IEC 60112-2003 Method for the determination of the proof and the comparative tracking indices of solid insulating materials《固体绝缘材料的比较起痕指数和耐泄痕指数的测定方法》.pdf

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1、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60112Quatrime ditionFourth edition2003-01Mthode de dtermination des indicesde rsistance et de tenue au cheminementdes matriaux isolants solidesMethod for the determination of the proofand the comparative tracking indicesof solid insulating materialsNumro

2、 de rfrenceReference numberCEI/IEC 60112:2003PUBLICATION FONDAMENTALE DE SCURITBASIC SAFETY PUBLICATIONCopyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Numrotation des publicat

3、ionsDepuis le 1er janvier 1997, les publications de la CEIsont numrotes partir de 60000. Ainsi, la CEI 34-1devient la CEI 60034-1.Editions consolidesLes versions consolides de certaines publications de laCEI incorporant les amendements sont disponibles. Parexemple, les numros ddition 1.0, 1.1 et 1.2

4、 indiquentrespectivement la publication de base, la publication debase incorporant lamendement 1, et la publication debase incorporant les amendements 1 et 2.Informations supplmentairessur les publications de la CEILe contenu technique des publications de la CEI estconstamment revu par la CEI afin q

5、uil reflte ltatactuel de la technique. Des renseignements relatifs cette publication, y compris sa validit, sont dispo-nibles dans le Catalogue des publications de la CEI(voir ci-dessous) en plus des nouvelles ditions,amendements et corrigenda. Des informations sur lessujets ltude et lavancement des

6、 travaux entreprispar le comit dtudes qui a labor cette publication,ainsi que la liste des publications parues, sontgalement disponibles par lintermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEILe catalogue en ligne sur le site web de la CEI(www.iec.ch/catlg-f.htm) v

7、ous permet de faire desrecherches en utilisant de nombreux critres,comprenant des recherches textuelles, par comitdtudes ou date de publication. Des informationsen ligne sont galement disponibles sur lesnouvelles publications, les publications rempla-ces ou retires, ainsi que sur les corrigenda. IEC

8、 Just PublishedCe rsum des dernires publications parues(www.iec.ch/JP.htm) est aussi disponible parcourrier lectronique. Veuillez prendre contactavec le Service client (voir ci-dessous) pour plusdinformations. Service clientsSi vous avez des questions au sujet de cettepublication ou avez besoin de r

9、enseignementssupplmentaires, prenez contact avec le Serviceclients:Email: custserviec.chTl: +41 22 919 02 11Fax: +41 22 919 03 00Publication numberingAs from 1 January 1997 all IEC publications areissued with a designation in the 60000 series. Forexample, IEC 34-1 is now referred to as IEC 60034-1.C

10、onsolidated editionsThe IEC is now publishing consolidated versions of itspublications. For example, edition numbers 1.0, 1.1and 1.2 refer, respectively, to the base publication,the base publication incorporating amendment 1 andthe base publication incorporating amendments 1and 2.Further information

11、 on IEC publicationsThe technical content of IEC publications is keptunder constant review by the IEC, thus ensuring thatthe content reflects current technology. Informationrelating to this publication, including its validity, isavailable in the IEC Catalogue of publications(see below) in addition t

12、o new editions, amendmentsand corrigenda. Information on the subjects underconsideration and work in progress undertaken by thetechnical committee which has prepared thispublication, as well as the list of publications issued,is also available from the following: IEC Web Site (www.iec.ch) Catalogue

13、of IEC publicationsThe on-line catalogue on the IEC web site(www.iec.ch/catlg-e.htm) enables you to searchby a variety of criteria including text searches,technical committees and date of publication. On-line information is also available on recentlyissued publications, withdrawn and replacedpublica

14、tions, as well as corrigenda. IEC Just PublishedThis summary of recently issued publications(www.iec.ch/JP.htm) is also available by email.Please contact the Customer Service Centre (seebelow) for further information. Customer Service CentreIf you have any questions regarding thispublication or need

15、 further assistance, pleasecontact the Customer Service Centre:Email: custserviec.chTel: +41 22 919 02 11Fax: +41 22 919 03 00.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

16、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60112Quatrime ditionFourth edition2003-01Mthode de dtermination des indicesde rsistance et de tenue au cheminementdes matriaux isolants solidesMethod for the determination of the proofand the comparative tracking indicesof solid insulating materialsPour

17、prix, voir catalogue en vigueurFor price, see current catalogue IEC 2003 Droits de reproduction rservs Copyright - all rights reservedAucune partie de cette publication ne peut tre reproduite niutilise sous quelque forme que ce soit et par aucun procd,lectronique ou mcanique, y compris la photocopie

18、 et lesmicrofilms, sans laccord crit de lditeur.No part of this publication may be reproduced or utilized in anyform or by any means, electronic or mechanical, includingphotocopying and microfilm, without permission in writing fromthe publisher.International Electrotechnical Commission, 3, rue de Va

19、remb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.chCODE PRIXPRICE CODE RCommission Electrotechnique InternationaleInternational Electrotechnical Commission PUBLICATION FONDAMENTALE DE SCURITBASIC SAFETY PUBLICATIO

20、NCopyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 60112 CEI:2003SOMMAIREAVANT-PROPOS . 41 Domaine dapplication 82 Rfrences normatives 83 Termes et dfinitions 104 Principe 12

21、5 Eprouvette 126 Conditionnement de lprouvette.146.1 Conditionnement environnemental.146.2 Etat de la surface de lprouvette 147 Appareillage dessai147.1 Electrodes .147.2 Circuit dessai167.3 Solutions dessai .167.4 Dispositif de distribution des gouttes .187.5 Plate-forme support dprouvette.187.6 In

