-6-2004 Connectors for electronic equipment - Tests and measurements - Part 25-6 Test 25f Eye pattern and jitter (IEC 60512-25-6 2004) German version EN 60512-25-6 2.pdf
  • DIN EN 60512-25-7-2005 Connectors for electronic equipment - Tests and measurements - Part 25-7 Test 25g - Impedance reflection coefficient and standing voltage wave ratio (VSWR) (.pdf DIN EN 60512-25-7-2005 Connectors for electronic equipment - Tests and measurements - Part 25-7 Test 25g - Impedance reflection coefficient and standing voltage wave ratio (VSWR) (.pdf
  • DIN EN 60512-25-9-2009 Connectors for electronic equipment - Tests and measurements - Part 25-9 Signal integrity tests - Test 25i Alien crosstalk (IEC 60512-25-9 2008) German versi.pdf DIN EN 60512-25-9-2009 Connectors for electronic equipment - Tests and measurements - Part 25-9 Signal integrity tests - Test 25i Alien crosstalk (IEC 60512-25-9 2008) German versi.pdf
  • DIN EN 60512-26-100-2011 Connectors for electronic equipment - Tests and measurements - Part 26-100 Measurement setup test and reference arrangements and measurements for connector.pdf DIN EN 60512-26-100-2011 Connectors for electronic equipment - Tests and measurements - Part 26-100 Measurement setup test and reference arrangements and measurements for connector.pdf
  • DIN EN 60512-27-100-2012 Connectors for electronic equipment - Tests and measurements - Part 27-100 Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27.pdf DIN EN 60512-27-100-2012 Connectors for electronic equipment - Tests and measurements - Part 27-100 Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27.pdf
  • DIN EN 60512-28-100-2013 Connectors for electronic equipment Tests and measurements Part 28-100 Signal integrity tests up to 1 000 MHz on IEC 60603-7 and IEC 61076-3 series connect.pdf DIN EN 60512-28-100-2013 Connectors for electronic equipment Tests and measurements Part 28-100 Signal integrity tests up to 1 000 MHz on IEC 60603-7 and IEC 61076-3 series connect.pdf
  • DIN EN 60512-3-1-2003 Connectors for electronic equipment - Tests and measurements - Part 3-1 Insulation tests Test 3a Insulation resistance (IEC 60512-3-1 2002) German version EN .pdf DIN EN 60512-3-1-2003 Connectors for electronic equipment - Tests and measurements - Part 3-1 Insulation tests Test 3a Insulation resistance (IEC 60512-3-1 2002) German version EN .pdf
  • DIN EN 60512-4-1-2004 Connectors for electronic equipment - Tests and measurements - Part 4-1 Voltage stress tests - Test 4a Voltage proof (IEC 60512-4-1 2003) German version EN 60.pdf DIN EN 60512-4-1-2004 Connectors for electronic equipment - Tests and measurements - Part 4-1 Voltage stress tests - Test 4a Voltage proof (IEC 60512-4-1 2003) German version EN 60.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1