1、 IEC 60444-11 Edition 1.0 2010-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 11: Standard method for the determination of the load resonance frequency f Land the effective load capacitance C Leffusing automatic network analyzer techniques and error
2、 correction Mesure des paramtres des rsonateurs quartz Partie 11: Mthode normalise pour la dtermination de la frquence de rsonance la charge f Let de la capacit de charge efficace C Leffutilisant des analyseurs automatiques de rseaux et correction des erreurs IEC 60444-11:2010 colour inside THIS PUB
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17、ontactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60444-11 Edition 1.0 2010-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 11: Standard method for the determination of the load resonance frequency f Land the effective l
18、oad capacitance C Leffusing automatic network analyzer techniques and error correction Mesure des paramtres des rsonateurs quartz Partie 11: Mthode normalise pour la dtermination de la frquence de rsonance la charge f Let de la capacit de charge efficace C Leffutilisant des analyseurs automatiques d
19、e rseaux et correction des erreurs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-88912-210-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Intern
20、ationale colour inside 2 60444-11 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 General concepts .6 3.1 Load resonance frequencies f Lrand f La .6 3.2 Effective load capacitance C Leff .6 4 Reference plane and test conditions.7 4.1 General .7 4.2 Principle of measurement7 4.3 Ev
21、aluation of errors .10 Bibliography14 Figure 1 Admittance of a quartz crystal unit .6 Figure 2 X Cas a function of frequency (solid line) in the vicinity of f L .9 Figure 3 Level of drive of a crystal in a -network vs. frequency 9 Figure 4 Error of the load resonance frequency due to the inaccuracy
22、of the measured voltages (dashed line) and the calibration resistances (soft line) 11 Figure 5 C L -error resulting from f L error (due to inaccuracy of the measured voltages and the calibration resistances) for the same crystal as in Figure 4.11 Figure 6 Frequency error due to noise of the measured
23、 voltages .12 Figure 7 Error of load resonance frequency f Lat 30 pF and 10 pF for typical equivalent parameters of quartz crystal units 12 Figure 8 Error of C Lefffor typical equivalent parameters of quartz crystal units 13 60444-11 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT
24、 OF QUARTZ CRYSTAL UNIT PARAMETERS Part 11: Standard method for the determination of the load resonance frequency f Land the effective load capacitance C Leffusing automatic network analyzer techniques and error correction FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwid
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34、cations. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
35、patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-11 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detec
36、tion. The text of this standard is based on the following documents: CDV Report on voting 49/852/CDV 49/883/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the
37、 ISO/IEC Directives, Part 2. 4 60444-11 IEC:2010 A list of all parts of the IEC 60444 series under the general title Measurement of quartz crystal unit parameters can be found on the IEC website. The committee has decided that the contents of this amendment and the base publication will remain uncha
38、nged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of th
39、is publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 60444-11 IEC:2010 5 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 11: Standard method for the det
40、ermination of the load resonance frequency f Land the effective load capacitance C Leffusing automatic network analyzer techniques and error correction 1 Scope This part of IEC 60444 defines the standard method of measuring load resonance frequency f Lat the nominal value of C L , and the determinat
41、ion of the effective load capacitance C Leffat the nominal frequency for crystals with the figure of merit M 4. M, according to Table 1 of IEC 60122-1:2002, is expressed in the following equation: 1 0 1 R C r Q M = = (1) This gives good results in a frequency range up to 200 MHz. This method allows
42、the calculation of load resonance frequency offset f L , frequency pulling range f L1,L2and pulling sensitivity S as described in 2.2.31 of IEC 60122-1:2002. In contrary to the simple method of IEC 60444-4, this measurement technique avoids the use of physical load capacitors, and allows higher accu
43、racy, better reproducibility and correlation to the application. It extends the upper frequency limit from 30MHz by the method of IEC 60444-4 to 200MHz approximately. This method is based on the error-corrected measurement technique of IEC 60444-5:1995, and therefore allows the measurement of f L an
44、d C Lefftogether with the determination of the equivalent crystal parameters in one sequence without changing the test fixture. With this method the frequency f Lis searched where the reactance X Cof the crystal has the opposite value of the reactance of the load capacitance. L L CL C 1 C X X = = (2
45、) Furthermore this method allows to determine the effective load capacitance C Leffat the nominal frequency f nom . 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated refe
46、rences, the latest edition of the referenced document (including any amendments) applies. IEC 60122-1:2002, Quartz crystal units of assessed quality Part 1: Generic specification IEC/TR 60444-4, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 4: Method for th
47、e measurement of the load resonance frequency f L , load resonance resistance R Land the calculation of other derived values of quartz crystal units, up to 30 MHz IEC 60444-5:1995, Measurement of quartz crystal units parameters Part 5: Methods for the determination of equivalent electrical parameter
48、s using automatic network analyzer techniques and error correction 6 60444-11 IEC:2010 3 General concepts 3.1 Load resonance frequencies f Lrand f LaAs can be seen in Figure 1, there are two intersection frequencies where CC L XX = , f Lrwith high admittance (low impedance) and f Lawith low admittan
49、ce (high impedance). The load resonant frequency f L is one of the two frequencies of a crystal unit in association with a series or with a parallel load capacitance, at which the electrical admittance (respectively impedance) of the combination is resistive. The load resonance frequency f Lis the lower of the two frequencies. In a first approximation f Lcan be calculated by