22、stallation du montage dlectrode .188 Procdure dessai de base208.1 Gnralits208.2 Prparation208.3 Procdure dessai229 Dtermination de lrosion 2210 Dtermination de lindice de tenue au cheminement (ITC).2210.1 Procdure2210.2 Rapport dessai .2411 Dtermination de lindice de rsistance au cheminement (IRC).2

23、411.1 Gnralits2411.2 Dtermination de la tension maximale des 100 gouttes2411.3 Dtermination de la tension de tenue maximale des 50 gouttes .2611.4 Rapport .28Annexe A (informative) Liste des facteurs qui devraient tre pris en compte parles comits de produits .36Annexe B (informative) Choix de matria

24、ux constituant les lectrodes .38Bibliographie.40Figure 1 Electrode32Figure 2 Disposition de llectrode/lprouvette 32Figure 3 Exemple type de montage dlectrode et de support dprouvette.34Figure 4 Exemple de circuit dessai 34Copyright International Electrotechnical Commission Provided by IHS under lice

25、nse with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-60112 IEC:2003 3 CONTENTSFOREWORD 51 Scope92 Normative references 93 Terms and definitions 114 Principle135 Test specimen.136 Test specimen conditioning .156.1 Environmental conditioning.156.2 Test specime

26、n surface state .157 Test apparatus 157.1 Electrodes 157.2 Test circuit177.3 Test solutions .177.4 Dropping device197.5 Test specimen support platform 197.6 Electrode assembly installation.198 Basic test procedure218.1 General 218.2 Preparation.218.3 Test procedure .239 Determination of erosion .231

27、0 Determination of proof tracking index (PTI) .2310.1 Procedure.2310.2 Report 2511 Determination of comparative tracking index (CTI) 2511.1 General 2511.2 Determination of the 100 drop point2511.3 Determination of the maximum 50 drop withstand voltage.2711.4 Report 29Annex A (informative) List of fa

28、ctors that should be considered by product committees.37Annex B (informative) Electrode material selection39Bibliography.41Figure 1 Electrode.33Figure 2 Electrode / specimen arrangement 33Figure 3 Example of typical electrode mounting and specimen support .35Figure 4 Example of test circuit .35Copyr

29、ight International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 4 60112 CEI:2003COMMISSION LECTROTECHNIQUE INTERNATIONALE_MTHODE DE DTERMINATION DES INDICESDE RSISTANCE ET DE TENUE AU CHEMINEMENT

30、DES MATRIAUX ISOLANTS SOLIDESAVANT-PROPOS1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisationcompose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI apour objet de favoriser la coopration internationale pour tou

31、tes les questions de normalisation dans lesdomaines de llectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normesinternationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit nationalintress par le sujet trait peut participer. Les or

32、ganisations internationales, gouvernementales et nongouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitementavec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre lesdeux organisations.2) Les dcisions ou ac

33、cords officiels de la CEI concernant les questions techniques reprsentent, dans la mesuredu possible un accord international sur les sujets tudis, tant donn que les Comits nationaux intressssont reprsents dans chaque comit dtudes.3) Les documents produits se prsentent sous la forme de recommandation

34、s internationales. Ils sont publiscomme normes, spcifications techniques, rapports techniques ou guides et agrs comme tels par lesComits nationaux.4) Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer defaon transparente, dans toute la mesure poss

35、ible, les Normes internationales de la CEI dans leurs normesnationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionalecorrespondante doit tre indique en termes clairs dans cette dernire.5) La CEI na fix aucune procdure concernant le marquage comme indication

36、 dapprobation et sa responsabilitnest pas engage quand un matriel est dclar conforme lune de ses normes.6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent fairelobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tr

37、e tenue pourresponsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence.La Norme internationale CEI 60112 a t tablie par le sous-comit 15E: Mthodes dessais,du comit dtudes 15 de la CEI: Matriaux isolants.Cette quatrime dition annule et remplace la troisime

38、 dition, parue en 1979 et constitueune rvision technique.Les modifications majeures par rapport ldition prcdente sont celles qui suivent:Le choix dun matriau pour une application spcifique implique frquemment des compromisau niveau des proprits individuelles et des critres dessai. Dans la prcdente d

39、ition de laCEI 60112, les critres dessai requraient aucun brlage de lprouvette mais cela a induitdeux problmes: des difficults pour diffrencier le brlage qui comprend tous les types de combustion, parexemple flammes, et la combustion lente dans une situation o des tincelages seproduisent, entranant

40、une carbonisation la surface de lprouvette, et une situation dans laquelle certains comits de produit ont trouv ncessaire de sedispenser du critre aucun brlage, pour les essais de cheminement, critre quils ontremplac par les essais de flamme sur le produit final, faisant ainsi apparatre deux typesde

41、 IRC/ITC avec des critres diffrents.La prsente norme tente de rgler ce problme.Elle a le statut de publication fondamentale de scurit, conformment au Guide CEI 104.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking pe

42、rmitted without license from IHS-,-,-60112 IEC:2003 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION_METHOD FOR THE DETERMINATION OF THE PROOFAND THE COMPARATIVE TRACKING INDICESOF SOLID INSULATING MATERIALSFOREWORD1) The IEC (International Electrotechnical Commission) is a worldwide organization for sta

43、ndardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publis

44、hes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this pr

45、eparation. The IEC collaborates closely with the InternationalOrganization for Standardization (ISO) in accordance with conditions determined by agreement between thetwo organizations.2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, aninternationa

46、l consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3) The documents produced have the form of recommendations for international use and are published in the formof standards, technical specifications, technical rep

47、orts or guides and they are accepted by the NationalCommittees in that sense.4) In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence be

48、tween the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6) Attention is drawn to the possi

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