1、NORME GEI INTERNATIONALE INTERNATIONAL STANDARD IEC 601 15-612 QC 400402 Premire dition First edition 1983-01 Rsistances fixes utilises dans les quipements lectron iq ues Sixime partie: Spcification particulire-cadre - Rseaux de rsistances fixes, mesurables individuellement, de diffrentes valeurs de
2、 resistance ou de dissipation nominale Niveau dassurance E Fixed resistors for use in lectronic equipment Part 6: Blank detail specification - Fixed resistor networks with individually measurable resistors, of either different resistance values or different rated dissipations Assessment level E Numr
3、o de rfrence Reference number CEIIIEC 601 15-6-21 1983 Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Numros des publications Depuis le ler janvier 1997, les publications de
4、la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant
5、lamendement 1, et la publication de base incorporant les amendements I et 2. Validit de la prsente publication Le contenu technique des publications de la CE1 est constamment revu par la CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la p
6、ublication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: 1GCl Pas de claqua
7、ge, ni de contournement Pas de dommage visible AR , IGQ Vo breakdown or flashover Vo visible damage IR 1GR Pas de claquage, ni de contournement Selon tableau I de la pr- sente spcification Pas de dommage visible 4R , IGR Copyright International Electrotechnical Commission Provided by IHS under licen
8、se with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-115-6-2 0 I E C 1983 - 19 - Sub-clause number and Test (see Note 1) roup D Inspection (periodic) Sub-group D1 1.24 Damp heat, steady state Pub-group D2 1.4.3 Dimensions 1.25.3 Endurance at upper (detail) ca
9、tegory temperature Conditions of test (see Note 1) See also 2.3.8 of the Visual examination sectional specification Resistance Insulation resistance between resistor elements (if applicable), see also 2.3.6 of the sectional specification Voltage proof between resistor elements (if applicable), see a
10、lso 2.3.7 of the sectional specification Duration: 1 O00 h: Examination at 48 h, 500 h and Visual examination Resistance Examination at 1 O00 h: Insulation resistance between resistor elements (if applicable), see 2.3.6 of the sectional specification 1 O00 h: Sample size ind criterion of accept- abi
11、lity (see Note 3) Performance requirements (see Note I) Vo visible damage Legible marking iR IGR No breakdown or flashover 4s specified in Table I of this specification No visible damage 4R 1GQ Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo
12、 reproduction or networking permitted without license from IHS-,-,-Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright International Electrotechnical Commission Provided
13、 by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ICs 31.040.10 Typeset and printed by the IEC Central Office GENEVA, SWITZERLAND Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
